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High-precision X-ray characterization for basic materials in modern high-end integrated circuit
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作者 Weiran Zhao Qiuqi Mo +3 位作者 Li Zheng Zhongliang Li Xiaowei Zhang Yuehui Yu 《Journal of Semiconductors》 EI CAS CSCD 2024年第7期12-24,共13页
Semiconductor materials exemplify humanity's unwavering pursuit of enhanced performance,efficiency,and functionality in electronic devices.From its early iterations to the advanced variants of today,this field has... Semiconductor materials exemplify humanity's unwavering pursuit of enhanced performance,efficiency,and functionality in electronic devices.From its early iterations to the advanced variants of today,this field has undergone an extraordinary evolution.As the reliability requirements of integrated circuits continue to increase,the industry is placing greater emphasis on the crystal qualities.Consequently,conducting a range of characterization tests on the crystals has become necessary.This paper will examine the correlation between crystal quality,device performance,and production yield,emphasizing the significance of crystal characterization tests and the important role of high-precision synchrotron radiation X-ray topography characterization in semiconductor analysis.Finally,we will cover the specific applications of synchrotron radiation characterization in the development of semiconductor materials. 展开更多
关键词 X-ray topography synchrotron radiation semiconductor materials crystal defects
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p‑Type Two‑Dimensional Semiconductors:From Materials Preparation to Electronic Applications
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作者 Lei Tang Jingyun Zou 《Nano-Micro Letters》 SCIE EI CAS CSCD 2023年第12期242-270,共29页
Two-dimensional(2D)materials are regarded as promising candidates in many applications,including electronics and optoelectronics,because of their superior properties,including atomic-level thickness,tunable bandgaps,l... Two-dimensional(2D)materials are regarded as promising candidates in many applications,including electronics and optoelectronics,because of their superior properties,including atomic-level thickness,tunable bandgaps,large specific surface area,and high carrier mobility.In order to bring 2D materials from the laboratory to industrialized applications,materials preparation is the first prerequisite.Compared to the n-type analogs,the family of p-type 2D semiconductors is relatively small,which limits the broad integration of 2D semiconductors in practical applications such as complementary logic circuits.So far,many efforts have been made in the preparation of p-type 2D semiconductors.In this review,we overview recent progresses achieved in the preparation of p-type 2D semiconductors and highlight some promising methods to realize their controllable preparation by following both the top-down and bottom-up strategies.Then,we summarize some significant application of p-type 2D semiconductors in electronic and optoelectronic devices and their superiorities.In end,we conclude the challenges existed in this field and propose the potential opportunities in aspects from the discovery of novel p-type 2D semiconductors,their controlled mass preparation,compatible engineering with silicon production line,high-κdielectric materials,to integration and applications of p-type 2D semiconductors and their heterostructures in electronic and optoelectronic devices.Overall,we believe that this review will guide the design of preparation systems to fulfill the controllable growth of p-type 2D semiconductors with high quality and thus lay the foundations for their potential application in electronics and optoelectronics. 展开更多
关键词 Two-dimensional materials p-type semiconductor TOP-DOWN BOTTOM-UP ELECTRONICS OPTOELECTRONICS
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Thermodynamic analysis of growth of ternary Ⅲ-Ⅴ semiconductor materials by molecular-beam epitaxy
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作者 叶志成 舒永春 +5 位作者 曹雪 龚亮 皮彪 姚江宏 邢晓东 许京军 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2011年第1期146-151,共6页
