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准分子激光诱导结晶硅膜的Raman光谱分析 被引量:1
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作者 戴永兵 沈荷生 +3 位作者 张志明 张少强 徐重阳 李兴教 《上海交通大学学报》 EI CAS CSCD 北大核心 2001年第6期947-950,共4页
采用 Xe Cl准分子激光器对 PECVD法生长的非晶硅膜进行了诱导晶化处理 .对结晶膜的晶体质量进行了 Raman光谱表征 .研究表明 ,对于非扫描模式 ,晶化前去氢处理可使结晶膜具有更高的结晶度 ,即氢的存在阻碍非晶硅的晶化 .玻璃衬底与非晶... 采用 Xe Cl准分子激光器对 PECVD法生长的非晶硅膜进行了诱导晶化处理 .对结晶膜的晶体质量进行了 Raman光谱表征 .研究表明 ,对于非扫描模式 ,晶化前去氢处理可使结晶膜具有更高的结晶度 ,即氢的存在阻碍非晶硅的晶化 .玻璃衬底与非晶硅膜之间的非晶氮化硅膜对非晶硅膜的晶化没有明显影响 .在 1 50~ 450 m J/cm2 ,结晶膜的结晶度随能量密度的增大而提高 . 展开更多
关键词 准分子激光 硅膜 RAMAN光谱 诱导晶化处理
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Influence of High Temperature Treatment on the Performance of Nickel-Induced Laterally Crystallized Thin Film Transistors
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作者 秦明 樊路加 +1 位作者 VincentPoon C.Y.Yuen 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2002年第6期571-576,共6页
Well known for their good performance,thin film transistors (TFTs) with active layers which were nickel induced laterally crystallized,are fabricated by conventional process of dual gate CMOS.The influence of pre h... Well known for their good performance,thin film transistors (TFTs) with active layers which were nickel induced laterally crystallized,are fabricated by conventional process of dual gate CMOS.The influence of pre high temperature treatment of device fabrication on the performance of TFTs is also investigated.The experiment shows that the high temperature treatment affects the performance of the devices strongly.The best performance is obtained by adopting pre treatment of 1000℃.The mobility of 314cm 2/(V·s) is obtained at NMOS TFTs with pre treatment of 1000℃,which is 10% and 22% higher than that treated at 1100℃ and without pre high temperature treatment,respectively.A maximum on/off current ratio of 3×10 8 is also obtained at 1000℃.Further investigation of uniformity verifies that the result is reliable. 展开更多
关键词 nickel induced lateral crystallization thin film transistor high temperature treatment
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