微波等离子化学气相沉积金刚石膜新型微波谐振腔设计

提出新型微波谐振腔用于化学气相沉积金刚石薄膜,腔体有效体积可以调节,采用环形介质窗口,置于沉积基台的下方,允许产生较大并且温度较高的等离子体。同轴内导体与沉积台相连接,微波从谐振腔底端传输经同轴导体耦合进入腔体。采用有限元的方法优化谐振腔的尺寸,使其能耦合进更大的微波能量,优化后,最大电场区域位于沉积台上方,并且均匀分布,在腔体内其它区域和介质窗口附近电场强度则很小,满足设计要求。采用时域有限差分法模拟了谐振腔在一定微波输入功率下产生等离子体的特性,并对设计的谐振腔进行试验研究,实验观察到的等离子体位置与模拟结果一致。

脉冲激光沉积金刚石基c轴取向LiNbO3压电薄膜

采用等化学计量比的LiNbO3多晶陶瓷为靶材,利用脉冲激光沉积技术在以非晶SiO2为缓冲层的金刚石/Si衬底上制备c轴取向LiNbO3薄膜。研究了靶材与衬底之间的距离对LiNbO3薄膜的结晶质量和c轴取向性的影响,发现在靶材与衬底之间的距离为4.0cm时获得了具有优异结晶质量的完全c轴取向LiNbO3压电薄膜。采用扫描电子显微镜和原子力显微镜对最佳条件下制备的薄膜进行了分析,结果表明制得的薄膜呈与衬底垂直的柱状结构,且薄膜表面光滑,晶粒均匀致密,表面平均粗糙度约为9.5 nm。

工艺条件对热丝CVD金刚石薄膜电学性能的影响

采用不同的沉积条件,通过HFCVD方法制备了四种不同质量、不同取向的CVD金刚石薄膜．讨论了薄膜退火前后的介电性能．研究了不同沉积条件和退火工艺与介电性能之间的联系．通过扫描电镜SEM、Raman光谱、XRD、I-V特性曲线以及阻抗分析仪表征CVD金刚石薄膜的特性．结果表明,退火工艺减少了薄膜吸附的氢杂质,改善了薄膜质量．获得的高质量CVD金刚石薄膜具有好的电学性能,在50V偏压条件下电阻率为1．2×1011Ω·cm,频率在2MHz条件下介电常数为5．73,介电损耗为0．02．

掺硼浓度对金刚石薄膜二次电子发射特性的影响

掺硼金刚石薄膜具有负电子亲和势和良好的电子运输性能且容易制备,作为冷阴极材料在图像显示技术和真空技术等领域都存在巨大的应用价值,引起人们的广泛关注。采用MPCVD法利用氢气、甲烷和硼烷的混合气体,制备出不同浓度的掺硼金刚石薄膜。结果表明,掺硼浓度影响金刚石薄膜的物相结构、组织形貌,进而影响其二次电子发射性能,当硼烷的流量为4mL/min时,制备的金刚石薄膜质量最好,二次电子发射系数约为90。

HIPIB烧蚀等离子体沉积DLC薄膜结构及性能

利用强流脉冲离子束(HIPIB)烧蚀等离子体在Si(100)基体上快速沉积类金刚石(DLC)薄膜.电压为250keV,束流密度为250A/cm2,脉宽为70ns的离子束(主要由碳离子和氢离子组成)聚焦到石墨靶材上,使石墨充分电离产生稠密的烧蚀等离子体,在石墨靶的法线方向的Si基体上沉积出非晶的DLC薄膜,基片温度选择25℃和100℃.XPS分析显示DLC薄膜中sp3C的含量达到40%.扫描电镜和原子力显微镜分析得知薄膜表面比较光滑,100℃时沉积的DLC薄膜的表面更光滑,表面粗糙度为0.927nm,其摩擦因数为0.10;TEM分析表明DLC薄膜的相结构是非晶的;X射线衍射分析得出薄膜的宏观残余应力为压应力,其大小约为4GPa.

薄膜材料与器件

O484.1 2000010458激光辅助化学气相沉积金刚石薄膜实验研究=Synthesisof diamond films by laser-assistedchemical vapour deposition[刊,中]/任德明,胡孝勇,刘逢梅,赵景山,王楠楠,马祖光（哈尔滨工业大学光电子技术研究所.黑龙江,哈尔滨（150001））//光电子·激光.—1998,9（6）.—446-449采用激光辅助化学气相沉积法合成了厚度为15μm的金刚石薄膜。实验结果表明:以丙酮为碳源气体,并用XeCl（308 nm）准分子激光解离,H2用灯丝进行预先解离,适当选择和控制各种实验参数,可获得高质量的金刚石薄膜。还讨论了衬底温度以及灯丝温度等实验参数对薄膜生长速率与薄膜质量的影响。图9表1参8（郑锦玉）O484.2 2000010459离化团束沉积中的分子动力学模拟=Molecular dynamicssimulation in ionized clusterbeams deposition[刊,中]/张豪,夏宗宁（清华大学材料科学与工程系.北京（100084））//人工晶体学报.—1998,27（4）.

