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均匀带电非导体圆盘边缘的电势的几种解法 被引量:4
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作者 蒋卫建 胡昉 方本民 《大学物理》 北大核心 2013年第8期24-28,共5页
在大学物理课程的知识范围内,讨论了均匀带电非导体圆盘边缘上一点的电势的几种解法,包括解析解法和数值解法.
关键词 非导体圆盘 边缘 电势
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导体与非导体介质翼型的缩比模型RCS数值计算分析 被引量:1
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作者 李江海 孙秦 《航空计算技术》 2008年第1期23-25,共3页
应用二维电磁散射有限元算法理论考虑了几组导体和非导体介质翼型的缩比计算模型,计算出缩比模型的RCS并与1:1模型进行对比。结果显示,导体翼型的缩比模型RCS计算结果与推及的二维导体外形缩比模型测量定律完全符合;非导体翼型的缩比模... 应用二维电磁散射有限元算法理论考虑了几组导体和非导体介质翼型的缩比计算模型,计算出缩比模型的RCS并与1:1模型进行对比。结果显示,导体翼型的缩比模型RCS计算结果与推及的二维导体外形缩比模型测量定律完全符合;非导体翼型的缩比模型在等效阻抗增大时,按缩比测量定律计算的RCS与1:1模型间的相对误差越来越大,但在等效阻抗小于0.5时缩比定律是有效的。 展开更多
关键词 导体翼型 非导体介质翼型 缩比模型 RCS
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磁流体非导体型特殊组合电容传感模型与参数优化(英文)
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作者 曹东 刘桂雄 +1 位作者 邱东勇 程韬波 《科学技术与工程》 2007年第3期285-287,293,共4页
分析磁流体传感模式,建立非导体型特殊多介质带缝隙半圆柱组合电容传感模型,综合考虑电容传感灵敏度以及电容值进行多目标优化。借助电容值函数特点分析,将多目标函数转化为单目标优化问题,并利用坐标轮换法优化方法。进行多维参数优化... 分析磁流体传感模式,建立非导体型特殊多介质带缝隙半圆柱组合电容传感模型,综合考虑电容传感灵敏度以及电容值进行多目标优化。借助电容值函数特点分析,将多目标函数转化为单目标优化问题,并利用坐标轮换法优化方法。进行多维参数优化。可以推广于其他磁流体传感建模及优化领域。 展开更多
关键词 磁流体传感器 多介质 非导体 组合电容 优化
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在不连续Pd粒子覆盖的非导体表面电沉积铜的研究 被引量:1
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作者 王桂香 李宁 黎德育 《材料保护》 CAS CSCD 北大核心 2006年第10期12-15,共4页
考察了在覆盖有分散Pd粒子的非导体表面电沉积铜的初始阶段,发现非导体在电沉积前的面电阻达到100MΩ/cm时可实现较快速度的电沉积。铜层生长前沿分为厚镀层区和薄镀层区两部分,厚镀层区外观为红色,形成致密的结晶;薄镀层区颜色发黑,小... 考察了在覆盖有分散Pd粒子的非导体表面电沉积铜的初始阶段,发现非导体在电沉积前的面电阻达到100MΩ/cm时可实现较快速度的电沉积。铜层生长前沿分为厚镀层区和薄镀层区两部分,厚镀层区外观为红色,形成致密的结晶;薄镀层区颜色发黑,小的铜晶粒在高能表面首先生成。离挂具点近的地方结晶致密,反之则结晶稀疏。SEM照片显示出最初沉积的铜层是以Pd为沉积点的不规则块状,其大小为2~5μm2,随后在众多连续状上有晶体缺陷的高能表面沉积出具有立方形状的铜晶体。电沉积铜过程的推动力是生长前沿高达106A/dm2的电流密度,先沉积的铜层起到挂具的作用直到非金属表面被完全覆盖。 展开更多
关键词 电沉积铜 非导体 不连续Pd粒子 镀层形貌
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静电非导体板最少引燃面积的研究 被引量:1
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作者 黄久生 李春萍 《静电》 1995年第3期20-21,共2页
关键词 绝缘体 静电非导体 最少引燃面积
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“非导体放电加工”初步试验
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作者 张彦 《电加工》 1994年第2期26-27,共2页
“非导体放电加工”初步试验河南焦作平原光学仪器厂一分厂张彦我们对用放电加工类对光学玻璃等这一类非导体进行加工这一方法进行了初步探讨与试验。一、加工原理对于光学玻璃、陶瓷等这类非导体,用常规的电加工方法,当将一些放电因... “非导体放电加工”初步试验河南焦作平原光学仪器厂一分厂张彦我们对用放电加工类对光学玻璃等这一类非导体进行加工这一方法进行了初步探讨与试验。一、加工原理对于光学玻璃、陶瓷等这类非导体,用常规的电加工方法,当将一些放电因素改变后,使之发生诱发放电,便可初... 展开更多
关键词 非导体 电火花加工 试验 光学玻璃
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胶体钯活化液的维护和再生 被引量:2
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作者 郑辅养 马廷椿 《电镀与精饰》 CAS 1991年第4期19-21,共3页
胶体钯活化液的破坏主要是由于Sn(Ⅱ)被氧化的结果,維护的关键是避免Sn(Ⅱ)被氧化。根据活化液破坏的不同阶段,可采用不同的措施对其进行再生。
关键词 非导体 电镀 胶体钯 活化液
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圆形区域变化磁场激发涡旋电场的问题剖析及案例分析 被引量:3
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作者 黄绍书 王金霞 《物理通报》 2017年第12期107-110,共4页
剖析涡旋电场的分布以及涡旋电场中非导体约束和导体约束条件下的电势问题,给出在限定的圆形区域内均匀变化磁场中的涡旋电场、感生电动势与电势的分布规律,以及在这限定的圆形区域内均匀变化的磁场中,非导体约束和导体约束条件下电势... 剖析涡旋电场的分布以及涡旋电场中非导体约束和导体约束条件下的电势问题,给出在限定的圆形区域内均匀变化磁场中的涡旋电场、感生电动势与电势的分布规律,以及在这限定的圆形区域内均匀变化的磁场中,非导体约束和导体约束条件下电势的计算与比较.通过在涡旋电场中对电源、电势及电压等概念的引入,澄清了一些在大学物理教学中涉及涡旋电场的容易模糊、难于理解的概念.对涡旋电场的一个具体案例进行了详细分析. 展开更多
关键词 感生电动势 涡旋电场 非导体约束 导体约束 案例分析
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All-Optical Sampling Using Nonlinear Polarization Rotation in a Single Semiconductor Optical Amplifier 被引量:2
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作者 张尚剑 张谦述 +2 位作者 李和平 刘永智 刘永 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第6期1031-1035,共5页