Thermodynamic models for molecular-beam epitaxy(MBE) growth of ternary Ⅲ-Ⅴ semiconductor materials are proposed.These models are in agreement with our experimental materials InGaP/GaAs and InGaAs/InP,and reported ... Thermodynamic models for molecular-beam epitaxy(MBE) growth of ternary Ⅲ-Ⅴ semiconductor materials are proposed.These models are in agreement with our experimental materials InGaP/GaAs and InGaAs/InP,and reported GaAsP/GaAs and InAsP/InP in thermodynamic growth.The lattice strain energy △G and thermal decomposition sensitive to growth temperature are demonstrated in the models simultaneously.△G is the function of the alloy composition,which is affected by flux ratio and growth temperature directly.The calculation results reveal that flux ratio and growth temperature mainly influence the growth process.Thermodynamic model of quaternary InGaAsP/GaAs semiconductor material is discussed also. 展开更多
关键词 semiconductor materials Ⅲ-Ⅴ compounds GROWTH THERMODYNAMICS
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Advances in Rare Earth Application to Semiconductor Materials and Devices 被引量:1
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作者 屠海令 《Journal of Rare Earths》 SCIE EI CAS CSCD 2004年第5期571-575,共5页
The development of rare earths (RE) applications to semiconductor materials and devices is reviewed. The recent advances in RE doped silicon light emitting diodes (LED) and display materials are described. The various... The development of rare earths (RE) applications to semiconductor materials and devices is reviewed. The recent advances in RE doped silicon light emitting diodes (LED) and display materials are described. The various technologies of incorporating RE into semiconductor materials and devices are presented. The RE high dielectric materials, RE silicides and the phase transition of RE materials are also discussed. Finally, the paper describes the prospects of the RE application to semiconductor industry. 展开更多
关键词 semiconductor materials DEVICES APPLICATION rare earths
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In-situ monitoring of dynamic behavior of catalyst materials and reaction intermediates in semiconductor catalytic processes 被引量:1
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作者 Zhen Fang Yao Liu +5 位作者 Chengyi Song Peng Tao Wen Shang Tao Deng Xiaoqin Zeng Jianbo Wu 《Journal of Semiconductors》 EI CAS CSCD 2022年第4期46-59,共14页
Semiconductor photocatalysis, as a key part of solar energy utilization, has far-reaching implications for industrial, agricultural, and commercial development. Lack of understanding of the catalyst evolution and the ... Semiconductor photocatalysis, as a key part of solar energy utilization, has far-reaching implications for industrial, agricultural, and commercial development. Lack of understanding of the catalyst evolution and the reaction mechanism is a critical obstacle for designing efficient and stable photocatalysts. This review summarizes the recent progress of in-situ exploring the dynamic behavior of catalyst materials and reaction intermediates. Semiconductor photocatalytic processes and two major classes of in-situ techniques that include microscopic imaging and spectroscopic characterization are presented. Finally, problems and challenges in in-situ characterization are proposed, geared toward developing more advanced in-situ techniques and monitoring more accurate and realistic reaction processes, to guide designing advanced photocatalysts. 展开更多
关键词 IN-SITU semiconductor photocatalyst materials evolution reaction intermediate
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STUDY ON THE STRUCTURE AND PROPERTIES OF SEMICONDUCTOR CERAMIC COOLING MATERIALS
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作者 崔万秋 程浩 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 1993年第1期19-30,共12页
