8寸CMP设备对小尺寸镀铜InP晶圆的工艺开发

为了实现在8寸化学机械抛光设备上进行小尺寸镀铜InP晶圆的减薄抛光工作,提高设备的兼容性,缩减工艺步骤,减少过多操作导致InP晶圆出现裂纹暗伤和表面颗粒增加等问题,自制特殊模具,使小尺寸InP晶圆在8寸化学机械抛光设备上进行加工,再根据InP晶圆易碎的缺陷问题,通过调整设备的抛光头压力、转速和抛光垫的转速等相关工艺参数,使其满足后续键合工艺的相关需求。实验结果表明:在使用特殊模具下,当抛光头的压力调整为20.684 kPa、抛光头与抛光垫的转速分别为:93 r/min和87 r/min时,InP晶圆的表面粗糙度达到:Ra≤1 nm;表面铜层的去除速率达到3857×10^(-10)/min;后续与8寸晶圆的键合避免键合位置出现空洞等缺陷,实现2寸InP晶圆在8寸设备上的CMP工艺,大大降低了CMP工艺成本,同时避免晶圆在转移过程中出现表面颗粒度增加和划伤的情况,实现了InP晶圆与Si晶圆的异质键合及Cu互连工艺。

Chemical Mechanical Polishing of Glass Substrate with α-Alumina-g-Polystyrene Sulfonic Acid Composite Abrasive

Abrasive is the one of key influencing factors during chemical mechanical polishing（CMP） process. Currently, α-Alumina （α-Al2O3） particle, as a kind of abrasive, has been widely used in CMP slurries, but their high hardness and poor dispersion stability often lead to more surface defects. After being polished with composite particles, the surface defects of work pieces decrease obviously. So the composite particles as abrasives in slurry have been paid more attention. In order to reduce defect caused by pure α-Al2O3 abrasive, α-alumina-g-polystyrene sulfonic acid （α-Al2O3-g-PSS） composite abrasive was prepared by surface graft polymerization. The composition, structure and morphology of the product were characterized by Fourier transform infrared spectroscopy（FTIR）, X-ray photoelectron spectroscopy（XPS）, time-of-flight secondary ion mass spectroscopy（TOF-SIMS）, and scanning electron microscopy（SEM）, respectively. The results show that polystyrene sulfonic acid grafts onto α-Al2O3, and has well dispersibility. Then, the chemical mechanical polishing performances of the composite abrasive on glass substrate were investigated with a SPEEDFAM-16B-4M CMP machine. Atomic force microscopy（AFM） images indicate that the average roughness of the polished glass substrate surface can be decreased from 0.835 nm for pure α-Al2O3 abrasive to 0.583 nm for prepared α-Al2O3-g-PSS core-shell abrasive. The research provides a new and effect way to improve the surface qualities during CMP.

Research on Abrasives in the Chemical Mechanical Polishing Process for Silicon Nitride Balls

Silicon nitride (Si 3N 4) has been the main material for balls in ceramic ball bearings, for its lower density, high strength, high hardness, fine thermal stability and anticorrosive, and is widely used in various fields, such as high speed and high temperature areojet engines, precision machine tools and chemical engineer machines. Silicon nitride ceramics is a kind of brittle and hard material that is difficult to machining. In the traditional finishing process of silicon nitride balls, balls are lapped by expensive diamond abrasive. The machining is inefficiency and the cost is high, but also lots of pits, scratch subsurface micro crazes and dislocations will be caused on the surface of the balls, the performance of the ball bearings would be declined seriously. In these year, a kind of new technology known as chemical mechanical polishing is introduced in the ultraprecision machining process of ceramic balls. In this technology, abrasives such as ZrO 2, CeO 2 whose hardness is close to or lower than the work material (Si 3N 4) are used to polishing the balls. In special slurry, these abrasives can chemo-mechanically react with the work material and environment (air or water) to generate softer material (SiO 2). And the resultants will be removed easily at 0.1 nm level. So the surface defects can be minimized, very smooth surface (Ra=4 nm) and fine sphericity (0.15～0.25 μm ) can be obtained, and the machining efficiency is also improved. The action mechanism of the abrasives in the chemical mechanical polishing process in finishing of silicon nitride ball will be introduced in this paper.

