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Hard IP Core Nondestructive Testing Technology
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作者 Kun Yu Hua Wang 《Journal of Microelectronic Manufacturing》 2019年第2期1-6,共6页
Based on the analysis of the existing hard IP core testing technology, the hard IP core nondestructive testing technology was studied, according to the verification requirements of a large number of hard IP core preci... Based on the analysis of the existing hard IP core testing technology, the hard IP core nondestructive testing technology was studied, according to the verification requirements of a large number of hard IP core precise and fast testing. Combined with the external automatic test equipment (ATE) and the on-chip evaluation circuit, a general evaluation system of simulating user system on chip (SOC) with signal timing calibration and compensation by software and hardware compensation structures were introduced to realize the function, performance and reliability verification of the hard IP core. The design and verification of a random access memory (SRAM) hard IP core based on an on-chip evaluation circuit was actually completed, and the key timing parameters of the hard IP core were tested. The address setup time parameter was taken as an example to analyze the specific testing method and the test results were obtained. With this testing technology, the accuracy of testing the timing parameters of hard IP core can reach pS level, compared with the hard IP core packaged test, the accuracy of the result data is fully reflected. 展开更多
关键词 HARD IP core system on CHIP (SOC) testing technology evaluation circuit MEMORY automatic test equipment (ate).
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LCD Driver测试技术
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作者 张明铭 《电子工业专用设备》 2006年第2期39-42,共4页
近年来随着彩屏手机、PDA等移动终端的普及,液晶电视等平板显示器件的推广,液晶显示器已经逐渐取代CRT成为主流的显示器件。LCDDriverIC作为液晶显示器的重要部件,需求量也日益增大。国内目前很多生产设计厂商已经开始相关产品的开发和... 近年来随着彩屏手机、PDA等移动终端的普及,液晶电视等平板显示器件的推广,液晶显示器已经逐渐取代CRT成为主流的显示器件。LCDDriverIC作为液晶显示器的重要部件,需求量也日益增大。国内目前很多生产设计厂商已经开始相关产品的开发和生产。就LCDDriverIC的特点,介绍应用ATE(AutomaticTestEquipment)对其进行测试的方法。 展开更多
关键词 自动化测试仪 伽马曲线 无源矩阵 有源矩阵 晶圆测试 最终测试
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