Effect of deposition parameters on micro-and nano-crystalline diamond films growth on WC-Co substrates by HFCVD

The characteristics of hot filament chemical vapor deposition（HFCVD） diamond films are significantly influenced by the deposition parameters, such as the substrate temperature, total pressure and carbon concentration. Orthogonal experiments were introduced to study the comprehensive effects of such three parameters on diamond films deposited on WC-Co substrates. Field emission scanning electron microscopy, atomic force microscopy and Raman spectrum were employed to analyze the morphology, growth rate and composition of as-deposited diamond films. The morphology varies from pyramidal to cluster features with temperature decreasing. It is found that the low total pressure is suitable for nano-crystalline diamond films growth. Moreover, the substrate temperature and total pressure have combined influence on the growth rate of the diamond films.

Effects of deposition parameters on HFCVD diamond films growth on inner hole surfaces of WC-Co substrates

Deposition parameters that have great influences on hot filament chemical vapor deposition (HFCVD) diamond films growth on inner hole surfaces of WC?Co substrates mainly include the substrate temperature (t), carbon content (φ), total pressure (p) and total mass flow (F). Taguchi method was used for the experimental design in order to study the combined effects of the four parameters on the properties of as-deposited diamond films. A new figure-of-merit (FOM) was defined to assess their comprehensive performance. It is clarified thatt,φandp all have significant and complicated effects on the performance of the diamond film and the FOM, which also present some differences as compared with the previous studies on CVD diamond films growth on plane or external surfaces. Aiming to deposit HFCVD diamond films with the best comprehensive performance, the key deposition parameters were finally optimized as:t=830 °C,φ=4.5%,p=4000 Pa,F=800 mL/min.

Preparation, characterization and electrochemical properties of boron-doped diamond films on Nb substrates

A series of boron-doped polycrystalline diamond films were prepared by hot filament （HF） chemical vapor deposition on Nb substrates. The effects of B/C ratio of reaction gas on film morphology, growth rate, chemical bonding states, phase composition and electrochemical properties of each deposited sample were studied by scanning electron microscopy, Raman spectra, X-ray diffraction, microhardness indentation, and electrochemical analysis. Results show that the average grain size of diamond and the growth rate decrease with increasing the B/C ratio. The diamond films exhibit excellent adhesion under Vickers microhardness testing （9.8 N load）. The sample with 2% B/C ratio has a wider potential window and a lower background current as well as a faster redox reaction rate in H2SO4 solution and KFe（CN）6 redox system compared with other doping level electrodes.

STUDY ON DIAMOND LIKE CARBON THIN FILM BY FILTERED VACUUM ARC DEPOSITION

Diamond like carbon thin film is successfully deposited on silicon, titanium and stainless steel substrate at low temperature in a filtered vacuum arc deposition system. Arc discharges are established on a graphite cathode in the system with a toroidal macroparticle filter. A cathode activating magnetic field and a filtered magnetic field to collimate the plasma beam are applied. Ion current convected by the plasma beam is measured with a negatively biased probe. It is shown that the magnetic field of the coils located on the plasma duct has a strong influence on cathode spot behavior. Orthogonally the designed experiments are carried out to optimize the deposition parameters of arc stability. Finally, the diamond like carbon thin films are studied by scanning electron microscope (SEM) and Raman spectrum.

EFFECT OF GRID BIAS ON DEPOSITION OF NANOCRYSTALLINE DIAMOND FILMS

A positive grid bias and a negative substrate bias voltages are applied to the self-made hot filament chemical vapor deposited （HFCVD） system. The high quality nanocrystalline diamond （NCD） film is successfully deposited by double bias voltage nucleation and grid bias voltage growth. The Micro-Raman XRD SEM and AFM are used to investigate the diamond grain size, microstructure, surface morphology, and nucleation density. Results show that the obtained NCD has grain size of about 20 nm. The effect of grid bias voltage on the nucleation and the diamond growth is studied. Experimental results and theoretical analysis show that the positive grid bias increases the plasma density near the hot filaments, enhances the diamond nucleation, keeps the nanometer size of the diamond grains, and improves the quality of diamond film.