In this paper, thermoelectric polycrystal ceramic materials were prepared by a new ceramic technology. The p-type 72% Sb2Te3+ 25%Bi2Te3 + 3%Sb2Se3 doped with Te and 90%Bi2Te3 + 5%Sb2Te3 + 5%Sb2Se3 doped with SbI3 or A... In this paper, thermoelectric polycrystal ceramic materials were prepared by a new ceramic technology. The p-type 72% Sb2Te3+ 25%Bi2Te3 + 3%Sb2Se3 doped with Te and 90%Bi2Te3 + 5%Sb2Te3 + 5%Sb2Se3 doped with SbI3 or AgI samples were studied. The new ceramic cooling materials have an inhomo-geneous structure, higher mechanical strength and the thermoelectric properties. With the help of phase diagrams, Differantial Thermal Analysis, X-Ray diffractograms, the observation of high temperature microscope and the relation between technology conditions and thermoelectric properties were obtained in optimum technology conditions. Measurements of properties show that the sintering temperature and time have an effect on the thermoelectric properties of the samples. Scan electronic microscope shows that the polycrystal ceramic materical has an obvious layered structure. Electrical probe microscope analysis indicates that the mol contents of Bi, Te,Sb and Se which compose samples are re- spectively comsistent with original compositions. The distribution of these elements in the samples is well uniform. Doping materials has been studied including doping variety and doping concentration. The figure of merit of n-type doped SbI3 is 2.9 × 10-3 1/k. The figure of merit of p-type doped Te is 3. 1 ×10-3 1/ K. 展开更多
关键词 semiconductor ceramic cooling materials structure PROPERTY
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Preface to the Special Issue on Perovskite Semiconductor Optoelectronic Materials and Devices
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作者 Jingbi You Jiang Tang +1 位作者 Haibo Zeng Jianpu Wang 《Journal of Semiconductors》 EI CAS CSCD 2020年第5期3-3,共1页
Halide perovskite,a novel semiconductor material,was initially used in solar cells since 2009,and tremendous progresses have been witnessed in the last decade.The power conversion efficiency of the single perovskite s... Halide perovskite,a novel semiconductor material,was initially used in solar cells since 2009,and tremendous progresses have been witnessed in the last decade.The power conversion efficiency of the single perovskite solar cells has been incredibly increased up to 25.2%,and close to 30%efficiency was realized in perovskite/silicon tandem solar cells.Recently,the application of perovskite has been extended to the light-emitting diodes and photo-detectors. 展开更多
关键词 the Special ISSUE PEROVSKITE semiconductor OPTOELECTRONIC materials DEVICES
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Preparation of Single Crystals of Co_xZn_(1-x)S and Co_xZn_(1-x)Se—New Materials of Dilute Magnetic Semiconductors
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作者 Gu Xiamin Giriat W. Furdyna J.K.Shanhai Institute of Metallurgy,Academia Sinica 200050 China Department of Physics University of Notre Dame.Indiana 46556,U. S. A 《Rare Metals》 SCIE EI CAS CSCD 1990年第2期139-144,共6页
In this paper, we report the growth of single crystals of Co_x Zn_(1-x)S and Co_x Zn_(1-x)Se (0<x<0.3) by the method of chemical transport, using iodine as a transport agent. The light green color of single crys... In this paper, we report the growth of single crystals of Co_x Zn_(1-x)S and Co_x Zn_(1-x)Se (0<x<0.3) by the method of chemical transport, using iodine as a transport agent. The light green color of single crystal Co_xZn_(1-x)S as well as the light brown color of Co_xZn_(1-x)Se become deep with an increase in x. The compositions of the single crystals were nearly stoichiometric. The transfer rate decreases with an increase of the x value. The growth rate was related to the temperature difference. The large temperature difference speed up the growth rate, but the size of crystal obtained was small. In general, the optimal temperature difference was 15℃. From X-ray diffraction measurements, the structures of crystals Co_xZn_(1-x)S and Co_xZn_(1-x)Se (0<x<0.1) were identified to be zinc blende structure similar to that of ZnS and ZnSe. 展开更多
关键词 CO x)Se New materials of Dilute Magnetic semiconductors Preparation of Single Crystals of Co_xZn x)S and Co_xZn
