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Electrical characterization of integrated passive devices using thin film technology for 3D integration
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作者 Xin SUN Yun-hui ZHU +5 位作者 Zhen-hua LIU Qing-hu CUI Sheng-lin MA Jing CHEN Min MIAO Yu-feng JIN 《Journal of Zhejiang University-Science C(Computers and Electronics)》 SCIE EI 2013年第4期235-243,共9页
With the development of 3D integration technology, microsystems with vertical interconnects are attracting attention from researchers and industry applications. Basic elements of integrated passive devices (IPDs), i... With the development of 3D integration technology, microsystems with vertical interconnects are attracting attention from researchers and industry applications. Basic elements of integrated passive devices (IPDs), including inductors, capacitors, and resistors, could dramatically save the tbotprint of the system, optimize the form factor, and improve the performance of radio frequency (RF) systems. In this paper, IPDs using thin film built-up technology are introduced, and the design and characterization of coplanar waveguides (CPWs), inductors, and capacitors are presented. 展开更多
关键词 Integrated passive device (IPD) benzocyclobutcne (BCB) Thin flim 3D Integration
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