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Traceable long range scanning tunneling microscopy
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作者 A. Weckenmann J. Hoffmann 《Optoelectronics Letters》 EI 2008年第1期49-50,共2页
Dimensionally correct and directly traceable measurement is not feasible with conventional scanning tunneling microscopy (STMs) due to severe hysteresis and non-linearity of the commonly applied piezo tube scanners an... Dimensionally correct and directly traceable measurement is not feasible with conventional scanning tunneling microscopy (STMs) due to severe hysteresis and non-linearity of the commonly applied piezo tube scanners and the very short range. By integrating a custom made probing system based on tunneling current measurement into a commercially available and laser-interferometrically position controlled positioning system, an STM with a principal measuring 展开更多
关键词 远程扫描隧道显微镜 显微镜技术 干涉测量 激光定位控制
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