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Developing Suitable Sensitive Compound Semiconductor Materials Doped by Transition Metals for Occupational Thermoluminescence Dosimetry
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作者 Salahuddin M. Kamal 《Advances in Materials Physics and Chemistry》 2016年第4期77-84,共8页
The essential objective of radiation dosimetry is to develop suitable sensitive materials for different measurements in radiation fields. Our exploration is to find potentially suitable high gamma radiation dosimeters... The essential objective of radiation dosimetry is to develop suitable sensitive materials for different measurements in radiation fields. Our exploration is to find potentially suitable high gamma radiation dosimeters in the range from 0.5E4 to 1.5E4 Gy. Gamma rays source (<sup>60</sup>Co, 136 Gy/min) has been used. Many compound semiconductor materials were prepared and investigated. Thermoluminescence (TL) glow curve was analyzed into its component by analytical segregation program using computerized glow curve deconvolution (CGCD). Three zero dose readings for non-irradiated powders of the materials have been taken as lower limit of detection. The results indicated that some of the tested materials have exhibited TL linearly with respect to dose. In addition, dose response of these materials was found to be useful for high radiation dosimetry. Glow curve structures exhibited several peaks corresponding to the various energies of the emptied traps. Variation in the standard deviation for reusability cycles has been ten readout. The fading at ambient temperature was studied up to 60 days which reached a relative stability (~1.5% for all), 10 days after irradiation. A typical glow curve of CoPa which irradiated with 1.5E4 Gy was analyzed. Characterizations of tested materials indicated that crystals of ZnLa:Li, ZnLa:Cd, and ZnLa:Cr have stable and increasing thermoluminescent responses with high gamma radiation dose range. Special glow peaks can be used as estimators for absorbed doses as well as re-estimation for time elapsed exposures. 展开更多
关键词 Doped semiconductor materials Thermoluminescence Glow Curve Analysis Occupational Dosimetry High Gamma-Ray Dose
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Electronic structure engineering in organic thermoelectric materials 被引量:2
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作者 Xiaojuan Dai Qing Meng +3 位作者 Fengjiao Zhang Ye Zou Chong-an Di Daoben Zhu 《Journal of Energy Chemistry》 SCIE EI CAS CSCD 2021年第11期204-219,I0005,共17页
Electronic structures, which play a key role in determining electrical and optical properties of π-conjugated organic materials, have attracted tremendous interest. Efficient thermoelectric (TE) conversion of organic... Electronic structures, which play a key role in determining electrical and optical properties of π-conjugated organic materials, have attracted tremendous interest. Efficient thermoelectric (TE) conversion of organic materials has rigorous requirements on electronic structures. Recently, the rational design and precise modulation of electronic structures have exhibited great potential in exploring state-of-the-art organic TE materials. This review focuses on the regulation of electronic structures of organic materials toward efficient TE conversion. First, we present the basic knowledge regarding electronic structures and the requirements for efficient TE conversion of organic materials, followed by a brief introduction of commonly used methods for electronic structure characterization. Next, we highlight the key strategies of electronic structure engineering for high-performance organic TE materials. Finally, an overview of the electronic structure engineering of organic TE materials, along with current challenges and future research directions, are provided. 展开更多
关键词 Organic thermoelectric materials Electronic structure Organic semiconductors
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Review on Recent Progress of Nanostructured Anode Materials for Li-Ion Batteries 被引量:1