Preparation of Non-spherical Colloidal Silica Nanoparticle and Its Application on Chemical Mechanical Polishing of Sapphire

Non-spherical colloidal silica nanoparticle was prepared by a simple new method, and its particle size distribution and shape morphology were characterized by dynamic light scattering(DLS) and the Focus Ion Beam(FIB) system. This kind of novel colloidal silica particles can be well used in chemical mechanical polishing(CMP) of sapphire wafer surface. And the polishing test proves that non-spherical colloidal silica slurry shows much higher material removal rate(MRR) with higher coefficient of friction(COF) when compared to traditional large spherical colloidal silica slurry with particle size 80 nm by DLS. Besides, sapphire wafer polished by non-spherical abrasive also has a good surface roughness of 0.460 6 nm. Therefore, non-spherical colloidal silica has shown great potential in the CMP field because of its higher MRR and better surface roughness.

阴/非离子型表面活性剂对CMP后SiO_(2)颗粒的去除效果

为了更有效地去除铜晶圆化学机械抛光(CMP)后清洗残留的SiO_(2)颗粒,选择了2种阴离子型表面活性剂(SLS、TD⁃40)和2种非离子型表面活性剂(AEO⁃5、JFC⁃6),通过接触角、表面张力、电化学、分子动力学模拟实验探究了4种表面活性剂在铜表面的润湿性、吸附构型及吸附稳定性。通过优化表面活性剂质量浓度,选择达到吸附稳定时的质量浓度配置4种表面活性剂来清洗铜晶圆,利用扫描电子显微镜观测铜表面形貌,对比它们的清洗效果。随后选择TD⁃40和JFC⁃6进行复配,研究复配后表面活性剂对硅溶胶颗粒的去除效果。实验结果表明,使用体积比为2∶1的TD⁃40与JFC⁃6进行复配得到的CMP清洗液对SiO_(2)颗粒的去除效果比单一表面活性剂的更好。

磨粒振动对碳化硅CMP的微观结构演变和材料去除的影响

针对化学机械抛光中磨料易团聚、机械和化学作用不能充分发挥等问题,采用振动辅助的方法进行优化。通过分子动力学模拟,分析磨粒振动的频率、振幅及其压入深度、划切速度对工件表面微观原子迁移的演变规律,揭示振动对材料去除和表面改善的促进机制;并通过振动辅助化学机械抛光工艺试验和表面成分分析,验证振动辅助的抛光效果和去除机制。结果表明:适当增大磨粒的振动频率、振动振幅及其压入深度、划切速度,可有效提高工件表面的原子势能和温度;磨粒振动有利于提高工件表面原子的混乱度,促进碳化硅参与氧化反应,形成氧化层并以机械方式去除;抛光试验和成分分析也证实振动可以提高材料去除率约50.5%,改善表面质量约25.4%。

A nano-scale mirror-like surface of Ti–6Al–4V attained by chemical mechanical polishing

Metal Ti and its alloys have been widely utilized in the fields of aviation, medical science, and micro-electromechanical systems, for its excellent specific strength, resistance to corrosion, and biological compatibility. As the application of Ti moves to the micro or nano scale, however, traditional methods of planarization have shown their short slabs.Thus, we introduce the method of chemical mechanical polishing（CMP） to provide a new way for the nano-scale planarization method of Ti alloys. We obtain a mirror-like surface, whose flatness is of nano-scale, via the CMP method. We test the basic mechanical behavior of Ti–6Al–4V（Ti64） in the CMP process, and optimize the composition of CMP slurry.Furthermore, the possible reactions that may take place in the CMP process have been studied by electrochemical methods combined with x-ray photoelectron spectroscopy（XPS）. An equivalent circuit has been built to interpret the dynamic of oxidation. Finally, a model has been established to explain the synergy of chemical and mechanical effects in the CMP of Ti–6Al–4V.

