期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
A novel planar vertical double-diffused metal-oxide-semiconductor field-effect transistor with inhomogeneous floating islands 被引量:1
1
作者 任敏 李泽宏 +3 位作者 刘小龙 谢加雄 邓光敏 张波 《Chinese Physics B》 SCIE EI CAS CSCD 2011年第12期450-455,460+459,共6页
A novel planar vertical double-diffused metal-oxide-semiconductor (VDMOS) structure with an ultra-low specific on-resistance (Ron,sp), whose distinctive feature is the use of inhomogeneous floating p-islands in th... A novel planar vertical double-diffused metal-oxide-semiconductor (VDMOS) structure with an ultra-low specific on-resistance (Ron,sp), whose distinctive feature is the use of inhomogeneous floating p-islands in the n-drift region, is proposed. The theoretical limit of its Ron,sp is deduced, the influence of structure parameters on the breakdown voltage (BV) and Ron,sp are investigated, and the optimized results with BV of 83 V and Ron,sp of 54 mΩ.mm2 are obtained. Simulations show that the inhomogeneous-floating-islands metal-oxide-semiconductor field-effect transistor (MOSFET) has a superior "Ron,sp/BV" trade-off to the conventional VDMOS (a 38% reduction of Ron,sp with the same BV) and the homogeneous-floating-islands MOSFET (a 10% reduction of Ron,sp with the same BV). The inhomogeneous-floatingislands MOSFET also has a much better body-diode characteristic than the superjunction MOSFET. Its reverse recovery peak current, reverse recovery time and reverse recovery charge are about 50, 80 and 40% of those of the superjunction MOSFET, respectively. 展开更多
关键词 inhomogeneous floating islands specific on-state resistance breakdown voltage body diode reverse recovery
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部