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作者 Thevabakthi Siluvai Muthu Arul Jeevan Gashaw Tadele +1 位作者 Liyew Yizengaw Maria Francis George Johnson 《American Journal of Analytical Chemistry》 CAS 2022年第11期431-448,共18页
Lithium ion battery (LIB) is one of the promising power storage devices in today’s world. Lithium ion battery like other types of electrochemical cell has anodic and cathodic electrode in which lithium ion is interca... Lithium ion battery (LIB) is one of the promising power storage devices in today’s world. Lithium ion battery like other types of electrochemical cell has anodic and cathodic electrode in which lithium ion is intercalated and deinterclated during charging and discharging process respectively. The capacity of lithium ion battery is improved by the development of innovative kinds of electrode. Carbon, metal/semiconductor, metal oxides and metal phosphides/ nitrides/sulfides based nanomaterials improve the capability of LIBs due to their high surface area, low diffusion distance, high electrical and ionic conductivity. Nanostructured materials represent a rapidly growing area in the field of Li-ion batteries because of their substantial advantages in terms of mass transport. In this review anode nanomaterials classified based on type of transition metal/semiconductor such as carbon, silicon, titanium and tin based nanomaterials are discussed. Additionally, different electrochemical reactions, comparative influence of anode materials on LIBs and their applications are widely explained. 展开更多
关键词 Lithium Ion Battery semiconductor NANOSTRUCTURE Composite materials Ti Based materials
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Materials Studio辅助半导体物理学教学改革与实践 被引量:5
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作者 李泓霖 《高教学刊》 2018年第11期126-128,共3页
半导体物理学是物理电子类专业最重要的专业课之一,对其学习掌握的成效直接影响学生综合素质的培养。现如今,半导体学科的飞速发展对半导体物理学课程教学提出了新的高要求,其相应的教学模式必须与时俱进。针对许多高校目前存在的实验... 半导体物理学是物理电子类专业最重要的专业课之一,对其学习掌握的成效直接影响学生综合素质的培养。现如今,半导体学科的飞速发展对半导体物理学课程教学提出了新的高要求,其相应的教学模式必须与时俱进。针对许多高校目前存在的实验条件不足、相关设备配置不齐等情况,文章利用材料计算软件搭建虚拟半导体学习平台,以弥补传统多媒体教学手段在相关学习过程中的诸多不足。实践证明,这一方式能够十分有效地激发学生学习的热情,显著改善教学质量。文章着重介绍了半导体物理学教学的特点及现状,随后利用Materials Studio软件实际展示了新教学模式下提高教学质量的方法。 展开更多
关键词 半导体物理学 实验教学 materials STUDIO
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A Novel Semiconductor CIGS Photovoltaic Material and Thin-Film ED Technology 被引量:10
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作者 ZHENG Guang fu 1,YANG Hong xing 1,MAN Cheuk ho 1,WONG Wing lok 2, AN Da wei 1 and John BURNETT 1(1 Centre for Development of Solar Energy Technology,Department of Building Services Engineering, The Hong Kong Polytechnic University,Hong Kong,C 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第11期1357-1363,共7页
In order to achieve low cost high efficiency thin film solar cells,a novel Semiconductor Photovoltaic (PV) active material CuIn 1-x Ga x Se 2 (CIGS) and thin film Electro Deposition (ED) technology is explored.Firstly... In order to achieve low cost high efficiency thin film solar cells,a novel Semiconductor Photovoltaic (PV) active material CuIn 1-x Ga x Se 2 (CIGS) and thin film Electro Deposition (ED) technology is explored.Firstly,the PV materials and technologies is investigated,then the detailed experimental processes of CIGS/Mo/glass structure by using the novel ED technology and the results are reported.These results shows that high quality CIGS polycrystalline thin films can be obtained by the ED method,in which the polycrystalline CIGS is definitely identified by the (112),(204,220) characteristic peaks of the tetragonal structure,the continuous CIGS thin film layers with particle average size of about 2μm of length and around 1 6μm of thickness.The thickness and solar grade quality of CIGS thin films can be produced with good repeatability.Discussion and analysis on the ED technique,CIGS energy band and sodium (Na) impurity properties,were also performed.The alloy CIGS exhibits not only increasing band gap with increasing x ,but also a change in material properties that is relevant to the device operation.The beneficial impurity Na originating from the low cost soda lime glass substrate becomes one prerequisite for high quality CIGS films.These novel material and technology are very useful for low cost high efficiency thin film solar cells and other devices. 展开更多
