Nano-ZnO thin films composed of nanoparticles with sizes of 10-16 nm on silicon substrates at low temperature were prepared by sol-gel method.By placing the nano-ZnO thin films at room temperature or annealing at 100&...Nano-ZnO thin films composed of nanoparticles with sizes of 10-16 nm on silicon substrates at low temperature were prepared by sol-gel method.By placing the nano-ZnO thin films at room temperature or annealing at 100°C in air for 10 h intermittently,within a total 70 h annealing time,the evolution of PL spectra of the nano-ZnO thin films were studied in detail.As the annealing time increases,the PL peaks shift from violet to blue and green bands.The PL peaks at violet and blue bands decrease with the annealing time,but the PL peaks at green band are opposite.The PL spectra are related to the defects in the nano-ZnO thin films.The PL peaks positioned at 430 nm are mainly related to defects of zinc interstatials(Zni),oxygen vacancies and(Vo);the ones at 420 nm to oxygen interstitials(Oi),Zinc vacancies(Vzn),Zni ;and the ones at 468 nm to Vzn,Zni,and charged oxygen interstatials(Vo+).The green luminescence is related to Oi,Vo and Zni.The evolutions of PL spectra and the defects are also related to the concentrations of Zn in the thin films,the thicknesses of the films and the annealing time.For the films with 0.5 M and 1.0 M Zn concentrations,after 20 h and 30 h annealing in air at 100°C,respectively,either placing them in air at room temperature or continuing anneal in air at 100°C,the PL spectra are stable.Under the low temperature annealing,Zni decreases with the annealing time,and Oi increases.Sufficient Oi favors to keep the nano-ZnO thin films stable.This result is important to nano-ZnO thin films as electron transport layers in inverted or tandem organic solar cells.展开更多
The investigation on the oxidation behaviour of Si1-xGex alloys （x=0.05, 0.15, and 0.25） is carried out. It is found for the first time that on the oxide film a germanium nano-cap with a thickness of 1.8-2.8nm and a...The investigation on the oxidation behaviour of Si1-xGex alloys （x=0.05, 0.15, and 0.25） is carried out. It is found for the first time that on the oxide film a germanium nano-cap with a thickness of 1.8-2.8nm and a few Ge nanoparticles with diameters ranging from 5.5 nm to 10 nm are formed by the low-temperatu.re laser-assisted dry oxidation of Si1-xGex substrate. A new scanning method on the decline cross-section of the multiple-layer sample is adopted to measure the layer thickness and the composition. Some new peaks in photoluminescence （PL） spectra are discovered, which could be related to the nano-cap and the nano-particles of germanium. A suitable model and several new calculating formulae with the unrestricted Hartree-Fock-Roothaan （UHFR） method and quantum confinement analysis are proposed to interpret the PL spectra and the nano-structure mechanism in the oxide.展开更多
基金supported by the National Natural Science Foundation of China (Grant Nos. 41172110,61107090)Shandong Provincial Natural Science Foundation (Grant No. ZR2011BZ007)
文摘Nano-ZnO thin films composed of nanoparticles with sizes of 10-16 nm on silicon substrates at low temperature were prepared by sol-gel method.By placing the nano-ZnO thin films at room temperature or annealing at 100°C in air for 10 h intermittently,within a total 70 h annealing time,the evolution of PL spectra of the nano-ZnO thin films were studied in detail.As the annealing time increases,the PL peaks shift from violet to blue and green bands.The PL peaks at violet and blue bands decrease with the annealing time,but the PL peaks at green band are opposite.The PL spectra are related to the defects in the nano-ZnO thin films.The PL peaks positioned at 430 nm are mainly related to defects of zinc interstatials(Zni),oxygen vacancies and(Vo);the ones at 420 nm to oxygen interstitials(Oi),Zinc vacancies(Vzn),Zni ;and the ones at 468 nm to Vzn,Zni,and charged oxygen interstatials(Vo+).The green luminescence is related to Oi,Vo and Zni.The evolutions of PL spectra and the defects are also related to the concentrations of Zn in the thin films,the thicknesses of the films and the annealing time.For the films with 0.5 M and 1.0 M Zn concentrations,after 20 h and 30 h annealing in air at 100°C,respectively,either placing them in air at room temperature or continuing anneal in air at 100°C,the PL spectra are stable.Under the low temperature annealing,Zni decreases with the annealing time,and Oi increases.Sufficient Oi favors to keep the nano-ZnO thin films stable.This result is important to nano-ZnO thin films as electron transport layers in inverted or tandem organic solar cells.
基金Project supported by the Natural Science Foundation of Guizhou Province, China （Grant No 3067（2004））.
文摘The investigation on the oxidation behaviour of Si1-xGex alloys （x=0.05, 0.15, and 0.25） is carried out. It is found for the first time that on the oxide film a germanium nano-cap with a thickness of 1.8-2.8nm and a few Ge nanoparticles with diameters ranging from 5.5 nm to 10 nm are formed by the low-temperatu.re laser-assisted dry oxidation of Si1-xGex substrate. A new scanning method on the decline cross-section of the multiple-layer sample is adopted to measure the layer thickness and the composition. Some new peaks in photoluminescence （PL） spectra are discovered, which could be related to the nano-cap and the nano-particles of germanium. A suitable model and several new calculating formulae with the unrestricted Hartree-Fock-Roothaan （UHFR） method and quantum confinement analysis are proposed to interpret the PL spectra and the nano-structure mechanism in the oxide.
