In this paper we study the problem of explicit representation and convergence of Pal type （0;1） interpolation and its converse, with some additional conditions, on the non-uniformly distributed nodes on the unit cir...In this paper we study the problem of explicit representation and convergence of Pal type （0;1） interpolation and its converse, with some additional conditions, on the non-uniformly distributed nodes on the unit circle obtaIned by projecting the interlaced zeros of Pn （x） and Pn′ （x） on the unit circle. The motivation to this problem can be traced to the recent studies on the regularity of Birkhoff interpolation and Pal type interpolations on non-uniformly distributed zeros on the unit circle.展开更多
Trace is the important composition structure of printed circuit board,w hich connects the devices,it is also the module that taking up the highest proportion,thus,it is the major testing target of quality assurance. T...Trace is the important composition structure of printed circuit board,w hich connects the devices,it is also the module that taking up the highest proportion,thus,it is the major testing target of quality assurance. The sunken defects proposed in this paper is a w idth abnormity defect on the FPC trace,w hich w ould cause the latent open circuit defect and affect the electrical function of circuit. The problem of flexible deformation and w idth difference make the FPC trace detection harder. Therefore,this paper proposed a detection scheme combined w ith linear masks and circle distribution characteristic. Firstly,this scheme preprocessed the acquired FPC image,divided the trace into several sub-regions and obtained the line w idth values of each trace transverse section. Then the line w idth sequences w ere searched w ith the linear difference template of gray scale. Thus,the sunken defects alternative positions w ere located. Lastly,the circle distribution characteristic is defined to identify the real defect areas from the alternative regions acquired from the previous step. Thus,the detection of sunken defects on the FPC trace w as accomplished.The algorithm w as tested in the self-built image database,w hich show s the better detection performance than the other typical algorithms.展开更多
文摘In this paper we study the problem of explicit representation and convergence of Pal type （0;1） interpolation and its converse, with some additional conditions, on the non-uniformly distributed nodes on the unit circle obtaIned by projecting the interlaced zeros of Pn （x） and Pn′ （x） on the unit circle. The motivation to this problem can be traced to the recent studies on the regularity of Birkhoff interpolation and Pal type interpolations on non-uniformly distributed zeros on the unit circle.
文摘Trace is the important composition structure of printed circuit board,w hich connects the devices,it is also the module that taking up the highest proportion,thus,it is the major testing target of quality assurance. The sunken defects proposed in this paper is a w idth abnormity defect on the FPC trace,w hich w ould cause the latent open circuit defect and affect the electrical function of circuit. The problem of flexible deformation and w idth difference make the FPC trace detection harder. Therefore,this paper proposed a detection scheme combined w ith linear masks and circle distribution characteristic. Firstly,this scheme preprocessed the acquired FPC image,divided the trace into several sub-regions and obtained the line w idth values of each trace transverse section. Then the line w idth sequences w ere searched w ith the linear difference template of gray scale. Thus,the sunken defects alternative positions w ere located. Lastly,the circle distribution characteristic is defined to identify the real defect areas from the alternative regions acquired from the previous step. Thus,the detection of sunken defects on the FPC trace w as accomplished.The algorithm w as tested in the self-built image database,w hich show s the better detection performance than the other typical algorithms.
