Near-field scanning optical microscopy is used to investigate the waveguiding properties of optical micro/nanofibres （MNFs） by means of detecting optical power carried by evanescent waves. Taper drawn silica and tel...Near-field scanning optical microscopy is used to investigate the waveguiding properties of optical micro/nanofibres （MNFs） by means of detecting optical power carried by evanescent waves. Taper drawn silica and tellurite MNFs, supported on low-index substrates, are used to guide a 532-nm-wavelength light beam for the test. Modification of the single-mode condition of the MNF in the presence of a substrate is observed. Spatial modulation of the longitudinal field intensity （with a 195-nm period） near the output end of a 760-nm-diameter silica MNF is well resolved. Energy exchange through evanescent coupling between two parallel MNFs is also investigated.展开更多
基金Supported by the National Natural Science Foundation of China under Grant Nos 60425517 and 60378036.
文摘Near-field scanning optical microscopy is used to investigate the waveguiding properties of optical micro/nanofibres （MNFs） by means of detecting optical power carried by evanescent waves. Taper drawn silica and tellurite MNFs, supported on low-index substrates, are used to guide a 532-nm-wavelength light beam for the test. Modification of the single-mode condition of the MNF in the presence of a substrate is observed. Spatial modulation of the longitudinal field intensity （with a 195-nm period） near the output end of a 760-nm-diameter silica MNF is well resolved. Energy exchange through evanescent coupling between two parallel MNFs is also investigated.
