Ca2Fe2O5 powder sample, were prepared to investigate the origin of the weak ferromagnetic component reported in literature for calcium ferrite single crystals. In this work, the calcination method was used to produce ...Ca2Fe2O5 powder sample, were prepared to investigate the origin of the weak ferromagnetic component reported in literature for calcium ferrite single crystals. In this work, the calcination method was used to produce nanocrystalline powders of Ca2Fe2O5. XRD measurement has shown the presence of Fe3O4 magnetite and CaO as impurity phases. The ferrimagnetic phase deeply influences the magnetic behavior with features very similar to those reported in literature for Ca2Fe2O5, both powders and single crystals. Our results support the hypothesis that the weak ferromagnetic component observed in Ca2Fe2O5 can be also due to the presence of magnetite impurity traces in the samples. The powders were submitted to calcination processes at 500℃ for 2 hours and 950℃ for 16 hours. The sintered sample was submitted at 1050℃ for 6 hours and characterized by X-Ray Powder diffraction (XRD), dielectric measurements, Magnetization and Scanning Electron Microscopy (SEM) analysis.展开更多
文摘Ca2Fe2O5 powder sample, were prepared to investigate the origin of the weak ferromagnetic component reported in literature for calcium ferrite single crystals. In this work, the calcination method was used to produce nanocrystalline powders of Ca2Fe2O5. XRD measurement has shown the presence of Fe3O4 magnetite and CaO as impurity phases. The ferrimagnetic phase deeply influences the magnetic behavior with features very similar to those reported in literature for Ca2Fe2O5, both powders and single crystals. Our results support the hypothesis that the weak ferromagnetic component observed in Ca2Fe2O5 can be also due to the presence of magnetite impurity traces in the samples. The powders were submitted to calcination processes at 500℃ for 2 hours and 950℃ for 16 hours. The sintered sample was submitted at 1050℃ for 6 hours and characterized by X-Ray Powder diffraction (XRD), dielectric measurements, Magnetization and Scanning Electron Microscopy (SEM) analysis.