Proceeded from trimmed Hill estimators and distributed inference, a new distributed version of trimmed Hill estimator for heavy tail index is proposed. Considering the case where the number of observations involved in...Proceeded from trimmed Hill estimators and distributed inference, a new distributed version of trimmed Hill estimator for heavy tail index is proposed. Considering the case where the number of observations involved in each machine can be either the same or different and either fixed or varying to the total sample size, its consistency and asymptotic normality are discussed. Simulation studies are particularized to show the new estimator performs almost in line with the trimmed Hill estimator.展开更多
电流镜输出误差主要由3个不同失配源造成:漏源电压(V_(DS)),阈值电压(V_(th)),跨导系数(β)。其中,第一项V_(DS)失配通常是由有限输出阻抗引起的确定性误差,该误差可以通过使用级联结构以及增益提升技术避免,后两项V_(th)和β失配是由...电流镜输出误差主要由3个不同失配源造成:漏源电压(V_(DS)),阈值电压(V_(th)),跨导系数(β)。其中,第一项V_(DS)失配通常是由有限输出阻抗引起的确定性误差,该误差可以通过使用级联结构以及增益提升技术避免,后两项V_(th)和β失配是由工艺引起的随机性误差。为解决电流镜因工艺失配现象导致的电压电流(Voltage to Current)转换电路精度、线性度较差的问题,提出了一种动态元件匹配(Dynamic Element Match,DEM)以及修调技术(TRIM)相结合的电流镜校准方法,该方法使用TRIM技术将待校准输出电流镜支路和基准电流镜支路之间的误差电流,通过电容与MOS管转换成校准电流后反馈流入待校准输出电流镜支路完成校准,并通过DEM技术切换多条待校准输出电流镜支路完成校准的同时使输出误差平均化。本文采用SMIC 0.18μm BCD工艺对所提出的V-I转换电路进行了电路设计,仿真结果表明,V-I转换电路的输出电流的失配误差从0.12%下降到了0.03%,有效位数ENOB达到了11.2 bit,总谐波失真THD为−72.6 dB。展开更多
文摘Proceeded from trimmed Hill estimators and distributed inference, a new distributed version of trimmed Hill estimator for heavy tail index is proposed. Considering the case where the number of observations involved in each machine can be either the same or different and either fixed or varying to the total sample size, its consistency and asymptotic normality are discussed. Simulation studies are particularized to show the new estimator performs almost in line with the trimmed Hill estimator.
文摘电流镜输出误差主要由3个不同失配源造成:漏源电压(V_(DS)),阈值电压(V_(th)),跨导系数(β)。其中,第一项V_(DS)失配通常是由有限输出阻抗引起的确定性误差,该误差可以通过使用级联结构以及增益提升技术避免,后两项V_(th)和β失配是由工艺引起的随机性误差。为解决电流镜因工艺失配现象导致的电压电流(Voltage to Current)转换电路精度、线性度较差的问题,提出了一种动态元件匹配(Dynamic Element Match,DEM)以及修调技术(TRIM)相结合的电流镜校准方法,该方法使用TRIM技术将待校准输出电流镜支路和基准电流镜支路之间的误差电流,通过电容与MOS管转换成校准电流后反馈流入待校准输出电流镜支路完成校准,并通过DEM技术切换多条待校准输出电流镜支路完成校准的同时使输出误差平均化。本文采用SMIC 0.18μm BCD工艺对所提出的V-I转换电路进行了电路设计,仿真结果表明,V-I转换电路的输出电流的失配误差从0.12%下降到了0.03%,有效位数ENOB达到了11.2 bit,总谐波失真THD为−72.6 dB。