The reverse generation current under high-gate-voltage stress condition in LDD nMOSFET＇s is studied. We find that the generation current peak decreases as the stress time increases. We ascribe this finding to the dom...The reverse generation current under high-gate-voltage stress condition in LDD nMOSFET＇s is studied. We find that the generation current peak decreases as the stress time increases. We ascribe this finding to the dominating oxide trapped electrons that reduce the effective drain bias, lowering the maximal generation rate. The density of the effective trapped electrons affecting the effective drain bias is calculated with our model.展开更多
The effects of trapped electrons on off-axis lower hybrid current drive （LHCD） in tokamaks are studied. The influence of the resonance regime on the current drive efficiency as well as the influence of trapped parti...The effects of trapped electrons on off-axis lower hybrid current drive （LHCD） in tokamaks are studied. The influence of the resonance regime on the current drive efficiency as well as the influence of trapped particle fraction on the current drive efficiency are emphasized.展开更多
文摘The reverse generation current under high-gate-voltage stress condition in LDD nMOSFET＇s is studied. We find that the generation current peak decreases as the stress time increases. We ascribe this finding to the dominating oxide trapped electrons that reduce the effective drain bias, lowering the maximal generation rate. The density of the effective trapped electrons affecting the effective drain bias is calculated with our model.
基金Supported by the National Natural Science Foundation of China （10675043, 10575031 and 10675042）
文摘The effects of trapped electrons on off-axis lower hybrid current drive （LHCD） in tokamaks are studied. The influence of the resonance regime on the current drive efficiency as well as the influence of trapped particle fraction on the current drive efficiency are emphasized.