We propose a novel all-optical sampling method using nonlinear polarization rotation in a semiconductor optical amplifier. A rate-equation model capable of describing the all-optical sampling mechanism is presented in... We propose a novel all-optical sampling method using nonlinear polarization rotation in a semiconductor optical amplifier. A rate-equation model capable of describing the all-optical sampling mechanism is presented in this paper. Based on this model, we investigate the optimized operating parameters of the proposed system by simulating the output intensity of the probe light as functions of the input polarization angle, the phase induced by the polarization controller, and the ori- entation of the polarization beam splitter. The simulated results show that we can obtain a good linear slope and a large linear dynamic range,which is suitable for all-optical sampling. The operating power of the pump light can be less than lmW. The presented all-optical sampling method can potentially operate at a sampling rate up to hundreds GS/s and needs low optical power. 展开更多
关键词 optical signal processing all-optical sampling semiconductor optical amplifier nonlinear polarization rotation
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煤矿井下的瓦斯和煤尘
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作者 董鹤歧 《爆炸性环境电气防爆技术》 1995年第2期15-19,共5页
煤矿井下的瓦斯和煤尘天津职业大学董鹤歧摩擦起电的现象在生活中经常遇到,至于电在工业生产中的意义,却使许多人只注意了它的有益之处,而忽略了它所造成的危害。静电火花放电所引起的突发性燃爆,使得厂矿设备遭到破坏,甚至造成人... 煤矿井下的瓦斯和煤尘天津职业大学董鹤歧摩擦起电的现象在生活中经常遇到,至于电在工业生产中的意义,却使许多人只注意了它的有益之处,而忽略了它所造成的危害。静电火花放电所引起的突发性燃爆,使得厂矿设备遭到破坏,甚至造成人员伤亡,这就是静电的危害。煤炭是重... 展开更多
关键词 煤矿井 体电阻率 最小引燃能量 表面电阻率 环境温度 静电序列 静电危害 静电非导体 瓦斯爆炸 功函数
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印制电路板直接电镀技术
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作者 张伯平 《电子技术与软件工程》 2015年第20期116-116,共1页
在微电子技术迅速发展的当前社会,印制电路板也发生了一系列的变革,这也使得印制电路板的制造技术水平有了更高的要求。本文从直接电镀的原理、发展优势,对直接电镀技术分析后,分析电镀系统的正确使用方式,从而促进印制电路制造水平的... 在微电子技术迅速发展的当前社会,印制电路板也发生了一系列的变革,这也使得印制电路板的制造技术水平有了更高的要求。本文从直接电镀的原理、发展优势,对直接电镀技术分析后,分析电镀系统的正确使用方式,从而促进印制电路制造水平的高速发展。 展开更多
关键词 微电子技术 印制电路板 非导体 电镀技术
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Analysis of the One Dimensional Steady State Semiconductor Multijunction Device Model with the Avalanche Effect *
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作者 边永新 王元明 《Journal of Southeast University(English Edition)》 EI CAS 1998年第1期127-133,共7页
In this paper we consider the stationary multijunction device model with the avalanche effect. Using the singular perturbation method, an approximation to the current voltage curve is obtained. The cause and the condi... In this paper we consider the stationary multijunction device model with the avalanche effect. Using the singular perturbation method, an approximation to the current voltage curve is obtained. The cause and the condition for the occurrence of saturation current is analyzed. Especially, it is pointed that the avalanche effect is responsible for the blowing up of the saturation current. We prove the existence of multiple steady state solution when the ionization rate is relatively small. Finally, some numerical examples are presented to show the reliability of the theoretical results. 展开更多
关键词 singular perturbations SEMICONDUCTOR nonlinear differential equation SIMULATION
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Analytical Model for Calculating Trapped Charge in a-Si:H and Its Relative Error Analysis
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作者 WAN Xinheng XU Zhongyang ZOU Xuecheng(Huanzhong Univ.of Sci.and Tech.,Wuhan 430074,CHN ) 《Semiconductor Photonics and Technology》 CAS 1996年第2期84-89,共6页
