A C-testable motion estimation （CTME） design to efficiently detect the faults in process elements （PEs） is presented. The goal of the CTME design is to offer high reliability for video coding systems. The proposed...A C-testable motion estimation （CTME） design to efficiently detect the faults in process elements （PEs） is presented. The goal of the CTME design is to offer high reliability for video coding systems. The proposed CTME was carried out by Verilog HDL （very high speed integrated circuit hardware description language） and synthesized with the TSMC （Taiwan Semiconductor Manufacturing Company） 0.18 μm CMOS technology. Logic simulation results show that the proposed CTME guarantees 100% fault coverage with only 8 sets of test patterns. Design verification and comparisons also demonstrate that the area overhead of the proposed CTME is about 4.8% with little delay penalty.展开更多
A new approach is presented for easily testable two-dimensional iterative arrays.It is an improvment on GI-testability (Group Identical testability) and is referred to as GID-testability (Group Identical and Different...A new approach is presented for easily testable two-dimensional iterative arrays.It is an improvment on GI-testability (Group Identical testability) and is referred to as GID-testability (Group Identical and Different testability). In a GID-testable twodimensional array, the primary x and y outputs are organized into groups and every group has more than one output. This is similar to the GI-testable arrays. However,GID-testability not only ensures that identical test responses can be obtained from every output in the same group when an array is fault free, but also ensures that at least one output has different test responses (from the other outputs in a group) when a cell in the array is faulty Therefore, all faults can be detected under the assumption of a single faulty cell model. It is proved that an arbitrary two-dimensional iterative array is GID-testable if seven x-states and seven y-states are added to the original flow table of the basic cell of the array.GID-testability simplifies the response verification of built-in-self testing in a way similar to PL- and GI-testability[6-9]. Therefore, it is suitable for BIST design.展开更多
文摘A C-testable motion estimation （CTME） design to efficiently detect the faults in process elements （PEs） is presented. The goal of the CTME design is to offer high reliability for video coding systems. The proposed CTME was carried out by Verilog HDL （very high speed integrated circuit hardware description language） and synthesized with the TSMC （Taiwan Semiconductor Manufacturing Company） 0.18 μm CMOS technology. Logic simulation results show that the proposed CTME guarantees 100% fault coverage with only 8 sets of test patterns. Design verification and comparisons also demonstrate that the area overhead of the proposed CTME is about 4.8% with little delay penalty.
文摘A new approach is presented for easily testable two-dimensional iterative arrays.It is an improvment on GI-testability (Group Identical testability) and is referred to as GID-testability (Group Identical and Different testability). In a GID-testable twodimensional array, the primary x and y outputs are organized into groups and every group has more than one output. This is similar to the GI-testable arrays. However,GID-testability not only ensures that identical test responses can be obtained from every output in the same group when an array is fault free, but also ensures that at least one output has different test responses (from the other outputs in a group) when a cell in the array is faulty Therefore, all faults can be detected under the assumption of a single faulty cell model. It is proved that an arbitrary two-dimensional iterative array is GID-testable if seven x-states and seven y-states are added to the original flow table of the basic cell of the array.GID-testability simplifies the response verification of built-in-self testing in a way similar to PL- and GI-testability[6-9]. Therefore, it is suitable for BIST design.
