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当代高纯半导体材料分析的进展(一)
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作者 李昌世 《四川有色金属》 1994年第2期38-49,共12页
本文评述了1983~1993年半导体硅材料、高纯元素、化合物半导体等高纯半导体材料的分析进展。
关键词 半导体 硅材料 高纯元素 化合物半导体 分析
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Determination of trace elements in high purity nickel by high resolution inductively coupled plasma mass spectrometry 被引量:11
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作者 聂西度 梁逸曾 +1 位作者 唐有根 谢华林 《Journal of Central South University》 SCIE EI CAS 2012年第9期2416-2420,共5页
The contents ofMg, Al, Si, Ti, Cr, Mn, Fe, Co, Cu, Ga, As, Se, Cd, Sb, Pb and Bi in high purity nickel were determined by high resolution inductively coupled plasma mass spectrometry (HR-ICP-MS). The sample was diss... The contents ofMg, Al, Si, Ti, Cr, Mn, Fe, Co, Cu, Ga, As, Se, Cd, Sb, Pb and Bi in high purity nickel were determined by high resolution inductively coupled plasma mass spectrometry (HR-ICP-MS). The sample was dissolved in HNO3 and HCI by microwave digestion. Most of the spectral interferences could be avoided by measuring in the high resolution mode. The matrix effects because of the presence of excess HC1 and nickel were evaluated. Correction for matrix effects was made using Sc, Rh and T1 as internal standards. The optimum conditions for the determination were tested and discussed. The detection limits range from 0.012 to 1.76 ~tg/g depending on the type of elements. The applicability of the proposed method is also validated by the analysis of high purity nickel reference material (NIST SRM 671). The relative standard deviation (RSD) is less than 3.3%. Results for determination of trace elements in high purity nickel were presented. 展开更多
关键词 high resolution inductively coupled plasma mass spectrometry high purity nickel trace element matrix effect internal standard
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Average L-Shell Fluorescence Yields of Some Rare Earth Elements
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作者 Sripathi Punchithaya K K.M. Balakrishna 《Journal of Physical Science and Application》 2013年第2期103-107,共5页
Average L-shell fluorescence yields of some rare earth elements were determined using HPGe detector employing reflection geometry set up. Target atoms were excited using 59.5 keV gamma rays emerging from Am-241 source... Average L-shell fluorescence yields of some rare earth elements were determined using HPGe detector employing reflection geometry set up. Target atoms were excited using 59.5 keV gamma rays emerging from Am-241 source of strength 300 mCi. Background radiation and multiple scattering effects were minimized by properly shielding the detector. The elemental foils of uniform thickness and 99.9% purity were used in the present investigation. The fluorescent spectra were recorded in a 16 K multichannel - analyzer. The data were carefully analyzed and average L-shell fluorescence yields were calculated. The resulting yield values are compared with the available experimental and theoretical values. 展开更多
关键词 Fluorescence yield reflection geometry multiple scattering.
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