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Influence of Impurity Germanium on Property of CZ-Si
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作者 张维连 刘彩池 +1 位作者 王志军 冀志江 《Rare Metals》 SCIE EI CAS CSCD 1994年第4期292-295,共4页
The isovalent element Ge doped into CZ-Si can effectively suppress the forming rate of oxygen donors andreduce their maximal concentration. The mechanical strength of silicon wafers can be increased by this proce-dure... The isovalent element Ge doped into CZ-Si can effectively suppress the forming rate of oxygen donors andreduce their maximal concentration. The mechanical strength of silicon wafers can be increased by this proce-dure. The mechanism of above phenomena has been discussed. 展开更多
关键词 cz-si ge-doping mechanical property
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