本文提出了一种可靠的图像去噪算法,基于观察图像是期望图像叠加了不规则噪声的假设,用有限高斯混合分布(FNM)描述期望图像分解小波系数(WC)的先验分布,用隐马尔可夫模型(HMM)描述同一方向不同分解级之间的小波系数的依赖关系,采用Baye...本文提出了一种可靠的图像去噪算法,基于观察图像是期望图像叠加了不规则噪声的假设,用有限高斯混合分布(FNM)描述期望图像分解小波系数(WC)的先验分布,用隐马尔可夫模型(HMM)描述同一方向不同分解级之间的小波系数的依赖关系,采用Bayes准则,根据期望图像的后验分布(以观测图像为条件)所对应的HMM模型的条件概率,用EM(expectation maximization)优化算法,获得MAP(maximization a posteriori)准则下的去噪图像。针对银基触头材料表面形貌去噪对几种算法作定性比较,并对去噪性能给出定量分析,仿真结果表明,此方法有效去除噪声的同时,能保留原始图像的细节信息。展开更多
Arc erosion morphologies of Ag/MeO（10） electrical contact materials after 50000 operations under direct current of 19 V and 20 A and resistive load conditions were investigated using scanning electron microscope（SE...Arc erosion morphologies of Ag/MeO（10） electrical contact materials after 50000 operations under direct current of 19 V and 20 A and resistive load conditions were investigated using scanning electron microscope（SEM） and a 3D optical profiler（3DOP）. The results indicated that 3DOP could supply clearer and more detailed arc erosion morphology information. Arc erosion resistance of Ag/SnO_2（10） electrical contact material was the best and that of Ag/CuO（10） was the worst. Arc erosion morphology of Ag/MeO（10） electrical contact materials mainly included three different types. Arc erosion morphologies of Ag/ZnO（10） and Ag/SnO_2（10） electrical contact materials were mainly liquid splash and evaporation, and those of Ag/CuO（10） and Ag/CdO（10） were mainly material transfer from anode to cathode. Arc erosion morphology of Ag/SnO_2（6）In_2O_3（4） electrical contact materials included both liquid splash, evaporation and material transfer. In addition, the formation process and mechanism on arc erosion morphology of Ag/MeO（10） electrical contact materials were discussed.展开更多
A nano probe system which can measure precise contact force in mN scale was demonstrated. The nano probe micro parts or optical parts in nanometer range resolution and scratch was originally designed for on-machine me...A nano probe system which can measure precise contact force in mN scale was demonstrated. The nano probe micro parts or optical parts in nanometer range resolution and scratch was originally designed for on-machine measuring applications and one kind of contact type measuring probes was designed for miniaturized or microfactory system. It ideally should be of small size and able to measure surface topography in nanometer scale. A commercial capacitive displacement sensor was proposed. It was a new concept in nano probe systems which can measure the displacement of shaft driven by the variation of surface topography. The nano probe mainly consisted of three parts： a capacitive displacement sensor, a porous type air slide and a contact probe part with various tip radiuses. The porous type air slide assured the shaft slided smoothly with controllable normal force in mN scale and had high positioning accuracy. The probe part which was directly in contact with target surface, can be applied to micro/nanoscale scratching as well as the measurement of sample topography by a simple tip change.展开更多
文摘本文提出了一种可靠的图像去噪算法,基于观察图像是期望图像叠加了不规则噪声的假设,用有限高斯混合分布(FNM)描述期望图像分解小波系数(WC)的先验分布,用隐马尔可夫模型(HMM)描述同一方向不同分解级之间的小波系数的依赖关系,采用Bayes准则,根据期望图像的后验分布(以观测图像为条件)所对应的HMM模型的条件概率,用EM(expectation maximization)优化算法,获得MAP(maximization a posteriori)准则下的去噪图像。针对银基触头材料表面形貌去噪对几种算法作定性比较,并对去噪性能给出定量分析,仿真结果表明,此方法有效去除噪声的同时,能保留原始图像的细节信息。
基金Project(2012QNZT003)supported by the Fundamental Research Funds for the Central Universities,ChinaProject(2012M521542)supported by the Postdoctoral Science Foundation of China+1 种基金Project(14JJ3014)supported by the Hunan Provincial Natural Science Foundation of ChinaProject(BSh1202)supported by the Zhejiang Provincial Postdoctoral Scientific Research Foundation of China
文摘Arc erosion morphologies of Ag/MeO（10） electrical contact materials after 50000 operations under direct current of 19 V and 20 A and resistive load conditions were investigated using scanning electron microscope（SEM） and a 3D optical profiler（3DOP）. The results indicated that 3DOP could supply clearer and more detailed arc erosion morphology information. Arc erosion resistance of Ag/SnO_2（10） electrical contact material was the best and that of Ag/CuO（10） was the worst. Arc erosion morphology of Ag/MeO（10） electrical contact materials mainly included three different types. Arc erosion morphologies of Ag/ZnO（10） and Ag/SnO_2（10） electrical contact materials were mainly liquid splash and evaporation, and those of Ag/CuO（10） and Ag/CdO（10） were mainly material transfer from anode to cathode. Arc erosion morphology of Ag/SnO_2（6）In_2O_3（4） electrical contact materials included both liquid splash, evaporation and material transfer. In addition, the formation process and mechanism on arc erosion morphology of Ag/MeO（10） electrical contact materials were discussed.
基金Project supported by National Core Research Center (NCRC) and Chosun University, Korea
文摘A nano probe system which can measure precise contact force in mN scale was demonstrated. The nano probe micro parts or optical parts in nanometer range resolution and scratch was originally designed for on-machine measuring applications and one kind of contact type measuring probes was designed for miniaturized or microfactory system. It ideally should be of small size and able to measure surface topography in nanometer scale. A commercial capacitive displacement sensor was proposed. It was a new concept in nano probe systems which can measure the displacement of shaft driven by the variation of surface topography. The nano probe mainly consisted of three parts： a capacitive displacement sensor, a porous type air slide and a contact probe part with various tip radiuses. The porous type air slide assured the shaft slided smoothly with controllable normal force in mN scale and had high positioning accuracy. The probe part which was directly in contact with target surface, can be applied to micro/nanoscale scratching as well as the measurement of sample topography by a simple tip change.
