A Fully Integrated CMOS Readout Circuit for Particle Detectors

Novel schemes for a charge sensitive amplifier （CSA） and a CR-（RC）, semi-Gaussian shaper in a fully integrated CMOS readout circuit for particle detectors are presented. The CSA is designed with poly-resistors as feedback components to reduce noise. Compared with conventional CSA, the input referred equivalent noise charge（ENC） is simulated to be reduced from 5036e to 2381e with a large detector capacitance of 150pF at the cost of 0.5V output swing loss. The CR-（RC）,semi-Gaussian shaper uses MOS transistors in the triode region in series with poly-resistors to compensate process variation without much linearity reduction.

Readout circuit with nonuniformity correction for the uncooled microbolometer

The output of uncooled microbolometer is nonuniform, and the traditional two-point nonuniformity correction method requires a tight restriction on substrate temperature. The circuit proposed by this article can relax the restriction on the substrate temperature and perform nonuniformity correction when reading out the image signal. The dummy pixels reduce static current. And the Column shared DACs transfer correction data to the gates of MOS transistors and the positive reference edge of amplifier, to control the bias current of detector and dummy one, and set the start point of integration. This circuit has higher sensitivity, wider dynamic range, and frame frequency of more than 30 Hz for 128×128 array. PSPICE simulation results seem that this circuit functions well.

Design of 32-bit differential paired eFuse OTP memory in a form of two-dimensional array

A differential paired eFuse OTP(one-time programmable)memory cell which can be configured into a 2D(two-dimensional)eFuse cell array was proposed.The sensible resistance of a programmed eFuse link is a half smaller than that of the single-ended counterpart and BL datum can be sensed without a reference voltage.With this 2D array of differential paired eFuse OTP memory cells,we design a 32-bit eFuse OTP memory IP.We use a sense amplifier based D F/F circuit as the BL(bit-line)SA(sense amplifier)and design a sensing margin test circuit with a variable pull-up load.It is confirmed by the function test that the designed 32-bit OTP memory IP functions normally on 30 sample dies.

New design of sense amplifier for EEPROM memory

We present a new sense amplifier circuit for EEPROM memory. The topology of the sense amplifier uses a voltage sensing method,having low cost and low power consumption as well as high reliability. The sense amplifier was implemented in an EEPROM realized with an SMIC 0.35-μm 2P3M CMOS embedded EEPROM process. Under the condition that the power supply is 3.3 V,simulation results showed that the charge time is 35 ns in the proposed sense amplifier,and that the maximum average current consumption during the read period is 40 μA. The novel topology allows the circuit to function with power supplies as low as 1.4 V. The sense amplifier has been implemented in 2-kb EEPROM memory for RFID tag IC applications,and has a silicon area of only 240 μm2.

Multi-stage dual replica bit-line delay technique for process-variation-robust timing of low voltage SRAM sense amplifier

A multi-stage dual replica bit-line delay （MDRBD） technique is proposed for reducing access time by suppressing the sense-amplifier enable （SAE） timing variation of low voltage static randomaccess memory （SRAM） applications. Compared with the traditional technique, this strategy, using statistical theory, reduces the timing variation by using multi-stage ideas, meanwhile doubling the replica bit-fine （RBL） capacitance and discharge path simultaneously in each stage. At a supply voltage of 0.6 V, the simulation results show that the standard deviations of the SAE timing and cycle time with the proposed technique are 69.2% and 47.2%, respectively, smaller than that with a conventional RBL delay technique in TSMC 65 nm CMOS technology （Taiwan Semiconductor Manufacturing Company, Taiwan）.