Effect of Abrasive Concentration on Chemical Mechanical Polishing of Sapphire

Effects of abrasive concentration on material removal rate CMRR） and surtace quality m the chemical mecnamcal polishing （CMP） of light-emitting diode sapphire substrates are investigated. Experimental results show that the MRR increases linearly with the abrasive concentration, while the rms roughness decreases with the increasing abrasive concentration. In addition, the in situ coefficient of friction （COF） is also conducted during the sapphire polishing process. The results present that COF increases sharply with the abrasive concentration up to 20 wt% and then shows a slight decrease from 20wt% to 40wt%. Temperature is a product of the friction force that is proportional to COF, which is an indicator for the mechanism of the sapphire CMP.

TWO STEPS CHEMICAL-MECHANICAL POLISHING OF RIGID DISK SUBSTRATE TO GET ATOM-SCALE PLANARIZATION SURFACE

In order to get atomic smooth rigid disk substrate surface, ultra-fined alumina slurry and nanometer silica slurry are prepared, and two steps chemical-mechanical polishing （CMP） of rigid disk substrate in the two slurries are studied. The results show that, during the first step CMP in the alumina slurry, a high material removal rate is reached, and the average roughness （Ra） and the average waviness （Wa） of the polished surfaces can be decreased from previous 1.4 nm and 1.6 nm to about 0.6 nm and 0.7 nm, respectively. By using the nanometer silica slurry and optimized polishing process parameters in the second step CMP, the Ra and the Wa of the polished surfaces can be further reduced to 0.038 nm and 0.06 am, respectively. Atom force microscopy （AFM） analysis shows that the final polished surfaces are ultra-smooth without micro-defects.

Theoretical and experimental investigation of chemical mechanical polishing of W–Ni–Fe alloy

Fine finishing of tungsten alloy is required to improve the surface quality of molds and precision instruments. Nevertheless, it is difficult to obtain high-quality surfaces as a result of grain boundary steps attributed to differences in properties of two-phase microstructures. This paper presents a theoretical and experimental investigation on chemical mechanical polishing of W–Ni–Fe alloy. The mechanism of the boundary step generation is illustrated and a model of grain boundary step formation is proposed. The mechanism reveals the effects of mechanical and chemical actions in both surface roughness and material removal. The model was verified by the experiments and the results show that appropriately balancing the mechanical and chemical effects restrains the generation of boundary steps and leads to a fine surface quality with a high removal rate by citric acid-based slurry.

CMP工艺参数对AlGaInP基LED衬底转移的影响

以GaP/Al2O3/SiO2引导式出光结构作为芯片键合层,通过化学机械抛光工艺减少AlGaInP基Mini-LED衬底转移过程中出现的外延层空洞,提高芯片制备工艺良率。以材料去除速率和表面粗糙度作为技术评价指标,基于单因素实验结果对抛光压力、抛光头转速、抛光盘转速、抛光液流速四个影响化学机械抛光工艺的因素展开L9(34)的正交实验,实验结果表明:在抛光头转速75 r/min、抛光盘转速80 r/min、抛光压力8 kPa、抛光液流速100 mL/min条件下,材料去除速率为83.12 nm/min,表面粗糙度最低为0.477 nm,采用优化后的工艺条件能够获得高质量的GaAs键合表面,有效减少外延空洞,提高制备良率。