关键词 半导体光电材料 薄膜 ED技术
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Raman Scattering Spectrum Analysis of GaP andIts Luminous Materialsr
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作者 ZHANGFujia QILi 《Semiconductor Photonics and Technology》 CAS 1997年第1期6-13,共8页
Abstract: The Raman scattering spectra of n- type GaP(doped S) single crystal and red and green luminous materials grown on the n - type GaP (doped S) single crys-tal substrate by liquid - phase epitaxy are analyed. T... Abstract: The Raman scattering spectra of n- type GaP(doped S) single crystal and red and green luminous materials grown on the n - type GaP (doped S) single crys-tal substrate by liquid - phase epitaxy are analyed. The results show that the spectra of GaP single crystal and its luminous materials include not only the first - order longitudi-nal optical photons and transverse optical phonons Raman scattering peaks, but also the peaks of the bound excitons, bound electrons and bound holes. 展开更多
关键词 LPE LUMINESCENCE Raman Spectrum semiconductor materials
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Drain-induced barrier lowering effect for short channel dual material gate 4H silicon carbide metal-semiconductor field-effect transistor
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作者 张现军 杨银堂 +3 位作者 段宝兴 柴常春 宋坤 陈斌 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第9期455-459,共5页
Sub-threshold characteristics of the dual material gate 4H-SiC MESFET (DMGFET) are investigated and the analytical models to describe the drain-induced barrier lowering (DIBL) effect are derived by solving one- an... Sub-threshold characteristics of the dual material gate 4H-SiC MESFET (DMGFET) are investigated and the analytical models to describe the drain-induced barrier lowering (DIBL) effect are derived by solving one- and two- dimensional Poisson's equations. Using these models, we calculate the bottom potential of the channel and the threshold voltage shift, which characterize the drain-induced barrier lowering (DIBL) effect. The calculated results reveal that the dual material gate (DMG) structure alleviates the deterioration of the threshold voltage and thus suppresses the DIBL effect due to the introduced step function, which originates from the work function difference of the two gate materials when compared with the conventional single material gate metal-semiconductor field-effect transistor (SMGFET). 展开更多
关键词 silicon carbide metal-semiconductor contact dual material gate
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Recent progress on ambipolar 2D semiconductors in emergent reconfigurable electronics and optoelectronics
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作者 赵月豪 孙浩然 +3 位作者 盛喆 张卫 周鹏 张增星 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第12期21-39,共19页
In these days,the increasing massive data are being produced and demanded to be processed with the rapid growth of information technology.It is difficult to rely solely on the shrinking of semiconductor devices and sc... In these days,the increasing massive data are being produced and demanded to be processed with the rapid growth of information technology.It is difficult to rely solely on the shrinking of semiconductor devices and scale-up of the integrated circuits(ICs)again in the foreseeable future.Exploring new materials,new-principle semiconductor devices and new computing architectures is becoming an urgent topic in this field.Ambipolar two-dimensional(2D)semiconductors,possessing excellent electrostatic field controllability and flexibly modulated major charge carriers,offer a possibility to construct reconfigurable devices and enable the ICs with new functions,showing great potential in computing capacity,energy efficiency,time delay and cost.This review focuses on the recent significant advancements in reconfigurable electronic and optoelectronic devices of ambipolar 2D semiconductors,and demonstrates their potential approach towards ICs,like reconfigurable circuits and neuromorphic chips.It is expected to help readers understand the device design principle of ambipolar 2D semiconductors,and push forward exploring more new-principle devices and new-architecture computing circuits,and even their product applications. 展开更多
