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纯环氧VPI浸渍树脂的研制及性能测试 被引量:2
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作者 郭胜智 吴梦艳 +3 位作者 徐雄鹰 刘艳婷 施德俊 夏宇 《电机与控制应用》 北大核心 2014年第11期45-48,共4页
介绍了一种无酸酐无易挥发性稀释剂的纯环氧VPI浸渍树脂。通过优选环氧活性稀释剂及自制固化剂,制备一种黏度适中、不易吸潮、储存稳定,且具有优异的电气性能和机械性能的纯环氧VPI浸渍树脂。该树脂性能与环氧酸酐树脂性能相当,是环氧酸... 介绍了一种无酸酐无易挥发性稀释剂的纯环氧VPI浸渍树脂。通过优选环氧活性稀释剂及自制固化剂,制备一种黏度适中、不易吸潮、储存稳定,且具有优异的电气性能和机械性能的纯环氧VPI浸渍树脂。该树脂性能与环氧酸酐树脂性能相当,是环氧酸酐VPI浸渍树脂理想的替代品。 展开更多
关键词 纯环氧VPI浸渍树脂 无酸酐 低介质损耗因数 高电气性能
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Modeling Relative Humidity Effects on Power Electronic Performance
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作者 R. Ciprian B. Lehman 《Journal of Energy and Power Engineering》 2011年第7期632-640,共9页
Variations in the behavior of power supplies caused electrical behavior dependence with environmental conditions. by environmental conditions require accurate characterization of the This paper introduces models to he... Variations in the behavior of power supplies caused electrical behavior dependence with environmental conditions. by environmental conditions require accurate characterization of the This paper introduces models to help predict relative humidity (Rtt) and other environmental factors influence on sensitive circuitry in power electronic systems. The resistivity and permittivity of an insulator have been modeled using different water contents i.e. RH, such model also included the mechanical properties of the design. An application example of a high power density, high voltage DC-DC converter is used to verify the results. 展开更多
关键词 Power electronics insulator resistivity relative humidity insulator permittivity modeling.
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Investigation of the aeroacoustic behavior and aerodynamic noise of a high-speed train pantograph 被引量:30
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作者 ZHANG YaDong ZHANG JiYe +1 位作者 LI Tian ZHANG Liang 《Science China(Technological Sciences)》 SCIE EI CAS CSCD 2017年第4期561-575,共15页
As one of the main aerodynamic noise sources of high-speed trains, the pantograph is a complex structure containing many components, and the flow around it is extremely dynamic, with high-level turbulence. This study ... As one of the main aerodynamic noise sources of high-speed trains, the pantograph is a complex structure containing many components, and the flow around it is extremely dynamic, with high-level turbulence. This study analyzed the near-field unsteady flow around a pantograph using a large-eddy simulation(LES) with high-order finite difference schemes. The far-field aerodynamic noise from a pantograph was predicted using a computational fluid dynamics(CFD)/Ffowcs Williams-Hawkings(FW-H) acoustic analogy. The surface oscillating pressure data were also used in a boundary element method(BEM) acoustic analysis to predict the aerodynamic noise sources of a pantograph and the far-field sound radiation. The results indicated that the main aerodynamic noise sources of the pantograph were the panhead, base frame and knuckle. The panhead had the largest contribution to the far-field aerodynamic noise of the pantograph. The vortex shedding from the panhead generated tonal noise with the dominant peak corresponding to the vortex shedding frequency and the oscillating lift force exerted back on the fluid around the panhead.Additionally, the peak at the second harmonic frequency was associated with the oscillating drag force. The contribution of the knuckle-downstream direction to the pantograph aerodynamic noise was less than that of the knuckle-upstream direction of the pantograph, and the average sound pressure level(SPL) was 3.4 dBA. The directivity of the noise radiated exhibited a typical dipole pattern in which the noise directivity was obvious at the horizontal plane of θ=0°,the longitudinal plane of θ=120°,and the vertical plane of θ=90°. 展开更多
关键词 high-speed train PANTOGRAPH aerodynamic noise large eddy simulation FW-H acoustic analogy boundary element method noise contribution
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The effects of proton irradiation on the electrical properties of NbAlO/AlGaN/GaN MIS-HEMT
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作者 BI ZhiWei FENG Qian +5 位作者 ZHANG JinCheng LU Ling MAO Wei GU WenPing MA XiaoHua HAO Yue 《Science China(Physics,Mechanics & Astronomy)》 SCIE EI CAS 2012年第1期40-43,共4页
AlGaN/GaN metal-insulator-semiconductor high electron-mobility transistors (MIS-HEMTs) with atomic layer deposited (ALD) NbA10 gate dielectric were investigated using 3 MeV proton irradiation at a fluence of 1015 ... AlGaN/GaN metal-insulator-semiconductor high electron-mobility transistors (MIS-HEMTs) with atomic layer deposited (ALD) NbA10 gate dielectric were investigated using 3 MeV proton irradiation at a fluence of 1015 p/crn2. It was found that the proton irradiation damage caused degradation in DC performance and a flatband voltage shift in the capacitance-voltage curve. Gate-drain conductance measurements indicated that new traps were introduced in GaN from the irradiation, and the trap densities increased from 1.18×10^12 cm-2.eV-1 to 1.82×10^12 cm-2.eV-1 in MIS-HEMTs after irradiation. However, these increases in trap densities caused by irradiation in MIS-HEMT are less than those in HEMT, which can be attributed to the protection of the A1GaN surface by the NbA10 dielectric layer. 展开更多
关键词 AIGAN/GAN MIS-HEMT proton irradiation TRAP
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