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高压大功率弹性压接型IGBT器件封装绝缘结构中的电场瞬态特性 被引量:3
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作者 刘思佳 文腾 +2 位作者 李学宝 王亮 崔翔 《电工技术学报》 EI CSCD 北大核心 2023年第23期6253-6265,共13页
压接型绝缘栅双极型晶体管(IGBT)是支撑柔性直流装备研制的核心器件,弹性压接型IGBT能更好地实现器件中各并联芯片的压力均衡,在电网应用场景中前景广阔。然而,器件内部的绝缘问题是高压器件研制过程中面临的主要挑战之一,因此,有必要... 压接型绝缘栅双极型晶体管(IGBT)是支撑柔性直流装备研制的核心器件,弹性压接型IGBT能更好地实现器件中各并联芯片的压力均衡,在电网应用场景中前景广阔。然而,器件内部的绝缘问题是高压器件研制过程中面临的主要挑战之一,因此,有必要在实际工况下分析器件绝缘结构中的瞬态电场分布,以指导绝缘设计。该文针对弹性压接型IGBT器件内部的复合绝缘结构,采用时域边界电场约束方程法,分别计算了单次关断工况和重复性导通关断工况下弹性压接型IGBT器件子模组封装绝缘结构中的瞬态电场分布。结果表明两种工况下,封装绝缘结构中最大电场强度均出现在芯片/聚酰亚胺(PI)钝化层界面上,且由于介质分界面两侧的绝缘材料介电常数和电导率参数不匹配,分界面上将会积累电荷。界面电荷密度随着时间逐渐增大,并影响电场分布,使得子模组中最大电场强度的模值和位置随时间发生变化。同时,单次关断工况下,最大电场强度的模值会更大。此外,该文提出通过改变器件中使用的绝缘材料,提高界面处的材料参数匹配程度,可以实现对子模组内电场分布的改善。该文所提方法能显著降低器件内部最大电场强度的模值,可为弹性压接型IGBT器件的封装绝缘结构设计和优化提供参考。 展开更多
关键词 弹性压接型igbt 时域有限元法 电准静态场 单次关断工况 重复性导通关断工况 电场调控方法
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Press-pack IGBTs for HVDC and FACTS 被引量:14
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作者 Robin Simpson Ashley Plumpton +3 位作者 Michael Varley Charles Tonner Paul Taylor Xiaoping Dai 《CSEE Journal of Power and Energy Systems》 SCIE 2017年第3期302-310,共9页
The popularity of insulated gate bipolar transistors(IGBTs)for use in high-voltage direct current(HVDC)transmission and flexible AC transmission systems(FACTS)is increasing.Unfortunately,for these applications wire-bo... The popularity of insulated gate bipolar transistors(IGBTs)for use in high-voltage direct current(HVDC)transmission and flexible AC transmission systems(FACTS)is increasing.Unfortunately,for these applications wire-bond IGBT technology has a number of shortcomings,such as insufficient current ratings for the most powerful schemes,and inability to fail to short-circuit.Press-pack IGBT technology,conversely,offers increased current ratings,and an inherent short-circuit failure mode,making it a more attractive choice for HVDC and FACTS.However,the design and manufacture of these devices requires a comprehensive understanding of the unique technical challenges,which differ markedly from those for wirebond modules or traditional pressure contact devices.Specific challenges include providing a high degree of mechanical protection for the IGBT chip against normal operating stresses.Furthermore,it is essential to achieve uniform contact pressure across each chip surface to ensure optimum performance.To achieve this,manufacturers have designed products that use rigid copper electrodes manufactured to tighter tolerances than for other pressure contact devices,such as thyristors,and products that use compliant electrodes,incorporating spring assemblies.Dynex is in the advanced stages of development of press-pack IGBT technology with demonstrated robust solutions for the technical challenges outlined in this paper.Design success has been achieved through the use of state-of-the-art simulations in conjunction with a long history of manufacturing expertise for bipolar and IGBT products.Finally,multiple press-pack IGBT variants are currently undergoing evaluation tests prior to product release. 展开更多
关键词 Flexible AC transmission systems HVDC transmission insulated gate bipolar transistors press-pack igbt STATCOM VSC
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Study of Pressure Balance for Press-Pack IGBTs and Its Influence on Temperature Distribution 被引量:2
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作者 Zihao Zhao Lin Liang Lubin Han 《Chinese Journal of Electrical Engineering》 CSCD 2018年第4期57-63,共7页
Pressure balance is a key technology for Press-Pack IGBT packaging,and is studied in this paper with its influence on the temperature distribution discussed in further when the device is turned on.By establishing the ... Pressure balance is a key technology for Press-Pack IGBT packaging,and is studied in this paper with its influence on the temperature distribution discussed in further when the device is turned on.By establishing the physical model of the Press-Pack IGBT device in the finite element simulation software,the influence of the internal flatness condition on the pressure balance is analyzed,and the variation of the average pressure difference with the flatness in different parallel scale of the chips is obtained.The thermal contact resistance and the electrical contact resistance parameters,which are dependent on the pressure,are then imported to perform the multi-field coupling,further investigating the effect of different pressure distributions on temperature distribution.The junction-case thermal resistance of the device with different flatness is compared experimentally.The results have demonstrated the influence of the flatness on the thermal resistance of the Press-Pack IGBT device. 展开更多
关键词 press-pack igbt pressure balance temperature distribution thermal resistance
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