Using a Taylor series expansion for the Fermi-Dirac occupation function,an accurate analytical model is developed for calculating the trapped-charge density in a-Si: H considering deep and tail states simultaneously w... Using a Taylor series expansion for the Fermi-Dirac occupation function,an accurate analytical model is developed for calculating the trapped-charge density in a-Si: H considering deep and tail states simultaneously without simplification.This is followed by the investigation of the relative errors of the localized trapped charge density in a-Si:H at all temperatures as a function of the quasi-Fermi level in the band gap calculated from three published analytical models and our above model. The results suggest that the relative errors of all these models increase notably as Efn is very closed to Ec(e.g.,-0.01 eV< Efn-Ec).It is also noticed that the relative errors of all above models become larger normally the greater is the value of temperature.A detailed analysis indicates that each model has its own applicability with various temperatures and various positions of the Fermi level. 展开更多
关键词 Amorphous Semiconductors Amorphous Silicon Films Density Measurement Error Analysis
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Amorphous Silicon 16—bit Array Photodetector
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作者 ZHANGShaoqiang XUZhongyang 《Semiconductor Photonics and Technology》 CAS 1997年第1期20-23,共4页
Abstract: An amorphous silicon 16 - bit array photodetector with the a - SiC/a -Si heterojunction diode is presented. The fabrication processes of the device were studied systematically. By the optimum of the diode st... Abstract: An amorphous silicon 16 - bit array photodetector with the a - SiC/a -Si heterojunction diode is presented. The fabrication processes of the device were studied systematically. By the optimum of the diode structure and the preparation procedures, the diode with Id< 10 -12 A/mm2 and photocurrent Ip^0.35 A/W has been obtained at the wavelength of 632 nm. 展开更多
关键词 Amorphous Semiconductor PHOTODETECTOR Semiconductor Technology
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Reflection of thermo-elastic wave in semiconductor nanostructures nonlocal porous medium 被引量:1
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作者 HASHMAT Ali ADNAN Jahangir AFTAB Khan 《Journal of Central South University》 SCIE EI CAS CSCD 2020年第11期3188-3201,共14页
The current work is an extension of the nonlocal elasticity theory to fractional order thermo-elasticity in semiconducting nanostructure medium with voids.The analysis is made on the reflection phenomena in context of... The current work is an extension of the nonlocal elasticity theory to fractional order thermo-elasticity in semiconducting nanostructure medium with voids.The analysis is made on the reflection phenomena in context of three-phase-lag thermo-elastic model.It is observed that,four-coupled longitudinal waves and an independent shear vertical wave exist in the medium which is dispersive in nature.It is seen that longitudinal waves are damped,and shear wave is un-damped when angular frequency is less than the cut-off frequency.The voids,thermal and non-local parameter affect the dilatational waves whereas shear wave is only depending upon non-local parameter.It is found that reflection coefficients are affected by nonlocal and fractional order parameters.Reflection coefficients are calculated analytically and computed numerically for a material,silicon and discussed graphically in details.The results for local(classical)theory are obtained as a special case.The study may be useful in semiconductor nanostructure,geology and seismology in addition to semiconductor nanostructure devices. 展开更多
