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Design,fabrication,and testing of an X-band 9-MeV standing-wave electron linear accelerator 被引量:1
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作者 Jian Gao Hao Zha +5 位作者 Jia-Ru Shi Qiang Gao Xian-Cai Lin Fang-Jun Hu Qing-Zhu Li Huai-Bi Chen 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2023年第7期219-230,共12页
In this study,an X-band standing-wave biperiodic linear accelerator was developed for medical radiotherapy that can accel-erate electrons to 9 MeV using a 2.4-MW klystron.The structure works atπ/2 mode and adopts mag... In this study,an X-band standing-wave biperiodic linear accelerator was developed for medical radiotherapy that can accel-erate electrons to 9 MeV using a 2.4-MW klystron.The structure works atπ/2 mode and adopts magnetic coupling between cavities,generating the appropriate adjacent mode separation of 10 MHz.The accelerator is less than 600-mm long and constitutes four bunching cells and 29 normal cells.Geometry optimizations,full-scale radiofrequency(RF)simulations,and beam dynamics calculations were performed.The accelerator was fabricated and examined using a low-power RF test.The cold test results showed a good agreement with the simulation and actual measurement results.In the high-power RF test,the output beam current,energy spectrum,capture ratio,and spot size at the accelerator exit were measured.With the input power of 2.4 MW,the pulse current was 100 mA,and the output spot root-mean-square radius was approximately 0.5 mm.The output kinetic energy was 9.04 MeV with the spectral FWHM of 3.5%,demonstrating the good performance of this accelerator. 展开更多
关键词 Standing-wave accelerating structure RF analysis thermal DC gun Low-power RF test High-power experiment
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DC Characteristics of Lattice-Matched InAlN/AlN/GaN High Electron Mobility Transistors 被引量:2
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作者 谢生 冯志红 +3 位作者 刘波 敦少博 毛陆虹 张世林 《Transactions of Tianjin University》 EI CAS 2013年第1期43-46,共4页
Lattice-matched InAlN/AlN/GaN high electron mobility transistors (HEMTs) grown on sapphire substrate by using low-pressure metallorganic chemical vapor deposition were prepared, and the comprehensive DC characteristic... Lattice-matched InAlN/AlN/GaN high electron mobility transistors (HEMTs) grown on sapphire substrate by using low-pressure metallorganic chemical vapor deposition were prepared, and the comprehensive DC characteristics were implemented by Keithley 4200 Semiconductor Characterization System. The experimental results indicated that a maximum drain current over 400 mA/mm and a peak external transconductance of 215 mS/mm can be achieved in the initial HEMTs. However, after the devices endured a 10-h thermal aging in furnace under nitrogen condition at 300 ℃, the maximum reduction of saturation drain current and external transconductance at high gate-source voltage and drain-source voltage were 30% and 35%, respectively. Additionally, an increased drain-source leakage current was observed at three-terminal off-state. It was inferred that the degradation was mainly related to electron-trapping defects in the InAlN barrier layer. 展开更多
关键词 indium aluminum nitride gallium nitride sapphire metallorganic chemical vapor deposition high electron mobility transistor DC characteristic thermal aging
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