采用热丝化学气相沉积法(hot filament chemical vapour deposition,HFCVD)在不同表面粗糙度的Si3N4基底表面制备金刚石薄膜,并对薄膜的特性进行检测与分析。利用场发射电子扫描显微镜、原子力显微镜检测植晶后的Si3N4基底表面以及制备...采用热丝化学气相沉积法(hot filament chemical vapour deposition,HFCVD)在不同表面粗糙度的Si3N4基底表面制备金刚石薄膜,并对薄膜的特性进行检测与分析。利用场发射电子扫描显微镜、原子力显微镜检测植晶后的Si3N4基底表面以及制备的金刚石薄膜表面形貌;利用多功能摩擦磨损实验机、探针式轮廓仪,在干摩擦条件下,测试金刚石薄膜的摩擦系数及磨损率。综合基底粗糙度对植晶质量的影响、金刚石薄膜表面形貌与摩擦磨损检测实验结果,确定了Si3N4基底表面粗糙度对金刚石薄膜耐磨性的影响。结果表明:基底表面粗糙度会影响植晶的均匀性及致密性,进而影响金刚石颗粒在基底表面的生长,同时基底的表面形貌也会复映在金刚石薄膜表面。表面粗糙度为0.15μm和0.20μm的基底所制备的金刚石薄膜拥有较好的耐磨性,可得到最低的磨损率1.75×10^(−7)mm^(3)/(m·N)和最低的摩擦系数0.078。展开更多
探索热丝化学气相沉积(hot filament chemical vapor deposition,HFCVD)合成高效优质的金刚石已成为研究热点。采用可提高金刚石颗粒单次沉积产量的新型多片式栅状衬底,应用FLUENT流体仿真软件,在原有单个出气口数量及进气总流量保持不...探索热丝化学气相沉积(hot filament chemical vapor deposition,HFCVD)合成高效优质的金刚石已成为研究热点。采用可提高金刚石颗粒单次沉积产量的新型多片式栅状衬底,应用FLUENT流体仿真软件,在原有单个出气口数量及进气总流量保持不变的情况下,优化传统模型,将单个进气口拆分成5个大小相等的进气口,对影响金刚石单晶颗粒均匀性的进气口数量和排布方式工艺参数进行仿真,对比分析HFCVD系统内气体的物理场。结果显示:4组优化模型均提高了衬底温度及流速的均匀性,有利于金刚石单晶颗粒的均匀生长,但对其沉积速率影响不显著;进一步分析优化模型的温度场,发现5个进气口及单个出气口分别位于反应腔体顶部和底部的中间位置时系统的温度差最低,最满足金刚石单晶颗粒在多片式硅衬底上均匀生长的条件。HFCVD金刚石单晶颗粒沉积试验验证了仿真结果的正确性。展开更多
The characteristics of hot filament chemical vapor deposition（HFCVD） diamond films are significantly influenced by the deposition parameters, such as the substrate temperature, total pressure and carbon concentratio...The characteristics of hot filament chemical vapor deposition（HFCVD） diamond films are significantly influenced by the deposition parameters, such as the substrate temperature, total pressure and carbon concentration. Orthogonal experiments were introduced to study the comprehensive effects of such three parameters on diamond films deposited on WC-Co substrates. Field emission scanning electron microscopy, atomic force microscopy and Raman spectrum were employed to analyze the morphology, growth rate and composition of as-deposited diamond films. The morphology varies from pyramidal to cluster features with temperature decreasing. It is found that the low total pressure is suitable for nano-crystalline diamond films growth. Moreover, the substrate temperature and total pressure have combined influence on the growth rate of the diamond films.展开更多
Deposition parameters that have great influences on hot filament chemical vapor deposition (HFCVD) diamond films growth on inner hole surfaces of WC?Co substrates mainly include the substrate temperature (t), carbon c...Deposition parameters that have great influences on hot filament chemical vapor deposition (HFCVD) diamond films growth on inner hole surfaces of WC?Co substrates mainly include the substrate temperature (t), carbon content (φ), total pressure (p) and total mass flow (F). Taguchi method was used for the experimental design in order to study the combined effects of the four parameters on the properties of as-deposited diamond films. A new figure-of-merit (FOM) was defined to assess their comprehensive performance. It is clarified thatt,φandp all have significant and complicated effects on the performance of the diamond film and the FOM, which also present some differences as compared with the previous studies on CVD diamond films growth on plane or external surfaces. Aiming to deposit HFCVD diamond films with the best comprehensive performance, the key deposition parameters were finally optimized as:t=830 °C,φ=4.5%,p=4000 Pa,F=800 mL/min.展开更多
