The electrostatic discharge(ESD)protection circuit widely exists in the input and output ports of CMOS digital circuits,and fast rising time electromagnetic pulse(FREMP)coupled into the device not only interacts with ...The electrostatic discharge(ESD)protection circuit widely exists in the input and output ports of CMOS digital circuits,and fast rising time electromagnetic pulse(FREMP)coupled into the device not only interacts with the CMOS circuit,but also acts on the protection circuit.This paper establishes a model of on-chip CMOS electrostatic discharge protection circuit and selects square pulse as the FREMP signals.Based on multiple physical parameter models,it depicts the distribution of the lattice temperature,current density,and electric field intensity inside the device.At the same time,this paper explores the changes of the internal devices in the circuit under the injection of fast rising time electromagnetic pulse and describes the relationship between the damage amplitude threshold and the pulse width.The results show that the ESD protection circuit has potential damage risk,and the injection of FREMP leads to irreversible heat loss inside the circuit.In addition,pulse signals with different attributes will change the damage threshold of the circuit.These results provide an important reference for further evaluation of the influence of electromagnetic environment on the chip,which is helpful to carry out the reliability enhancement research of ESD protection circuit.展开更多
To obtain a better placement result, a partitioning-based placement algorithm with wirelength prediction called HJ-Pl is presented. A new method is proposed to estimate proximity of interconnects in a netlist, which i...To obtain a better placement result, a partitioning-based placement algorithm with wirelength prediction called HJ-Pl is presented. A new method is proposed to estimate proximity of interconnects in a netlist, which is capable of predicting not only short interconnects but long interconnects accurately. The predicted wirelength is embedded into the partitioning tool of bisection-based global placement, which can guide our placement towards a solution with shorter interconnects. In addition, the timing objective can be handled within the algorithm by minimizing the critical path delay. Experimental results show that, compared to Capol0. 5, mPL6, and NTUplace, HJ-P1 outperforms these placers in terms of wirelength and run time. The improvements in terms of average wirelength over Capo10. 5, mPL6 and NPUplace are 13%, 3%, and 9% with only 19%, 91%, and 99% of their runtime, respectively. By integrating the predicted wirelength-driven clustering into Capo10. 5, the placer is able to reduce average wirelength by 3%. The timing-driven HJ-P1 can reduce the critical path delay by 23%.展开更多
基金National Natural Science Foundation of China(61974116)。
文摘The electrostatic discharge(ESD)protection circuit widely exists in the input and output ports of CMOS digital circuits,and fast rising time electromagnetic pulse(FREMP)coupled into the device not only interacts with the CMOS circuit,but also acts on the protection circuit.This paper establishes a model of on-chip CMOS electrostatic discharge protection circuit and selects square pulse as the FREMP signals.Based on multiple physical parameter models,it depicts the distribution of the lattice temperature,current density,and electric field intensity inside the device.At the same time,this paper explores the changes of the internal devices in the circuit under the injection of fast rising time electromagnetic pulse and describes the relationship between the damage amplitude threshold and the pulse width.The results show that the ESD protection circuit has potential damage risk,and the injection of FREMP leads to irreversible heat loss inside the circuit.In addition,pulse signals with different attributes will change the damage threshold of the circuit.These results provide an important reference for further evaluation of the influence of electromagnetic environment on the chip,which is helpful to carry out the reliability enhancement research of ESD protection circuit.
基金The National Key Project of Scientific and Technical Supporting Programs (No.2006BAK07B04)
文摘To obtain a better placement result, a partitioning-based placement algorithm with wirelength prediction called HJ-Pl is presented. A new method is proposed to estimate proximity of interconnects in a netlist, which is capable of predicting not only short interconnects but long interconnects accurately. The predicted wirelength is embedded into the partitioning tool of bisection-based global placement, which can guide our placement towards a solution with shorter interconnects. In addition, the timing objective can be handled within the algorithm by minimizing the critical path delay. Experimental results show that, compared to Capol0. 5, mPL6, and NTUplace, HJ-P1 outperforms these placers in terms of wirelength and run time. The improvements in terms of average wirelength over Capo10. 5, mPL6 and NPUplace are 13%, 3%, and 9% with only 19%, 91%, and 99% of their runtime, respectively. By integrating the predicted wirelength-driven clustering into Capo10. 5, the placer is able to reduce average wirelength by 3%. The timing-driven HJ-P1 can reduce the critical path delay by 23%.
