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Effect of Film Thickness on Properties of a-Si∶H Films
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作者 QIANXiang-zhong CHENGJian-bo 《Semiconductor Photonics and Technology》 CAS 2003年第1期37-40,共4页
The a-Si∶H films with different thickness smaller than 1 μm were deposited by plasma enhanced chemical vapor deposition (PECVD) under the optimum deposition conditions. The effect of different thickness on film prop... The a-Si∶H films with different thickness smaller than 1 μm were deposited by plasma enhanced chemical vapor deposition (PECVD) under the optimum deposition conditions. The effect of different thickness on film properties is analyzed.The results show that,with the increase of the film thickness,the dark conductivity, photoconductivity and threshold voltage increase, the optical gap and peak ratio of TA to TO in the Raman spectra decrease, the refractive index keeps almost constant, and the optical absorption coefficient and current ratio of on/off state first maximize and then reduce. 展开更多
关键词 光学特性 电子学特性 薄膜厚度 非晶态硅氢薄膜
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