本文主要说明了淀积型多芯片组件(MCM-D)技术所使用的主要材料的热特性。此技术采用倒装片技术把硅芯片安装到硅基板上。阐述了薄膜电阻和接触电阻的测量与所使用金属的温度范围-28℃-100℃的比较。一套典型的试验结构诸如开尔文接触、...本文主要说明了淀积型多芯片组件(MCM-D)技术所使用的主要材料的热特性。此技术采用倒装片技术把硅芯片安装到硅基板上。阐述了薄膜电阻和接触电阻的测量与所使用金属的温度范围-28℃-100℃的比较。一套典型的试验结构诸如开尔文接触、横桥电阻(CBR)及Van der Pauw 结构不仅已用于此技术,而且为了测试通过球倒装片连接的接触电阻,采用一新的开尔文式结构。已获得MCM封装的热模型,并考虑由此类封装增加的所有的热电阻。展开更多
Sulfonic acid groups were grafted onto three different types of synthesized magnetic nanoparticles, namely Fe3O4, Fe3O4@SiO2, and Fe3O4@MCM-48. The sulfonic acid-functionalized nanoparticles were evaluated as catalyst...Sulfonic acid groups were grafted onto three different types of synthesized magnetic nanoparticles, namely Fe3O4, Fe3O4@SiO2, and Fe3O4@MCM-48. The sulfonic acid-functionalized nanoparticles were evaluated as catalysts for the synthesis of 5-aryl-1H-benzo[f]chromeno[2,3-d]pyrimidine-2,4(3H,5H)-dione derivatives in terms of activity and recyclability. Their catalytic activities were compared with that of the homogeneous acid catalyst 1-methylimidazolium hydrogen sulfate([HMIm][HSO4]). The activity of Fe3O4@MCM-48–SO3H was comparable to those of the other heter-ogeneous and homogeneous catalysts.展开更多
文摘本文主要说明了淀积型多芯片组件(MCM-D)技术所使用的主要材料的热特性。此技术采用倒装片技术把硅芯片安装到硅基板上。阐述了薄膜电阻和接触电阻的测量与所使用金属的温度范围-28℃-100℃的比较。一套典型的试验结构诸如开尔文接触、横桥电阻(CBR)及Van der Pauw 结构不仅已用于此技术,而且为了测试通过球倒装片连接的接触电阻,采用一新的开尔文式结构。已获得MCM封装的热模型,并考虑由此类封装增加的所有的热电阻。
基金supported by Islamic Azad University, Rasht Branch
文摘Sulfonic acid groups were grafted onto three different types of synthesized magnetic nanoparticles, namely Fe3O4, Fe3O4@SiO2, and Fe3O4@MCM-48. The sulfonic acid-functionalized nanoparticles were evaluated as catalysts for the synthesis of 5-aryl-1H-benzo[f]chromeno[2,3-d]pyrimidine-2,4(3H,5H)-dione derivatives in terms of activity and recyclability. Their catalytic activities were compared with that of the homogeneous acid catalyst 1-methylimidazolium hydrogen sulfate([HMIm][HSO4]). The activity of Fe3O4@MCM-48–SO3H was comparable to those of the other heter-ogeneous and homogeneous catalysts.