C band microwave damage characteristics of pseudomorphic high electron mobility transistor

The damage effect characteristics of GaAs pseudomorphic high electron mobility transistor(pHEMT)under the irradiation of C band high-power microwave(HPM)is investigated in this paper.Based on the theoretical analysis,the thermoelectric coupling model is established,and the key damage parameters of the device under typical pulse conditions are predicted,including the damage location,damage power,etc.By the injection effect test and device microanatomy analysis through using scanning electron microscope(SEM)and energy dispersive spectrometer(EDS),it is concluded that the gate metal in the first stage of the device is the vulnerable to HPM damage,especially the side below the gate near the source.The damage power in the injection test is about 40 dBm and in good agreement with the simulation result.This work has a certain reference value for microwave damage assessment of pHEMT.

Quantitative analysis of the performance of vector tracking algorithms

Vector tracking changes the classical structure of receivers. Combining signal tracking and navigation solution,vector tracking can realize powerful processing capabilities by the fusion technique of receiving channel and feedback correction. In this paper,we try to break through the complicated details of numerical analysis,consider the overall influencing factors of the residual in observed data,and use the intrinsic link between a conventional receiver and a vector receiver. A simple method for performance analysis of the vector tracking algorithm is proposed. Kalman filter has the same steady performance with the classic digital lock loop through the analysis of the relation between gain and band width. The theoretical analysis by the least squares model shows that the reduction of range error is the basis for the superior performance realized by vector tracking. Thus,the bounds of its performance enhancement under weak signal and highly dynamic conditions can be deduced. Simulation results verify the effectiveness of the analysis presented here.

Identification of Steady State and Transient State

Identification of steady state and transient state plays an important role in modeling,control,optimiza-tion,and fault detection of industrial processes.Many existing methods for state identification are not satisfactory in practical applications due to problems of ideal hypothesis,too many parameters,and poor robustness.In this paper,a novel state identification approach is proposed.The problem of state identification is transformed into finding the noise band of differential signal.For practical application,automatic selection of noise band amplitude is proposed to make the method convenient to be used.Problems of gross errors,low signal-to-noise ratio and online identification are considered.And comparison with other two methods shows that the proposed method has better identification performance.Simulations and experiments also prove the effectiveness and practicability of the proposed method.