Ti-doped nonstoichiometric LiFePO4, i.e. Li0.95Fe0.95Ti0.05PO4 was synthesized by solid-state reaction method. X-ray diffraction (XRD), Fourier-transform infrared spectroscopy (FTIR), Scanning electron microscope (SEM...Ti-doped nonstoichiometric LiFePO4, i.e. Li0.95Fe0.95Ti0.05PO4 was synthesized by solid-state reaction method. X-ray diffraction (XRD), Fourier-transform infrared spectroscopy (FTIR), Scanning electron microscope (SEM) and electrochemical charge and discharge tests were used to characterize the as-prepared sample. The results indicate that Li0.95Fe0.95Ti0.05PO4 used as the cathode material for lithium-ion battery exhibits improved cyclic stability and rate capability than those of undoped LiFePO4. 150 mAh·g-1 of discharge capacity was achieved at 0.1 C (17 mA ·g-1) at room temperature.展开更多
以已二醇/水混合溶液为反应介质并结合正丁醇共沸蒸馏处理前驱体,通过化学共沉淀法制备掺钛的Ce1-x Ti x O2(x=0,0.1,0.2,0.3)粉体,运用X射线衍射仪(XRD)、透射电镜(TEM)、Zeta电位仪等仪器对其物相、外观形貌、表面电位等性质进行了表...以已二醇/水混合溶液为反应介质并结合正丁醇共沸蒸馏处理前驱体,通过化学共沉淀法制备掺钛的Ce1-x Ti x O2(x=0,0.1,0.2,0.3)粉体,运用X射线衍射仪(XRD)、透射电镜(TEM)、Zeta电位仪等仪器对其物相、外观形貌、表面电位等性质进行了表征,通过测定去除速率和原子力显微镜观察硅片表面的微观形貌来评价钛掺杂对CeO2磨料硅片抛光性能的影响。结果表明,900℃焙烧时所合成的CeO2及其复合氧化物为均一的纳米球状粒子,一次粒子尺寸为40 nm^50nm。纳米Ce0.8Ti0.2O2粉体对硅片的去除速率达到最大值139nm·min-1,是纳米CeO2磨料(67nm·min-1)的2倍,且在1.0μm×1.0μm的范围内微观表面粗糙度R a值达到0.254nm,而Ce0.9Ti0.1O2和Ce0.7Ti0.3O2的去除速率分别为112nm·min-1和89nm·min-1。适量钛掺杂导致纳米CeO2磨料硅片抛光性能显著提高,它与钛掺杂调谐增大纳米CeO2磨料的其负表面电位大小和生成CeTi2O6物相密切相关。展开更多
文摘Ti-doped nonstoichiometric LiFePO4, i.e. Li0.95Fe0.95Ti0.05PO4 was synthesized by solid-state reaction method. X-ray diffraction (XRD), Fourier-transform infrared spectroscopy (FTIR), Scanning electron microscope (SEM) and electrochemical charge and discharge tests were used to characterize the as-prepared sample. The results indicate that Li0.95Fe0.95Ti0.05PO4 used as the cathode material for lithium-ion battery exhibits improved cyclic stability and rate capability than those of undoped LiFePO4. 150 mAh·g-1 of discharge capacity was achieved at 0.1 C (17 mA ·g-1) at room temperature.
文摘以已二醇/水混合溶液为反应介质并结合正丁醇共沸蒸馏处理前驱体,通过化学共沉淀法制备掺钛的Ce1-x Ti x O2(x=0,0.1,0.2,0.3)粉体,运用X射线衍射仪(XRD)、透射电镜(TEM)、Zeta电位仪等仪器对其物相、外观形貌、表面电位等性质进行了表征,通过测定去除速率和原子力显微镜观察硅片表面的微观形貌来评价钛掺杂对CeO2磨料硅片抛光性能的影响。结果表明,900℃焙烧时所合成的CeO2及其复合氧化物为均一的纳米球状粒子,一次粒子尺寸为40 nm^50nm。纳米Ce0.8Ti0.2O2粉体对硅片的去除速率达到最大值139nm·min-1,是纳米CeO2磨料(67nm·min-1)的2倍,且在1.0μm×1.0μm的范围内微观表面粗糙度R a值达到0.254nm,而Ce0.9Ti0.1O2和Ce0.7Ti0.3O2的去除速率分别为112nm·min-1和89nm·min-1。适量钛掺杂导致纳米CeO2磨料硅片抛光性能显著提高,它与钛掺杂调谐增大纳米CeO2磨料的其负表面电位大小和生成CeTi2O6物相密切相关。
基金Supported by Natural Science Foundation of Shanghai(13ZR1402600)National Natural Science Foundation of China(60578047)+3 种基金the National"973"Program of China(2012CB934303,2009CB929201)Shanghai Commission of Science and Technology(06DJ14007)National"02"Project of China(2011ZX02402)Natural Science Foundation of Shandong Province(2011ZRFL019)
