Lee discrepancy has been employed to measure the uniformity of fractional factorials.In this paper,we further study the statistical justification of Lee discrepancy on asymmetrical factorials.We will give an expressio...Lee discrepancy has been employed to measure the uniformity of fractional factorials.In this paper,we further study the statistical justification of Lee discrepancy on asymmetrical factorials.We will give an expression of the Lee discrepancy of asymmetrical factorials with two-and three-levels in terms of quadric form,present a connection between Lee discrepancy,orthogonality and minimum moment aberration,and obtain a lower bound of Lee discrepancy of asymmetrical factorials with two-and three-levels.展开更多
基金supported by Research Fund for the Doctoral Program of Higher Education of China (RFDP) (Grant No. 20090144110002)
文摘Lee discrepancy has been employed to measure the uniformity of fractional factorials.In this paper,we further study the statistical justification of Lee discrepancy on asymmetrical factorials.We will give an expression of the Lee discrepancy of asymmetrical factorials with two-and three-levels in terms of quadric form,present a connection between Lee discrepancy,orthogonality and minimum moment aberration,and obtain a lower bound of Lee discrepancy of asymmetrical factorials with two-and three-levels.
