The energy band structure with type-I alignment at the PbTe/CdTe（111） heterojunction interface is determined by the ultraviolet photoelectron spectrum using synchrotron radiation. The valence band and conduction ban...The energy band structure with type-I alignment at the PbTe/CdTe（111） heterojunction interface is determined by the ultraviolet photoelectron spectrum using synchrotron radiation. The valence band and conduction band offsets are obtained to be 0.09±0.12 and 1.19±0.12 eV, respectively. These results are in agreement with theoretically predicted ones. The accurate determination of the valence band and conduction band offsets is useful for the fundamental understanding of the mid-infrared light emission from the PbTe/CdTe heterostructures and its application in devices.展开更多
We report on using synthetic silicon for a high-precision X-ray polarimeter comprising a polarizer and an analyzer,each based on a monolithic channel-cut crystal used at multiple Brewster reflections with a Bragg angl...We report on using synthetic silicon for a high-precision X-ray polarimeter comprising a polarizer and an analyzer,each based on a monolithic channel-cut crystal used at multiple Brewster reflections with a Bragg angle very close to 45°.Experiments were performed at the BL09B bending magnet beamline of the Shanghai Synchrotron Radiation Facility using a Si(800)crystal at an X-ray energy of 12.914 keV.A polarization purity of 8.4×10^(-9)was measured.This result is encouraging,as the measured polarization purity is the best-reported value for the bending magnet source.Notably,this is the firstly systematic study on the hard X-ray polarimeter in China,which is crucial for exploring new physics,such as verifying vacuum birefringence.展开更多
Synchrotron radiation （SR） provides highly brilliant light with tunable wavelength from hard X-ray to far infrared, on which scattering, spectroscopy and imaging techniques with high time and spatial resolutions hav...Synchrotron radiation （SR） provides highly brilliant light with tunable wavelength from hard X-ray to far infrared, on which scattering, spectroscopy and imaging techniques with high time and spatial resolutions have been developed for in situ study on biological system and materials like polymer. With examples on flow-induced crystallization of polymer, deformation of nanoparticle filler network in rubber composite and necking propagation in tensile stretch, current work attempts to demonstrate the advantages of in situ synchrotron radiation X-ray scattering, X-ray nano-CT and infrared imaging in the study of deformation-induced multi-scale structural evolutions of polymers. With time resolution up to sub-ms, synchrotron radiation is expected to play a great role in understanding non-equilibrium polymer physics under processing and service conditions, while high-throughput characterization platform based on synchrotron radiation opens the possibility to establish polymer Materials Genome database in processing parameter space within reasonable time, which can serve as the roadmap for industrial polymer processing and accelerate material innovation.展开更多
Semiconductor materials exemplify humanity's unwavering pursuit of enhanced performance,efficiency,and functionality in electronic devices.From its early iterations to the advanced variants of today,this field has...Semiconductor materials exemplify humanity's unwavering pursuit of enhanced performance,efficiency,and functionality in electronic devices.From its early iterations to the advanced variants of today,this field has undergone an extraordinary evolution.As the reliability requirements of integrated circuits continue to increase,the industry is placing greater emphasis on the crystal qualities.Consequently,conducting a range of characterization tests on the crystals has become necessary.This paper will examine the correlation between crystal quality,device performance,and production yield,emphasizing the significance of crystal characterization tests and the important role of high-precision synchrotron radiation X-ray topography characterization in semiconductor analysis.Finally,we will cover the specific applications of synchrotron radiation characterization in the development of semiconductor materials.展开更多
基金supported by the National Natural Science Foundation of China (Grant Nos. 10974174 and 60676003)
文摘The energy band structure with type-I alignment at the PbTe/CdTe（111） heterojunction interface is determined by the ultraviolet photoelectron spectrum using synchrotron radiation. The valence band and conduction band offsets are obtained to be 0.09±0.12 and 1.19±0.12 eV, respectively. These results are in agreement with theoretically predicted ones. The accurate determination of the valence band and conduction band offsets is useful for the fundamental understanding of the mid-infrared light emission from the PbTe/CdTe heterostructures and its application in devices.
基金supported by the Shanghai Municipal Science and Technology Major Project(No.2017SHZDZX02)the National Natural Science Foundation of China(No.12205360)the Youth Innovation Promotion Association of the Chinese Academy of Sciences(No.2018297)。
文摘We report on using synthetic silicon for a high-precision X-ray polarimeter comprising a polarizer and an analyzer,each based on a monolithic channel-cut crystal used at multiple Brewster reflections with a Bragg angle very close to 45°.Experiments were performed at the BL09B bending magnet beamline of the Shanghai Synchrotron Radiation Facility using a Si(800)crystal at an X-ray energy of 12.914 keV.A polarization purity of 8.4×10^(-9)was measured.This result is encouraging,as the measured polarization purity is the best-reported value for the bending magnet source.Notably,this is the firstly systematic study on the hard X-ray polarimeter in China,which is crucial for exploring new physics,such as verifying vacuum birefringence.
基金financially supported by the National Natural Science Foundation of China (No. 51633009)
文摘Synchrotron radiation （SR） provides highly brilliant light with tunable wavelength from hard X-ray to far infrared, on which scattering, spectroscopy and imaging techniques with high time and spatial resolutions have been developed for in situ study on biological system and materials like polymer. With examples on flow-induced crystallization of polymer, deformation of nanoparticle filler network in rubber composite and necking propagation in tensile stretch, current work attempts to demonstrate the advantages of in situ synchrotron radiation X-ray scattering, X-ray nano-CT and infrared imaging in the study of deformation-induced multi-scale structural evolutions of polymers. With time resolution up to sub-ms, synchrotron radiation is expected to play a great role in understanding non-equilibrium polymer physics under processing and service conditions, while high-throughput characterization platform based on synchrotron radiation opens the possibility to establish polymer Materials Genome database in processing parameter space within reasonable time, which can serve as the roadmap for industrial polymer processing and accelerate material innovation.
基金This work was supported by Youth Innovation Promotion Association CAS,National Natural Science Foundation of China(Grant No.11705263)Shanghai Rising-Star Program(Grant No.21QA1410900)。
文摘Semiconductor materials exemplify humanity's unwavering pursuit of enhanced performance,efficiency,and functionality in electronic devices.From its early iterations to the advanced variants of today,this field has undergone an extraordinary evolution.As the reliability requirements of integrated circuits continue to increase,the industry is placing greater emphasis on the crystal qualities.Consequently,conducting a range of characterization tests on the crystals has become necessary.This paper will examine the correlation between crystal quality,device performance,and production yield,emphasizing the significance of crystal characterization tests and the important role of high-precision synchrotron radiation X-ray topography characterization in semiconductor analysis.Finally,we will cover the specific applications of synchrotron radiation characterization in the development of semiconductor materials.
