In a component-based software development life cycle, selection of preexisting components is an important task. Every component that has to be reused has an associated risk of failure of not meeting the functional and...In a component-based software development life cycle, selection of preexisting components is an important task. Every component that has to be reused has an associated risk of failure of not meeting the functional and non-functional requirements. A component's failure would lead a developer to look for some other alternative of combinations of COTS, in-house and engineered components among possible candidate combinations. This means design itself can readily change. The very process of design of a software system and component selection seems to be heavily dependent on testing results. Instability of design, further, becomes more severe due to requirements change requests. Therefore, this instability of design has to be essentially mitigated by using proper design and testing approaches, otherwise, it may lead to exorbitantly high testing cost due to the repeated testing of various alternatives. How these three activities: Component-based software design, component selection and component-based software testing are interrelated? What process model is most suited to address this concern? This work explores the above questions and their implication in terms of nature of a process model that can be convincing in case of component-based software development.展开更多
Utilizing commercial off-the-shelf(COTS) components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper ...Utilizing commercial off-the-shelf(COTS) components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper studies the low-density parity-check(LDPC) coding scheme for improving the reliability of multi-level-cell(MLC) NAND Flash memory in radiation environments. Firstly, based on existing physical experiment works, we introduce a new error model for heavyion irradiations; secondly, we explore the optimization of writing voltage allocation to maximize the capacity of the storage channel; thirdly, we design the degree distribution of LDPC codes that is specially suitable for the proposed model; finally, we propose a joint detection-decoding scheme based on LDPC codes, which estimates the storage channel state and executes an adaptive log-likelihood ratio(LLR) calculation to achieve better performance. Simulation results show that, compared with the conventional LDPC coding scheme, the proposed scheme may almost double the lifetime of the MLC NAND Flash memory in radiation environments.展开更多
文摘In a component-based software development life cycle, selection of preexisting components is an important task. Every component that has to be reused has an associated risk of failure of not meeting the functional and non-functional requirements. A component's failure would lead a developer to look for some other alternative of combinations of COTS, in-house and engineered components among possible candidate combinations. This means design itself can readily change. The very process of design of a software system and component selection seems to be heavily dependent on testing results. Instability of design, further, becomes more severe due to requirements change requests. Therefore, this instability of design has to be essentially mitigated by using proper design and testing approaches, otherwise, it may lead to exorbitantly high testing cost due to the repeated testing of various alternatives. How these three activities: Component-based software design, component selection and component-based software testing are interrelated? What process model is most suited to address this concern? This work explores the above questions and their implication in terms of nature of a process model that can be convincing in case of component-based software development.
基金supported by the National Basic Research Project of China(973)(2013CB329006)National Natural Science Foundation of China(NSFC,91538203)the new strategic industries development projects of Shenzhen City(JCYJ20150403155812833)
文摘Utilizing commercial off-the-shelf(COTS) components in satellites has received much attention due to the low cost. However, commercial memories suffer severe reliability problems in radiation environments. This paper studies the low-density parity-check(LDPC) coding scheme for improving the reliability of multi-level-cell(MLC) NAND Flash memory in radiation environments. Firstly, based on existing physical experiment works, we introduce a new error model for heavyion irradiations; secondly, we explore the optimization of writing voltage allocation to maximize the capacity of the storage channel; thirdly, we design the degree distribution of LDPC codes that is specially suitable for the proposed model; finally, we propose a joint detection-decoding scheme based on LDPC codes, which estimates the storage channel state and executes an adaptive log-likelihood ratio(LLR) calculation to achieve better performance. Simulation results show that, compared with the conventional LDPC coding scheme, the proposed scheme may almost double the lifetime of the MLC NAND Flash memory in radiation environments.
