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超宽铝合金薄板新工艺的研究
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作者 曾苏民 《铝加工》 CAS 1995年第4期1-3,21,共4页
本文介绍了一种超宽铝合金薄板“热轧加分段多次施压”新工艺,对新工艺作了分析,并与常规工艺进行对比.该工艺可生产3500毫米超宽薄板.
关键词 铝合金 薄板 分段旋压 跟踪抛光 轧制
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Probing particle removal in brush scrubber cleaning with fluorescence technique 被引量:3
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作者 HUANG YaTing LI Yang +1 位作者 GUO Dan MENG ChunLing 《Science China(Technological Sciences)》 SCIE EI CAS 2013年第12期2994-3000,共7页
Brush scrubber cleaning is widely used for post chemical mechanical polishing(CMP)cleaning in semiconductor manufacturing.In this study,an experimental system based on fluorescence technique and particle-tracking velo... Brush scrubber cleaning is widely used for post chemical mechanical polishing(CMP)cleaning in semiconductor manufacturing.In this study,an experimental system based on fluorescence technique and particle-tracking velocimetry(PTV)technique was employed to characterize the particle removal displacement and velocity in the interface between a transparent copper film and a porous polyvinyl alcohol(PVA)brush during the cleaning process.Several different cleaning conditions including rotation speeds,loading pressure and cleaning agent were examined and the particle removal rate was compared.Elastic and friction removal,hydrodynamic removal and mixed-type removal are the three types of particle removal.Particles with an arc trace and uniform velocity curves were removed by friction and elastic force which were related to the brush load.Particles with a random trace and fluctuant velocity curves were removed by hydrodynamic force which was determined by the brush rotation speed.The increase of particle removal rate(PRR)with brush rotation speed is a logistic function.It is easier to improve PRR by increasing the brush load or by adding surfactant than by increasing the brush rotation speed. 展开更多
关键词 brush-scrub post CMP(chemical mechanical polishing) cleaning particle removal fluorescence technique
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