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Fabrication of 1.55μm Si-Based Resonant Cavity Enhanced Photodetectors 被引量:3
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作者 毛容伟 左玉华 +6 位作者 李传波 成步文 滕学公 罗丽萍 张合顺 于金中 王启明 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2005年第2期271-275,共5页
A novel bonding method using silicate gel as bonding medium is developed.High reflective SiO 2/Si mirrors deposited on silicon substrates by e-beam deposition are bonded to the active layers at a low temperature of ... A novel bonding method using silicate gel as bonding medium is developed.High reflective SiO 2/Si mirrors deposited on silicon substrates by e-beam deposition are bonded to the active layers at a low temperature of 350℃ without any special treatment on bonding surfaces.The reflectivities of the mirrors can be as high as 99 9%.A Si-based narrow band response InGaAs photodetector is successfully fabricated,with a quantum efficiency of 22 6% at the peak wavelength of 1 54μm,and a full width at half maximum of about 27nm.This method has a great potential for industry processes. 展开更多
关键词 RCE photodetector high quantum efficiency direct bonding bonding medium INGAAS
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硅基1.55μm可调谐共振腔窄带光电探测器的研究 被引量:3
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作者 毛容伟 成步文 +5 位作者 李传波 左玉华 滕学公 罗丽萍 余金中 王启明 《光子学报》 EI CAS CSCD 北大核心 2005年第12期1783-1787,共5页
制作了一种低成本硅基1.55μm可调谐共振腔增强型探测器.首次获得硅基长波长可调谐共振腔探测器的窄带响应,共振峰量子效率达44%,峰值半高宽为12.5nm,调谐范围14.5nm,并且获得1.8GHz的高频响应.本制作工艺不复杂,成本低,有望用于工业生产.
关键词 共振腔增强型探测器 介质 INGAAS 可调谐 高频响应
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Ultra-low temperature anodic bonding of silicon and glass based on nano-gap dielectric barrier discharge
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作者 YAO Fu-rong PAN Ming-qiang +2 位作者 ZHU Zong-jian LIU Ji-zhu WANG Yang-jun 《Journal of Central South University》 SCIE EI CAS CSCD 2021年第2期351-360,共10页
The article improves the process of dielectric barrier discharge(DBD)activated anode bonding.The treated surface was characterized by the hydrophilic surface test.The results showed that the hydrophilic angle was sign... The article improves the process of dielectric barrier discharge(DBD)activated anode bonding.The treated surface was characterized by the hydrophilic surface test.The results showed that the hydrophilic angle was significantly reduced under nano-gap conditions and the optimal discharge voltage was 2 kV.Then,the anodic bonding and dielectric barrier discharge activated bonding were performed in comparison experiments,and the bonding strength was characterized by tensile failure test.The results showed that the bonding strength was higher under the nano-gap dielectric barrier discharge.This process completed 110°C ultra-low temperature anodic bonding and the bonding strength reached 2 MPa.Finally,the mechanism of promoting bonding after activation is also discussed. 展开更多
关键词 dielectric barrier discharge anodic bonding ultra-low temperature
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