关键词 three-phase lag model semiconductor fractional order time derivative non-local theory NANOSTRUCTURE voids REFLECTION
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The Critical Properties of One—Dimensional Extended Hubbard Model
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作者 WANGZhi-Guo ZHANGYu-Mei 《Communications in Theoretical Physics》 SCIE CAS CSCD 2002年第2期237-242,共6页
In the framework of nonperturbative quantum field theory, the critical phenomena of one-dimensionalextended Hubbard model (EHM) at half-filling are discussed from weak to intermediate interactions. After the EHMbeing ... In the framework of nonperturbative quantum field theory, the critical phenomena of one-dimensionalextended Hubbard model (EHM) at half-filling are discussed from weak to intermediate interactions. After the EHMbeing mapped into two decoupled sine-Gordon models, the ground state phase diagram of the system is derived in anexplicit way. It is confirmed that the coexisting phases appear in different interaction regimes which cannot be foundby conventional theoretical methods. The diagram shows that there are seven different phase regions in the groundstate, which seems not to be the same as previous discussions, especially the boundary between the phase separationand condensed phase regions. The phase transition properties of the model between various phase regions are studied indetail. 展开更多
关键词 one-dimensional extended Hubbard model BOSONIZATION phase diagram coexisting phase
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Correlation of Electrical Noise with Non-radiative Current for High Power QWLs
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作者 HUGui-jun SHIJia-wei 《Semiconductor Photonics and Technology》 CAS 2001年第4期197-201,共5页
The characteristics of low frequency electrical noise, voltage current ( V I ) and electrical derivation for 980 nm InGaAsP/InGaAs/GaAs high power double quantum well lasers(DQWLs) are measured under different conditi... The characteristics of low frequency electrical noise, voltage current ( V I ) and electrical derivation for 980 nm InGaAsP/InGaAs/GaAs high power double quantum well lasers(DQWLs) are measured under different conditions. The correlation of the low frequency electrical noise with surface non radiative current of devices is discussed. The results indicate the low frequency electrical noise of 980 nm DQWLs with high power is mainly 1/ f noise and has good relation with the device surface current at low injection. 展开更多
关键词 Semiconductor lasers High power Electrical noise Non radiative current
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Ab Initio Nonadiabatic Dynamics of Semiconductor Materials via Surface Hopping Method
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作者 Yuli Lei Haibo Ma Luis Vasquez 《Chinese Journal of Chemical Physics》 SCIE EI CAS CSCD 2022年第1期16-37,I0062,共23页
Photoinduced carrier dynamic processes are without doubt the main driving force responsible for the efficient performance of semiconductor nanomaterials in applications like photoconversion and photonics.Nevertheless,... Photoinduced carrier dynamic processes are without doubt the main driving force responsible for the efficient performance of semiconductor nanomaterials in applications like photoconversion and photonics.Nevertheless,establishing theoretical insights into these processes is computationally challenging owing to the multiple factors involved in the