关键词 two-dimensional material ambipolar semiconductor semiconductor device
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A family of flexible two-dimensional semiconductors:MgMX2Y6(M=Ti/Zr/Hf;X=Si/Ge;Y=S/Se/Te)
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作者 Junhui Yuan Kanhao Xue +1 位作者 Xiangshui Miao Lei Ye 《Journal of Semiconductors》 EI CAS CSCD 2023年第4期70-80,共11页
Inspired by the recently predicted 2D MX_(2)Y_(6)(M=metal element;X=Si/Ge/Sn;Y=S/Se/Te),we explore the possible applications of alkaline earth metal(using magnesium as example)in this family based on the idea of eleme... Inspired by the recently predicted 2D MX_(2)Y_(6)(M=metal element;X=Si/Ge/Sn;Y=S/Se/Te),we explore the possible applications of alkaline earth metal(using magnesium as example)in this family based on the idea of element replacement and valence electron balance.Herein,we report a new family of 2D quaternary compounds,namely MgMX_(2)Y_(6)(M=Ti/Zr/Hf;X=Si/Ge;Y=S/Se/Te)monolayers,with superior kinetic,thermodynamic and mechanical stability.In addition,our results indicate that MgMX_(2)Y_(6)monolayers are all indirect band gap semiconductors with band gap values ranging from 0.870 to 2.500 eV.Moreover,the band edges and optical properties of 2D MgMX_(2)Y_(6)are suitable for constructing multifunctional optoelectronic devices.Furthermore,for comparison,the mechanical,electronic and optical properties of In_(2)X_(2)Y_(6)monolayers have been discussed in detail.The success of introducing Mg into the 2D MX_(2)Y_(6)family indicates that more potential materials,such as Caand Sr-based 2D MX_(2)Y_(6)monolayers,may be discovered in the future.Therefore,this work not only broadens the existing family of 2D semiconductors,but it also provides beneficial results for the future. 展开更多
关键词 two-dimensional materials MgMX_(2)Y_(6)monolayer In2X2Y6 monolayer semiconductor first-principles calculations
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脑神经血管功能体系及其评估方法的展望 被引量:1
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作者 刘嘉 张攀登 +2 位作者 刘畅 王秋颖 高峰 《中风与神经疾病杂志》 CAS 2024年第1期24-30,F0003,共8页
人脑具有极为精妙的神经血管功能体系以满足脑细胞对能量代谢刻不容缓的需求。然而,现有的仪器设备仅能探测单一的神经血管功能,导致碎片化认知,许多与神经血管疾病相关的科学问题悬而未决。本文旨在回顾在面对重大疾病时脑血流自动调... 人脑具有极为精妙的神经血管功能体系以满足脑细胞对能量代谢刻不容缓的需求。然而,现有的仪器设备仅能探测单一的神经血管功能,导致碎片化认知,许多与神经血管疾病相关的科学问题悬而未决。本文旨在回顾在面对重大疾病时脑血流自动调节功能、脑血管反应性功能、神经血管耦联功能以及自主神经功能等神经血管功能所扮演的角色,并探讨多功能、多范式、高分辨率的人体多模态跨尺度神经血管功能测量系统的可行性,为深入研究脑血管病及神经退行性疾病等重大神经血管疾病的新理论和新机制提供科学工具。 展开更多
关键词 脑血管病 脑血流自动调节 姿态估计与配准 柔性光学半导体材料 神经退行性疾病
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基于半导体桥和含能材料的信息储存介质自毁模块研究
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作者 娄文忠 李志鹏 +1 位作者 冯恒振 李明愉 《北京理工大学学报》 EI CAS CSCD 北大核心 2024年第6期579-587,共9页
针对高安全等级信息储存介质硬件层面的防护,开展了基于半导体桥(SCB)和含能材料的低驱动能量自毁模块的研究.建立了SCB等离子体发火、能量传递、含能材料点火的数学模型并完成了理论计算,利用COMSOL搭建SCB多物理场仿真模型并校核其性... 针对高安全等级信息储存介质硬件层面的防护,开展了基于半导体桥(SCB)和含能材料的低驱动能量自毁模块的研究.建立了SCB等离子体发火、能量传递、含能材料点火的数学模型并完成了理论计算,利用COMSOL搭建SCB多物理场仿真模型并校核其性能,搭建了试验平台并进行SCB与含能材料发火性能测试的试验.仿真和试验结果表明:含能自毁模块具有优良的发火性能,能在5 V充电电压的激励下,起爆SCB桥区并使桥区温度能在18μs内达到2700 K,从而激发0.43 mg叠氮化铜在50μs内起爆产生爆轰波.含能自毁模块能够完成能量的传递并摧毁目标信息储存介质,有效避免信息储存介质关键信息被窃取,保证了信息储存介质的安全性. 展开更多
关键词 信息安全技术 自毁模块 半导体桥 含能材料 数值模拟
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基于稀疏成像的半导体薄膜材料界面缺陷检测
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作者 李聪 谭明 +1 位作者 刘小标 李辉 《计算机仿真》 2024年第1期197-200,226,共5页
复杂背景下检测半导体薄膜材料界面微小缺陷具有一定的难度,为了精准检测半导体薄膜材料界面缺陷,提出一种稀疏成像下半导体薄膜材料界面缺陷检测方法。扫描采集半导体薄膜材料界面二维图像,对含有噪声的半导体薄膜材料界面实施小波分解... 复杂背景下检测半导体薄膜材料界面微小缺陷具有一定的难度,为了精准检测半导体薄膜材料界面缺陷,提出一种稀疏成像下半导体薄膜材料界面缺陷检测方法。扫描采集半导体薄膜材料界面二维图像,对含有噪声的半导体薄膜材料界面实施小波分解,获取不同频带的子图像。低频图像保持不变,选择对应的模板对高频图像滤波处理,将滤波处理后的高频图像和低频图像两者合成,获取去噪后的图像。通过机器视觉定位薄膜材料界面的缺陷位置,提取缺陷区域特征,采用稀疏成像对特征参数修正,完成半导体薄膜材料界面缺陷检测。仿真结果表明,采用所提方法可以获取更加精准的检测结果,用时比较短,满足高效与高精度检测需求。 展开更多
关键词 稀疏成像 半导体 薄膜材料 界面缺陷检测 小波分解
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