文摘采用热丝化学气相沉积法(hot filament chemical vapour deposition,HFCVD)在不同表面粗糙度的Si3N4基底表面制备金刚石薄膜,并对薄膜的特性进行检测与分析。利用场发射电子扫描显微镜、原子力显微镜检测植晶后的Si3N4基底表面以及制备的金刚石薄膜表面形貌;利用多功能摩擦磨损实验机、探针式轮廓仪,在干摩擦条件下,测试金刚石薄膜的摩擦系数及磨损率。综合基底粗糙度对植晶质量的影响、金刚石薄膜表面形貌与摩擦磨损检测实验结果,确定了Si3N4基底表面粗糙度对金刚石薄膜耐磨性的影响。结果表明:基底表面粗糙度会影响植晶的均匀性及致密性,进而影响金刚石颗粒在基底表面的生长,同时基底的表面形貌也会复映在金刚石薄膜表面。表面粗糙度为0.15μm和0.20μm的基底所制备的金刚石薄膜拥有较好的耐磨性,可得到最低的磨损率1.75×10^(−7)mm^(3)/(m·N)和最低的摩擦系数0.078。
文摘探索热丝化学气相沉积(hot filament chemical vapor deposition,HFCVD)合成高效优质的金刚石已成为研究热点。采用可提高金刚石颗粒单次沉积产量的新型多片式栅状衬底,应用FLUENT流体仿真软件,在原有单个出气口数量及进气总流量保持不变的情况下,优化传统模型,将单个进气口拆分成5个大小相等的进气口,对影响金刚石单晶颗粒均匀性的进气口数量和排布方式工艺参数进行仿真,对比分析HFCVD系统内气体的物理场。结果显示:4组优化模型均提高了衬底温度及流速的均匀性,有利于金刚石单晶颗粒的均匀生长,但对其沉积速率影响不显著;进一步分析优化模型的温度场,发现5个进气口及单个出气口分别位于反应腔体顶部和底部的中间位置时系统的温度差最低,最满足金刚石单晶颗粒在多片式硅衬底上均匀生长的条件。HFCVD金刚石单晶颗粒沉积试验验证了仿真结果的正确性。
基金Project(2012ZX04003-031)supported by the National Science and Technology Major Project,China
文摘The characteristics of hot filament chemical vapor deposition（HFCVD） diamond films are significantly influenced by the deposition parameters, such as the substrate temperature, total pressure and carbon concentration. Orthogonal experiments were introduced to study the comprehensive effects of such three parameters on diamond films deposited on WC-Co substrates. Field emission scanning electron microscopy, atomic force microscopy and Raman spectrum were employed to analyze the morphology, growth rate and composition of as-deposited diamond films. The morphology varies from pyramidal to cluster features with temperature decreasing. It is found that the low total pressure is suitable for nano-crystalline diamond films growth. Moreover, the substrate temperature and total pressure have combined influence on the growth rate of the diamond films.
基金Projects(51275302,51005154)supported by the National Natural Science Foundation of China
文摘Deposition parameters that have great influences on hot filament chemical vapor deposition (HFCVD) diamond films growth on inner hole surfaces of WC?Co substrates mainly include the substrate temperature (t), carbon content (φ), total pressure (p) and total mass flow (F). Taguchi method was used for the experimental design in order to study the combined effects of the four parameters on the properties of as-deposited diamond films. A new figure-of-merit (FOM) was defined to assess their comprehensive performance. It is clarified thatt,φandp all have significant and complicated effects on the performance of the diamond film and the FOM, which also present some differences as compared with the previous studies on CVD diamond films growth on plane or external surfaces. Aiming to deposit HFCVD diamond films with the best comprehensive performance, the key deposition parameters were finally optimized as:t=830 °C,φ=4.5%,p=4000 Pa,F=800 mL/min.
