The wide stripe (15μm) selective area growth (SAG) of InGaAsP by low pressure MOVPE is systematically investigated.The characteristics of the growth ratios,thickness enhancement factors,bandgap modulation,and composi...The wide stripe (15μm) selective area growth (SAG) of InGaAsP by low pressure MOVPE is systematically investigated.The characteristics of the growth ratios,thickness enhancement factors,bandgap modulation,and composition modulation vary with the growth conditions such as mask width,growth pressure.Flux of Ⅲ group precursors are outlined and the rational mechanism behind SAG MOVPE is explained.In addition,the surface spike of the SAG InGaAsP is shown and the course of it is given by the variation of Ⅴ/Ⅲ.展开更多
The dark current of In_(0.47) Ga_(0.53) As/InP heterojunction photodiodes (HPDs) was analysed. We found that there exists a new dark current component──deep level-assisted tunnelling current.DLTS was used to measure...The dark current of In_(0.47) Ga_(0.53) As/InP heterojunction photodiodes (HPDs) was analysed. We found that there exists a new dark current component──deep level-assisted tunnelling current.DLTS was used to measure the In_(0.47)Ga_(0.53)As/InP HPDs. An electronic trap which has a thermal activation energy of O.44 eV, level concentration of 3.10×10￣(13)cm￣(-3) and electronic capture cross section of 1.72×10￣(12)cm￣2 has been found.It's existence results in the new tunnelling current.展开更多
文摘The wide stripe (15μm) selective area growth (SAG) of InGaAsP by low pressure MOVPE is systematically investigated.The characteristics of the growth ratios,thickness enhancement factors,bandgap modulation,and composition modulation vary with the growth conditions such as mask width,growth pressure.Flux of Ⅲ group precursors are outlined and the rational mechanism behind SAG MOVPE is explained.In addition,the surface spike of the SAG InGaAsP is shown and the course of it is given by the variation of Ⅴ/Ⅲ.
文摘The dark current of In_(0.47) Ga_(0.53) As/InP heterojunction photodiodes (HPDs) was analysed. We found that there exists a new dark current component──deep level-assisted tunnelling current.DLTS was used to measure the In_(0.47)Ga_(0.53)As/InP HPDs. An electronic trap which has a thermal activation energy of O.44 eV, level concentration of 3.10×10￣(13)cm￣(-3) and electronic capture cross section of 1.72×10￣(12)cm￣2 has been found.It's existence results in the new tunnelling current.
