A novel rcgularization-based approach is presented for super-resolution reconstruction in order to achieve good tradeoff between noise removal and edge preservation. The method is developed by using L1 norm as data fi...A novel rcgularization-based approach is presented for super-resolution reconstruction in order to achieve good tradeoff between noise removal and edge preservation. The method is developed by using L1 norm as data fidelity term and anisotropic fourth-order diffusion model as a regularization item to constrain the smoothness of the reconstructed images. To evaluate and prove the performance of the proposed method, series of experiments and comparisons with some existing methods including bi-cubic interpolation method and bilateral total variation method are carried out. Numerical results on synthetic data show that the PSNR improvement of the proposed method is approximately 1.0906 dB on average compared to bilateral total variation method, and the results on real videos indicate that the proposed algorithm is also effective in terms of removing visual artifacts and preserving edges in restored images.展开更多
Modeling vapor pressure is crucial for studying the moisture reliability of microelectronics, as high vapor pressure can cause device failures in environments with high temperature and humidity. To minimize the impact...Modeling vapor pressure is crucial for studying the moisture reliability of microelectronics, as high vapor pressure can cause device failures in environments with high temperature and humidity. To minimize the impact of vapor pressure, a super-hydrophobic(SH) coating can be applied on the exterior surface of devices in order to prevent moisture penetration. The underlying mechanism of SH coating for enhancing device reliability, however, is still not fully understood. In this paper, we present several existing theories for predicting vapor pressure within microelectronic materials. In addition, we discuss the mechanism and effectiveness of SH coating in preventing water vapor from entering a device, based on experimental results. Two theoretical models, a micro-mechanics-based whole-field vapor pressure model and a convection-diffusion model, are described for predicting vapor pressure. Both methods have been successfully used to explain experimental results on uncoated samples. However, when a device was coated with an SH nanocomposite, weight gain was still observed, likely due to vapor penetration through the SH surface. This phenomenon may cast doubt on the effectiveness of SH coatings in microelectronic devices. Based on current theories and the available experimental results, we conclude that it is necessary to develop a new theory to understand how water vapor penetrates through SH coatings and impacts the materials underneath. Such a theory could greatly improve microelectronics reliability.展开更多
基金Projects(60963012,61262034)supported by the National Natural Science Foundation of ChinaProject(211087)supported by the Key Project of Ministry of Education of ChinaProjects(2010GZS0052,20114BAB211020)supported by the Natural Science Foundation of Jiangxi Province,China
文摘A novel rcgularization-based approach is presented for super-resolution reconstruction in order to achieve good tradeoff between noise removal and edge preservation. The method is developed by using L1 norm as data fidelity term and anisotropic fourth-order diffusion model as a regularization item to constrain the smoothness of the reconstructed images. To evaluate and prove the performance of the proposed method, series of experiments and comparisons with some existing methods including bi-cubic interpolation method and bilateral total variation method are carried out. Numerical results on synthetic data show that the PSNR improvement of the proposed method is approximately 1.0906 dB on average compared to bilateral total variation method, and the results on real videos indicate that the proposed algorithm is also effective in terms of removing visual artifacts and preserving edges in restored images.
基金the support of the National High-Tech Research and Development Program of China (863 Program) (2015AA03A101)
文摘Modeling vapor pressure is crucial for studying the moisture reliability of microelectronics, as high vapor pressure can cause device failures in environments with high temperature and humidity. To minimize the impact of vapor pressure, a super-hydrophobic(SH) coating can be applied on the exterior surface of devices in order to prevent moisture penetration. The underlying mechanism of SH coating for enhancing device reliability, however, is still not fully understood. In this paper, we present several existing theories for predicting vapor pressure within microelectronic materials. In addition, we discuss the mechanism and effectiveness of SH coating in preventing water vapor from entering a device, based on experimental results. Two theoretical models, a micro-mechanics-based whole-field vapor pressure model and a convection-diffusion model, are described for predicting vapor pressure. Both methods have been successfully used to explain experimental results on uncoated samples. However, when a device was coated with an SH nanocomposite, weight gain was still observed, likely due to vapor penetration through the SH surface. This phenomenon may cast doubt on the effectiveness of SH coatings in microelectronic devices. Based on current theories and the available experimental results, we conclude that it is necessary to develop a new theory to understand how water vapor penetrates through SH coatings and impacts the materials underneath. Such a theory could greatly improve microelectronics reliability.