Experimental Research of DLC Film Deposited by Filtered Vacuum Arc Evaporation

Diamond like carbon (DLC) films was grown successfully on silicon, titanium and high speed steel (HSS) substrate at low temperature in a filtered vacuum arc deposition system. Arc discharges were established on a graphite cathode in this home built system with a toridal macroparticles filter. Ion current convected by the plasma beam was measured with a negatively biased probe. It was shown that the magnetic field of the coils located on the plasma duct has a strong influence on ion current. Scanning electron microscope (SEM), atomic force microscope (AFM) and Raman spectrum are used to study the DLC films. Tribological behaviors of the deposited film are also studied.

Si-doped diamond films prepared by chemical vapour deposition

The effects of Si doping on morphology, components and structure characteristics of CVD diamond films were studied. Si-doped CVD diamond films were deposited on Si substrate by adding tetraethoxysilane （TEOS） into acetone as source of reactant gas. The morphology and microstructure of diamond films were characterized by scanning electron microcopy （SEM）. The crystalline quality of diamond films was studied by Raman spectroscopy and X-ray diffractometry （XRD）. The surface roughness of the films was evaluated with surface profilometer. The results suggest that Si doping tends to reduce the crystallite size, enhance grain refinement and inhibit the appearance of （11 I） facets. Raman spectra indicate that Si doping can enhance the formation of sp2 phase in diamond films. Moreover, Raman signal of SiC was detected, which suggests the existence of Si in the diamond films. Smooth fine-grained diamond （SFGD） film was synthesized at Si to C ratio of 1%.

Amorphous SiO_2 interlayers for deposition of adherent diamond films onto WC-Co inserts

Amorphous Si O2（a-Si O2） films were synthesized on WC-Co substrates with H2 and tetraethoxysilane（TEOS） via pyrolysis of molecular precursor.X-ray diffraction（XRD） pattern shows that silicon-cobalt compounds form at the interface between a-Si O2 films and WC-Co substrates.Moreover,it is observed by transmission electron microscope（TEM） that the a-Si O2 films are composed of hollow mirco-spheroid a-Si O2 particles.Subsequently,the a-Si O2 films are used as intermediate films and chemical vapor deposition（CVD） diamond films are deposited on them.Indentation tests were performed to evaluate the adhesion of bi-layer（a-Si O2 ＋ diamond） films on cemented carbide substrates.And the cutting performance of bi-layer（a-Si O2 ＋ diamond） coated inserts was evaluated by machining the glass fiber reinforced plastic（GFRP）.The results show that a-Si O2 interlayers can greatly improve the adhesive strength of diamond films on cemented carbide inserts;furthermore,thickness of the a-Si O2 interlayers plays a significant role in their effectiveness on adhesion enhancement of diamond films.

Effect of deposition temperature on properties of boron-doped diamond films on tungsten carbide substrate

Boron-doped diamond(BDD)films were deposited on the tungsten carbide substrates at different substrate temperatures ranging from 450 to 850°C by hot filament chemical vapor deposition(HFCVD)method.The effect of deposition temperature on the properties of the boron-doped diamond films on tungsten carbide substrate was investigated.It is found that boron doping obviously enhances the growth rate of diamond films.A relatively high growth rate of 544 nm/h was obtained for the BDD film deposited on the tungsten carbide at 650°C.The added boron-containing precursor gas apparently reduced activation energy of film growth to be 53.1 kJ/mol,thus accelerated the rate of deposition chemical reaction.Moreover,Raman and XRD analysis showed that heavy boron doping(750 and 850°C)deteriorated the diamond crystallinity and produced a high defect density in the BDD films.Overall,600-700°C is found to be an optimum substrate temperature range for depositing BDD films on tungsten carbide substrate.

Influence of methane on hot filament CVD diamond films deposited on high-speed steel substrates with WC-Co interlayer

Diamond films were deposited on high-speed steel substrates by hot filament chemical vapor deposition （HFCVD） method. To minimize the early formation of graphite and to enhance the diamond film adhesion, a WC-Co coating was used as an interlayer on the steel substrates by high velocity oxy-fuel spraying. The effects of methane content on nucleation, quality, residual stress and adhesion of diamond films were investigated. The results indicate that the increasing methane content leads to the increase in nucleation density, residual stress, the degradation of quality and adhesion of diamond films. Diamond films deposited on high-speed steel （HSS） substrate with a WC-Co interlayer exhibit high nucleation density and good adhesion under the condition of the methane content initially set to be a higher value （4%, volume fraction） for 30 min, and then reduced to 2% for subsequent growth at pressure of 3 kPa and substrate temperature of 800 ℃.

材料制备工艺

Y98-61403-1 9907398Skutterudite 晶体结构工艺的改进=Skutterudites:anupdate[会,英]/Fleurial,J.-P.& Caillat,T.//199716th International Conference on Thermoelectrics.—1～11(AG)