pH调节剂在CMP工艺中的应用研究进展

pH调节剂在化学机械抛光(CMP)工艺中有重要应用,可以调节抛光液的pH值以确保抛光过程的化学反应在理想的pH值下进行,同时保持抛光化学环境的稳定等。对无机酸、有机酸、无机碱和有机碱四大类pH调节剂在合金、金属和金属化合物等材料的CMP中的应用及其作用机理进行综述。无机酸pH调节剂的主要作用机理是快速腐蚀材料表面,但其主要缺点是会将多余的金属离子引入抛光液中污染金属表面。有机酸pH调节剂的主要作用机理是螯合金属离子形成大分子络合物,但其主要缺点是稳定性差,难以保存。无机碱pH调节剂的主要作用机理是在基底表面生成一层软化层,使其在机械作用下更容易被去除,但其主要缺点是仍会引入金属离子污染材料表面。有机碱pH调节剂的主要作用机理是加速钝化膜的形成,但其主要缺点是制备困难、成本高。最后对pH调节剂在CMP中的应用前景进行了展望。

半导体材料CMP过程中磨料的研究进展

对磨料在半导体材料化学机械抛光(CMP)中的应用和研究进展进行了简单阐述,从各代半导体材料制成半导体器件的加工要求介绍了磨料在半导体材料CMP中的重要性,从CMP过程中磨料与半导体材料的相互作用介绍了磨料在半导体材料CMP中的环保性,从磨料的改性和制备介绍了磨料在半导体材料CMP中应用的限制性,重点从半导体材料的去除速率和表面质量介绍了磨料对半导体材料抛光性能的影响,并对国内外研究中单一磨料、混合磨料和复合磨料对半导体材料抛光性能的影响进行了评述,总结了近年来磨料在半导体材料CMP中的研究进展。最后,对磨料在半导体材料CMP中存在的共性问题进行了总结,并对该领域所面临的挑战及发展方向进行了展望。

CMP抛光垫表面及材料特性对抛光效果影响的研究进展

对化学机械抛光(CMP)工艺中的抛光垫特性、劣化以及修整进行了简单阐述,重点先从抛光垫表面特性(抛光垫表面微形貌、微孔及抛光垫的结构、表面沟槽纹理的形状、微凸体的分布)和材质特性(硬度、弹性模量和化学性能)入手,对近年来国内外的实验研究与理论模拟分析两方面进行了概括,总结了目前各个特性参数对抛光垫性能以及对CMP过程影响的进展,此外,从机械磨损和化学腐蚀两方面对抛光垫的劣化机理进行简要分析。随后,为进一步探究抛光垫修整对抛光性能影响,对抛光垫的两种修整方式和修整参数对修整的效果进行了归纳,介绍了几种新型自修整材料。最后,指出了抛光垫特性和修整在发展现状中存在的问题,未来抛光垫的发展趋势将逐渐走向创新化、智能化、理论化以及应用集成化。

复合磨料的制备及其对层间介质CMP性能的影响

以SiO_(2)为内核、CeO_(2)为外壳制备出了核壳结构复合磨料,用以提升集成电路层间介质的去除速率及表面一致性。采用扫描电子显微镜(SEM)观察复合磨料的表面形貌,利用X射线衍射仪(XRD)、傅里叶变换红外光谱仪(FTIR)和X射线光电子能谱仪(XPS)分析复合磨料的表面物相结构及化学键组成。研究结果表明,所制备的复合磨料呈现出“荔枝”形,平均粒径为70~90 nm,CeO_(2)粒子主要以Si—O—Ce键与SiO_(2)内核结合。将所制备的复合磨料配置成抛光液进行层间介质化学机械抛光(CMP)实验。实验结果表明,Zeta电位随着pH值的降低而升高,当pH值约为6.8时达到复合磨料的等电点。当pH值为3时,层间介质去除速率达到最大,为481.6 nm/min。此外,研究发现去除速率还与摩擦力和温度有关,CMP后的SiO_(2)晶圆均方根表面粗糙度为0.287 nm。

