T H742 99053444近场光学显微镜中利用剪切力原理进行样品/探针间距测控的非光学方法=Non—optical methods ofsample—tip distance regulation based onshearforce in SNOM[刊,中]/刘秀梅,王佳,李达成(清华大学精密仪器系精密测试技...T H742 99053444近场光学显微镜中利用剪切力原理进行样品/探针间距测控的非光学方法=Non—optical methods ofsample—tip distance regulation based onshearforce in SNOM[刊,中]/刘秀梅,王佳,李达成(清华大学精密仪器系精密测试技术与仪器国家重点实验室.北京(100084))//光学技术.—1998,(5).—6—10综述了扫描近场光学显微镜发展以来所出现的基于剪切力原理进行样品/探针间距的探测的一些主要的非光学方法。包括利用PMT直接探测样品辐射,利用音叉、电容、阻抗以及压电效应的探测方法等,并对各种方法的优缺点进行了分析比较。图8参11(方舟)展开更多
Polaron induced double electron in a quantum dot is investigated using the exact diagonalization techniques and the compact density-matrix approach. The dependence of nonlinear optical processes on the incident photon...Polaron induced double electron in a quantum dot is investigated using the exact diagonalization techniques and the compact density-matrix approach. The dependence of nonlinear optical processes on the incident photon energies and the polaronic effect are brought out. The linear, third order non-linear optical absorption coefficients and the refractive index changes of singlet and triplet states as a function of photon energy are obtained with and without the inclusion of polaronic effect. It is found that the geometrical confinement and the effect of polaron have great influence on the optical properties of dots.展开更多
文摘Polaron induced double electron in a quantum dot is investigated using the exact diagonalization techniques and the compact density-matrix approach. The dependence of nonlinear optical processes on the incident photon energies and the polaronic effect are brought out. The linear, third order non-linear optical absorption coefficients and the refractive index changes of singlet and triplet states as a function of photon energy are obtained with and without the inclusion of polaronic effect. It is found that the geometrical confinement and the effect of polaron have great influence on the optical properties of dots.