Effect of sub-layer thickness on magnetic and giant magnetoresistance properties of Ni–Fe/Cu/Co/Cu multilayered nanowire arrays

Ni-Fe/Cu/Co/Cu multilayered nanowire arrays were electrodeposited into anodic aluminum oxide template by using dual-bath method at room temperature. Scanning electron microscopy and transmission electron microscopy were used to characterize the morphology and structure of the multilayered nanowire arrays. Vibrating sample magnetometer and physical property measurement system were used to measure their magnetic and giant magnetoresistance （GMR） properties. The effect of sub-layer thickness on the magnetic and GMR properties was investigated. The results indicate that magnetic properties of electmdeposited nanowires are not affected obviously by Cu layer thickness, while magnetic layers （Ni-Fe and Co layers） have significant influence. In addition, GMR ratio presents an oscillatory behavior as Cu layer thickness changes. The magnetic and GMR properties of the multilayered nanowire arrays are optimum at room temperature for the material structure of Ni-Fe （25 nm）/Cu （15 nm）/Co （25 nm）/Cu （15 nm） with 30 deposition cycles.

单根Co(81)Cu(19)/Cu多层纳米线电学性质的原位测量

磁电阻效应是衡量磁结构单体性能的最重要指标。随着对磁电阻效应的不断研究和应用,不仅诞生了与电子自旋相关的自旋电子学理论,同时也促进了电子学器件的快速发展,这不仅为基础物理的理论研究提供了实验根基,也将促进今后大规模高科技产业的形成。随着半导体加工工艺技术的不断提高,电子学器件的基本结构单元已经达到了纳米量级,这将引起一些纳米范畴的特性对其宏观性能的调控和影响。基于此,全面掌握纳米磁结构单体基本的物理特性是非常必要的,对其全面了解和精确测量能够进一步推动自旋电子学器件的应用和发展。本文应用电化学沉积法制备了CoCu/Cu多层纳米线,且在电镜下对单根CoCu/Cu多层纳米线的磁电特性进行了原位测试。通过对多层纳米线电特性的测量,不仅获得了多层纳米线的基本物理参数,还得到了直观、清晰的物理图像,这为磁结构单体今后的发展和应用提供了可靠的理论基础和实际指导。