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试论我国眼镜片屈光值的基准传递和测量 被引量:1
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作者 萧如宝 《光学技术》 CAS CSCD 1990年第3期37-45,共9页
本文从镜度仪的光学设计原理和有关各国眼镜片的基准弯度,提出作为校正和检定镜度仪精度的基准屈光值镜片之内侧面弯度为-6 D。基准值镜片接触面曲率不同,会产生原理误差。本文还提出测试基准屈光值的方法和仪器,根据眼镜片内顶点屈光... 本文从镜度仪的光学设计原理和有关各国眼镜片的基准弯度,提出作为校正和检定镜度仪精度的基准屈光值镜片之内侧面弯度为-6 D。基准值镜片接触面曲率不同,会产生原理误差。本文还提出测试基准屈光值的方法和仪器,根据眼镜片内顶点屈光度的定义,在光具座上测定顶焦距l_f′的倒数值比直接测试要正确。 展开更多
关键词 屈光值 测量 镜度仪
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Determination of efficient superfinishing conditions for mirror surface finishing of titanium 被引量:2
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作者 KIM Jin-seob LIM Eun-seong JUNG Yoon-gyo 《Journal of Central South University》 SCIE EI CAS 2012年第1期155-162,共8页
To determine mirror surface finishing conditions and efficient and economical superfinishing conditions for pure titanium and titanium alloys, an abrasive film is used when superfinishing is performed under varying co... To determine mirror surface finishing conditions and efficient and economical superfinishing conditions for pure titanium and titanium alloys, an abrasive film is used when superfinishing is performed under varying conditions. These conditions include the workpiece rotation speed, the oscillation speed, the contact pressure of the roller, the hardness of the roller, and the type of abrasive film. The superfinishing device is applied to polishing a thin and long cylindrical bar. A micro-finishing film and a lapping film were used as abrasive films. A1203 grains or SiC grains were used as abrasives. The surface roughness of a polished workpiece was measured using a stylus-type surface-roughness measuring instrument. As a result, the conditions to improve the polishing surface efficiently include high values for the workpiece rotation speed, oscillation speed and contact pressure. The roller hardness has no effect on the efficient polishing conditions. The mirror finish of a surface can be created using lapping film of 3 μm with Al2O3 grains after polishing to a steady surface roughness under the efficient polishing conditions. 展开更多
关键词 SUPERFINISHING mirror surface finishing abrasive film surface roughness TITANIUM optimal polishing time
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CHARACTER OF RETROREFLECTOR’S LIGHT FIELD’S ENERGY DISTRIBUTION AND ITS MEASURING TECHNOLOGY 被引量:2
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作者 杜颖 李真 张国雄 《Transactions of Tianjin University》 EI CAS 2000年第2期117-121,共页
The formation of the retroreflected light field is introduced in the paper and the components of the retroreflected light field are analyzed.Furthermore,a deep analysis of the factors affecting energy distribution of ... The formation of the retroreflected light field is introduced in the paper and the components of the retroreflected light field are analyzed.Furthermore,a deep analysis of the factors affecting energy distribution of the retroreflected light,such as design deviation,angle of incidence,was made.The simulation of the retroreflected light field was done.Recommendation is made in detail on both the energy distribution of the retroreflected light field at different working distances and the energy distribution of the retroreflected light field at a short distance when the diverging light comes.At last,two kinds of measuring instrument for the retroreflector are introduced,one is the long tunnel measuring instrument,the other is the minitype measuring instrument based on the character of the retroreflector when the diverging light comes. 展开更多
关键词 retroreflector retroreflected light field photometric measurement measuring instrument
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Tunable Self-assembled Weak Polyelectrolyte Brushes
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作者 Chiotelis Ioannis 《Journal of Chemistry and Chemical Engineering》 2017年第3期124-133,共10页
The authors have investigated the pH and ionic strength response of self-assembled layers formed by adsorption of amphiphilic weak polyelectrolytes. Using the SFA (Surface Forces Apparatus) the authors measured forc... The authors have investigated the pH and ionic strength response of self-assembled layers formed by adsorption of amphiphilic weak polyelectrolytes. Using the SFA (Surface Forces Apparatus) the authors measured force-distance profiles of poly (isoprene)-poly (acrylic acid) block copolymers adsorbed on mica. Also by Atomic Force Microscopy the authors captured single polyelectrolyte molecule adsorbed on a surface. The effect of salt concentration (Cs) and pH upon the height of the brush layers was explored mainly by measuring the forces between two adsorbed polyelectrolyte brushes. At pH = 4 our results are in good agreement with the scaling prediction L0 ∝Cs-1/3 Changing the pH from 4 to 10 causes a remarkable swelling of the polymer layer, but only a weak dependence on salt concentration was detected at the higher pH. This can be attributed to the degree of dissociation, which depends on the local pH value. At low pH the polyelectrolyte chains have a low charge density, while on increasing the pH the degree of dissociation rises, and the increased charge density is followed by swelling of the adsorbed layer. The local concentration of ions in the brush is now greater than that of pH = 4 and approximately equivalent to 0.3 M. So the swelling is only weakly dependent on salt concentration in the range 0.01-1.0 M. The results demonstrate the tunable nature of such self-assembled polyelectroiyte brushes whose height and range of interactions, can be systematically controlled by adjusting the pH and ionic strength of the medium. 展开更多
关键词 Polyelectrolytes pH self-assembled layers surface forces apparatus atomic force microscopy tunable nature of suchself-assembled polyelectrolyte brushes ionic strength.
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Effects of annealing temperature on microstructure and ferroelectric properties of Bi_(0.5)(Na_(0.85)K_(0.15))_(0.5)TiO_3 thin films 被引量:1
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作者 龚跃球 郑学军 +4 位作者 龚伦军 马颖 张大志 戴顺洪 李旭军 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2010年第10期1906-1910,共5页
Bi0.5(Na0.85K0.15)0.5TiO3(BNKT15) thin films were synthesized by metal-organic decomposition(MOD) at annealing temperatures of 650,680,710 and 740℃,and the effects of annealing temperature on the microstructure,diele... Bi0.5(Na0.85K0.15)0.5TiO3(BNKT15) thin films were synthesized by metal-organic decomposition(MOD) at annealing temperatures of 650,680,710 and 740℃,and the effects of annealing temperature on the microstructure,dielectric properties,remnant polarization(2Pr) and leakage current density were studied with X-ray diffractometer,atomic force microscope,precision impedance analyzer,ferroelectric analysis station and semiconductor parameter tester.The results show that the thin film annealed at 710℃ exhibits a typical perovskite structure without predominant orientation and a smooth surface with evenly distributed grains.2Pr value(67.4 μC/cm2 under 830 kV/cm) and the leakage current density(1.6×10-6 A/cm2 at 170 kV/cm) for BNKT15 thin film annealed at 710℃ are better than those for thin films annealed at other temperatures. 展开更多
关键词 BNKT 15 thin film metal-organic decomposition annealing temperature remnant polarization leakage current density
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