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AFM模式下扫描图像质量的影响因素 被引量:3
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作者 金永中 陈建 孙亚丽 《四川理工学院学报(自然科学版)》 CAS 2005年第4期72-74,共3页
介绍了扫描探针显微镜(SPM)的AFM模式的工作原理,观察了聚四氟乙烯胶粒的微观形貌, 并指出影响AFM图像质量的主要因素。
关键词 扫描探针显微镜 afm模式 纳米形貌 影响因素
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Growth Mode of PTCDA on p-Si Substrates
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作者 宋珍 欧谷平 刘凤敏 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第7期1009-1011,共3页
AFM scanning images of the surface of a PTCDA/p-Si specimen used in an organic/inorganic photodetector show that PTCDA grows in island shapes that are poorly distributed, with each island shaped like a round hillock. ... AFM scanning images of the surface of a PTCDA/p-Si specimen used in an organic/inorganic photodetector show that PTCDA grows in island shapes that are poorly distributed, with each island shaped like a round hillock. The images also show that there exist enormous defects in the PTCDA layer due to pedestal sites and other defects that appear when Si atoms shift transversely, and that the bonding condition is satisfied by the action of atom suspension bonding at the surface of the Si substrate. We infer the growth mode of PTCDA deposited onto p-Si substrates as follows. First,PTCDA molecules assemble at the defects to form three-dimensional island-like PTCDA crystal nuclei, and then by the action of delocalized big π bonding, two adjacent layers of PTCDA molecules overlap to some extent and finally island-like structures form. The PTCDA molecules and Si substrate combine by a process of the combination of benzene rings with Si atoms at the defects and of acid anhydride radicals with Si atoms at the perfect fraction of the surface. In the course of combination, although the structure of the benzene rings does not change, the chemical reaction of acid anhydt'ide radicals and Si occurs to break off the C=O bond in the acid anhydride, and then C-Si-O and silicon oxide might be produced. 展开更多
关键词 PTCDA growth mode afm
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