O484.5 9902113(?)用调制光反射方法测量薄膜的厚度=Measuremenof thin film thickness with modulated photoreflectancetechnique[刊,中]/郭元元,徐明华,张淑仪(南京大学声学研究所.江苏,南京(210093))∥南京大学学报·自然科学版...O484.5 9902113(?)用调制光反射方法测量薄膜的厚度=Measuremenof thin film thickness with modulated photoreflectancetechnique[刊,中]/郭元元,徐明华,张淑仪(南京大学声学研究所.江苏,南京(210093))∥南京大学学报·自然科学版.—1998,3(1).—79-84利用调制光反射技术对一系列不同厚度的二氧化硅薄膜进行了测量,在不同调制频率下检测样品的调制光反射相位信号,同时针对实验条件建立了三维理论模型,通过对实验曲线的最小方差拟合,推算出二氧化硅薄膜的厚度.图4参6(李瑞琴)展开更多
The photo-corrosion of electrodeposited polycrystalline CdSe electrode was inhibited effectively by coating a thin layer of the conductive polyaniline （PAN） film. The relation between the performance and internal ba...The photo-corrosion of electrodeposited polycrystalline CdSe electrode was inhibited effectively by coating a thin layer of the conductive polyaniline （PAN） film. The relation between the performance and internal band structure of such film-covered PAN/CdSe electrode was studied by the electrochemical modulation reflectance spectrum （EMRS）. EMRS of both CdSe and PAN/CdSe electrodes in K4Fe（CN）6/K3Fe（CN）6 solution exhibited typical France-Keidysh oscillations, by which the values of the energy gap and flat band potential were determined. The EMRS results indicated that the energy band structure of CdSe electrode was not changed after coated with PAN film, so that the photoelectrochemical characteristic of PAN/CdSe electrode was rather similar to that of CdSe electrode.展开更多
文摘O484.5 9902113(?)用调制光反射方法测量薄膜的厚度=Measuremenof thin film thickness with modulated photoreflectancetechnique[刊,中]/郭元元,徐明华,张淑仪(南京大学声学研究所.江苏,南京(210093))∥南京大学学报·自然科学版.—1998,3(1).—79-84利用调制光反射技术对一系列不同厚度的二氧化硅薄膜进行了测量,在不同调制频率下检测样品的调制光反射相位信号,同时针对实验条件建立了三维理论模型,通过对实验曲线的最小方差拟合,推算出二氧化硅薄膜的厚度.图4参6(李瑞琴)
文摘The photo-corrosion of electrodeposited polycrystalline CdSe electrode was inhibited effectively by coating a thin layer of the conductive polyaniline （PAN） film. The relation between the performance and internal band structure of such film-covered PAN/CdSe electrode was studied by the electrochemical modulation reflectance spectrum （EMRS）. EMRS of both CdSe and PAN/CdSe electrodes in K4Fe（CN）6/K3Fe（CN）6 solution exhibited typical France-Keidysh oscillations, by which the values of the energy gap and flat band potential were determined. The EMRS results indicated that the energy band structure of CdSe electrode was not changed after coated with PAN film, so that the photoelectrochemical characteristic of PAN/CdSe electrode was rather similar to that of CdSe electrode.