CMP抛光液中SiO_(2)磨料分散稳定性的研究进展

对SiO_(2)磨料在化学机械抛光(CMP)抛光液中的应用以及影响抛光液分散稳定性的因素进行了阐述,重点从SiO_(2)磨料分散稳定性的角度介绍了SiO_(2)磨料质量分数和粒径、抛光液pH值、表面活性剂种类和表面改性等对抛光液稳定性的影响,通过分析Zeta电位绝对值的范围、凝胶时间的长短、粒径随时间的变化和接触角等,总结了小粒径(35 nm左右)SiO_(2)磨料在抛光液中的分散机理,同时探讨了弱碱性环境对磨料Zeta电位的影响,阳离子、阴离子和非离子表面活性剂对磨料表面的作用机理和复配使用的效果,以及表面疏水化或亲水化改性对磨料分散稳定性的影响。最后对该领域未来的发展方向进行了展望。

基于流固耦合的碳化硅衬底CMP过程温度场仿真分析

在碳化硅衬底化学机械抛光过程中,抛光界面温度是影响抛光效率的关键因素之一,掌握抛光界面温度分布情况,有助于更深入理解CMP机理并为工艺优化提供理论指导。为此,对碳化硅衬底的CMP过程中温度场分布情况进行了探究,分析了不同抛光工艺参数和抛光液组分对抛光界面温度的影响。利用有限元分析软件ANSYS的流固耦合模块,综合考虑抛光垫与抛光液对SiC衬底的磨削作用,得到抛光过程中SiC衬底表面温度分布。仿真结果表明,SiC衬底径向温度从中心到边缘逐渐增大,边缘处上升趋势逐渐减小甚至出现温度小幅下降,最大温差接近0.4℃(约为4%)。通过单因素实验探究不同影响因素与温度之间的关系,得出结论:随着抛光转速和抛光压力的增大,SiC表面平均温度上升,均近似成线性关系,并且边缘点与中心点温度变化相差越来越大;同时,衬底界面温度随着抛光液磨料浓度的增加而上升,但变化相对较小。

Study of Chemical Etching and Chemo-Mechanical Polishing on CdZnTe Nuclear Detectors

Cadmium zinc telluride (CdZnTe) semiconductor has applications in the detection of X-rays and gamma-rays at room temperature without having to use a cooling system. Chemical etching and chemo-mechanical polishing are processes used to smoothen CdZnTe wafer during detector device fabrication. These processes reduce surface damages left after polishing the wafers. In this paper, we compare the effects of etching and chemo-mechanical polishing on CdZnTe nuclear detectors, using a solution of hydrogen bromide in hydrogen peroxide and ethylene glycol mixture. X-ray photoelectron spectroscopy (XPS) was used to monitor TeO2 on the wafer surfaces. Current-voltage and detector-response measurements were made to study the electrical properties and energy resolution. XPS results showed that the chemical etching process resulted in the formation of more TeO2 on the detector surfaces compared to chemo-mechanical polishing. The electrical resistivity of the detector is of the order of 1010 Ω-cm. The chemo-mechanical polishing process increased the leakage current more that chemical etching. For freshly treated surfaces, the etching process is more detrimental to the energy resolution compared to chemo-mechanically polishing.

E1310P和FMEE复配对铜膜CMP性能的影响

针对化学机械抛光(CMP)中传统唑类缓蚀剂毒性强、成本高,在表面形成坚硬钝化膜难以去除等问题,在甘氨酸-双氧水体系下,使用阴离子表面活性剂聚氧乙烯醚磷酸酯(E1310P)和非离子表面活性剂脂肪酸甲酯乙氧基化物(FMEE)复配替代传统唑类缓蚀剂。通过去除速率、表面粗糙度和表面形貌等的实验结果研究了E1310P和FMEE协同作用对CMP过程中表面质量的影响。通过表面张力、电化学性能、X射线光电子能谱(XPS)和密度泛函理论(DFT)揭示了E1310P和FMEE的协同吸附行为及其机理。结果表明,E1310P可以吸附在Cu的表面,降低Cu的去除速率;FMEE的加入能有效屏蔽E1310P离子头基间的电性排斥作用,使更多的E1310P吸附在Cu的表面,在协同作用下形成了更致密的抑制膜,使得CMP抛光性能得以提升。