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金刚石声表面波器件的研究与进展 被引量:5
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作者 陈菁菁 李冬梅 潘峰 《真空科学与技术》 CSCD 北大核心 2003年第6期417-424,428,共9页
高频无线通讯系统的迅速发展推动了对高频声表面波 (SAW)器件需求的不断增大。金刚石具有最高的声速和许多优于其他材料的特性 ,因此金刚石声表面波器件受到了越来越多的关注。本文介绍了金刚石声表面波器件的构成、制备方法 ,讨论了金... 高频无线通讯系统的迅速发展推动了对高频声表面波 (SAW)器件需求的不断增大。金刚石具有最高的声速和许多优于其他材料的特性 ,因此金刚石声表面波器件受到了越来越多的关注。本文介绍了金刚石声表面波器件的构成、制备方法 ,讨论了金刚石声表面波器件近年来国际上的研究进展 ,包括理论研究与实验进展的概况 。 展开更多
关键词 金刚石 高频声表面波器件 压电薄膜 无线通讯系统 SAW
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Preparation of free-standing diamond films for high frequency SAW devices
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作者 刘健敏 夏义本 +5 位作者 王林军 苏青峰 赵平 徐闰 彭鸿雁 史伟民 《中国有色金属学会会刊:英文版》 CSCD 2006年第B01期298-301,共4页
Free-standing diamond films were prepared by hot filament chemical vapor deposition (HFCVD) method under different conditions. Inter-digital transducers (IDTs) were formed on the nucleation sides of free-standing diam... Free-standing diamond films were prepared by hot filament chemical vapor deposition (HFCVD) method under different conditions. Inter-digital transducers (IDTs) were formed on the nucleation sides of free-standing diamond films by photolithography technique. Then piezoelectric ZnO films were deposited by radio-frequency(RF) reactive magnetron sputtering to obtain the ZnO/diamond film structures. Surface morphologies of the nucleation sides and the IDTs were characterized by means of scanning electron microscopy (SEM), atomic force microscope (AFM) and optical microscopy. The results indicate that the surfaces of nucleation sides are very smooth and the IDTs are of high quality without discontinuity and short circuit phenomenon. Raman spectra show the sharp diamond feature peak at about 1 334 cm?1 and the small amount of non-diamond carbon in the nucleation side. X-ray diffraction (XRD) patterns of the structure of ZnO/diamond films show a strong diffraction peak of ZnO (002), which indicates that as-sputtered ZnO films are highly c-axis oriented. 展开更多
关键词 自立金刚石膜 化学汽相淀积 HFCVD 高频声表面波器件 ZNO
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Test method of frequency response based on diamond surface acoustic wave devices
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作者 陈希明 杨保和 +1 位作者 吴小国 吴佚卓 《Optoelectronics Letters》 EI 2011年第4期291-293,共3页
In order to reduce the noises affixed to the signals when testing high frequency devices,a single-port test mode(S11) is used to test frequency response of high frequency(GHz) and dual-port surface acoustic wave devic... In order to reduce the noises affixed to the signals when testing high frequency devices,a single-port test mode(S11) is used to test frequency response of high frequency(GHz) and dual-port surface acoustic wave devices(SAWDs) in this paper.The feasibility of the test is proved by simulating the Fabry-perot model.The frequency response of the high-frequency dual-port resonant-type diamond SAWD is measured by S11 and the dual-port test mode(S21),respectively.The results show that the quality factor of the device is 51.29 and the 3 dB bandwidth is 27.8 MHz by S11-mode measurement,which is better than the S21 mode,and is consistent with the frequency response curve by simulation. 展开更多
关键词 Acoustic surface wave devices Acoustic waves ACOUSTICS Acoustoelectric effects Signal processing Surface testing TESTING
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