processes,namely reaction rate,material surface area,material composition etc.Modelling of photoinduced carrier dynamic processes can be performed via nonadiabatic molecular dynamics(NA-MD)methods,which are methods specifically designed to solve the time-dependent Schrodinger equation with the inclusion of nonadiabatic couplings.Among NA-MD methods,surface hopping methods have been proven to be a mighty tool to mimic the competitive nonadiabatic processes in semiconductor nanomaterials,a worth noticing feature is its exceptional balance between accuracy and computational cost.Consequently,surface hopping is the method of choice for modelling ultrafast dynamics and more complex phenomena like charge separation in Janus transition metal dichalcogenides-based van der Waals heterojunction materials.Covering latest stateof-the-art numerical simulations along with experimental results in the field,this review aims to provide a basic understanding of the tight relation between semiconductor nanomaterials and the proper simulation of their properties via surface hopping methods.Special stress is put on emerging state-ot-the-art techniques.By highlighting the challenge imposed by new materials,we depict emerging creative approaches,including high-level electronic structure methods and NA-MD methods to model nonadiabatic systems with high complexity. 展开更多
关键词 Surface hopping Nonadiabatic dynamics Semiconductor nanomaterials Condense matter systems Classical path approximation
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Experimental Study on Near-IR Nonlinear Optical Waveguide Sensor for Refractive Index of Liquids
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作者 ZHANG Jin-rong WANG Dong +1 位作者 CAO Chang-xiu ZHUANG Ling 《Semiconductor Photonics and Technology》 CAS 2007年第2期117-121,共5页
To determine the refractive index of liquids in near infrared(lR), a method is presented by measuring the output angle of the visible Cerenkov-radiation-mode when liquids are placed as the cover on a planar lithium ... To determine the refractive index of liquids in near infrared(lR), a method is presented by measuring the output angle of the visible Cerenkov-radiation-mode when liquids are placed as the cover on a planar lithium niobate waveguide. The system configuration and the principle of the method are analyzed and some experimental results are given out. Both the experimental result and simulation show that this method is simple, rapid and of sufficient precision. 展开更多
关键词 optical waveguide sensor refractive index near infrared
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Optically Powered Temperature Measuring Instrument for Big Rotor
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作者 ZHENG Dezhong(Yanshan University, Qinhuandao 066004, CHN) 《Semiconductor Photonics and Technology》 CAS 1997年第1期35-39,共5页
Abstract: A micro - power consumption non - contact temperature measuring instrument for big rotor is introduced. As it solves very well the signal coupling under high speed rotation and power supply problem for probe... Abstract: A micro - power consumption non - contact temperature measuring instrument for big rotor is introduced. As it solves very well the signal coupling under high speed rotation and power supply problem for probe, the instrument can realize persistent on - line temperature measurement for big rotor drived by the ordinary light transmitted by optical fiber under the room light. 展开更多
关键词 Non - contact Measurement Optical Fiber ROTOR SemiconductorThermistor
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