With the 2008 Ms6.1 Panzhihua earthquake as a case study, we demonstrate that the focal depth of the main shock can be well constrained with two approaches： （1） using the depth phase sPL and （2） using full wavefo...With the 2008 Ms6.1 Panzhihua earthquake as a case study, we demonstrate that the focal depth of the main shock can be well constrained with two approaches： （1） using the depth phase sPL and （2） using full waveform inversion of local and teleseismic data. We also show that focal depths can be well constrained using the depth phase sPL with single broadband seismic station. Our study indicates that the main shock is located at a depth of ii kin, much shallower than those from other studies, confirming that the earthquake occurs in upper crust. Aftershocks are located in the depth range of 11 16 kin, which is consistent with a ruptured near vertical fault whose width is about 10 km, as expected for an Ms6.1 earthquake.展开更多
Digital structured light （SL） profilometry is increasingly used in three-dimensional （3D） measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measure...Digital structured light （SL） profilometry is increasingly used in three-dimensional （3D） measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measurement accuracy. In this paper, first, we review the nonlinear effects of the projector-camera system in the phase-shifting structured light depth measurement method. We show that high order harmonic wave components lead to phase error in the phase-shifting method. Then a practical method based on frequency domain filtering is proposed for nonlinear error reduction. By using this method, the nonlinear calibration of the SL system is not required. Moreover, both the nonlinear effects of the projector and the camera can be effectively reduced. The simulations and experiments have verified our nonlinear correction method.展开更多
Locating an earthquakes focal depth is always a key project in seismology. Precise focal depth is of critical importance for evaluating seismic hazards, deciphering dynamic mechanisms of earthquake generating,estima...Locating an earthquakes focal depth is always a key project in seismology. Precise focal depth is of critical importance for evaluating seismic hazards, deciphering dynamic mechanisms of earthquake generating,estimating aftershock evolutions and risk,as well as monitoring nuclear tests. However,how we determine an accurate focal depth is always a challenge in seismological studies. Aiming to solve these problems, we analyzed and summarized the present status and the future development of earthquake focal depth locating. In this paper we first reviewed the present status of focal depth locating in the world,and summarized the frequently-used relocating methods and ideas at present,and introduced two types of focal depth relocating ideas: arrival time relocating and waveform modeling methods. For these ideas,we systematically described the S-P and the Pn-Pg methods that belong to arrival time method,and polarization focal depth locating and amplitude focal depth locating that belongs to waveform modeling,and further analyzed the advantages and limitations of these methods. Since the depth phase methods are highly sensitive to focal depth,and are relatively free from the uncertainties of crustal models,we mainly reviewed the depth phases of s Pm P,s PL,s Pn,and s Sn,and quantitatively evaluated their availabilities and characteristics. Second,we also discussed the effects of crustal velocity models on the reliability of focal depth locating,and reviewed the advancements of seismic tomography techniques over recent years. Finally,based on the present status of the progress on the focal depth locating,and studies of seismic velocity structures,we proposed an idea of combining multiple datasets and relocating methods,jointly utilizing seismologic and geodetic techniques to relocate focal depth,which should be the major research field in investigating focal depth and source parameters in the near future.展开更多
A review of our experience in range of electron spectroscopy of the physical vapor-phase deposition and growth of single- and multilayer nanostructures with atomic scale interfaces is presented. The foundation of an i...A review of our experience in range of electron spectroscopy of the physical vapor-phase deposition and growth of single- and multilayer nanostructures with atomic scale interfaces is presented. The foundation of an innovative methodology for the combined AES-EELS analysis of layered nanostructures is developed. The methodology includes: 1) determination of the composition, thickness, and the mechanism of phase transitions in nanocoatings under the probing depth most appropriated for the range of film thickness 1 - 10 ML;2) quantitative iteration Auger-analysis of the composition, thickness and growth mechanism of nanocoating;3) structural and phase analysis of nanocoatings with use of the analysis of position, shape and energy of the plasmon EELS peak and with subtracting the contribution from the substrate;4) analysis of phase transitions with use of the shift of the plasmon Auger-satellite and 5) non-destructive profiling of the composition of nanocoatings over depth with use of a dependence of the intensity and energy of EELS peaks on the value of the primary electron energy.展开更多
基金financial supported by Joint Seismological Science Foundation of China (No.200808078)National Natural Science Foundation of China (Nos.40821160549 and 41074032)
文摘With the 2008 Ms6.1 Panzhihua earthquake as a case study, we demonstrate that the focal depth of the main shock can be well constrained with two approaches： （1） using the depth phase sPL and （2） using full waveform inversion of local and teleseismic data. We also show that focal depths can be well constrained using the depth phase sPL with single broadband seismic station. Our study indicates that the main shock is located at a depth of ii kin, much shallower than those from other studies, confirming that the earthquake occurs in upper crust. Aftershocks are located in the depth range of 11 16 kin, which is consistent with a ruptured near vertical fault whose width is about 10 km, as expected for an Ms6.1 earthquake.
基金Project supported by the Science and Technology Major Projects of Zhejiang Province,China(Grant No.2013C03043-5)
文摘Digital structured light （SL） profilometry is increasingly used in three-dimensional （3D） measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measurement accuracy. In this paper, first, we review the nonlinear effects of the projector-camera system in the phase-shifting structured light depth measurement method. We show that high order harmonic wave components lead to phase error in the phase-shifting method. Then a practical method based on frequency domain filtering is proposed for nonlinear error reduction. By using this method, the nonlinear calibration of the SL system is not required. Moreover, both the nonlinear effects of the projector and the camera can be effectively reduced. The simulations and experiments have verified our nonlinear correction method.
基金supported by a grant from the National Earthquake Predicting Field in Sichuan and Yunnan(No.2016CESE0204).
文摘Locating an earthquakes focal depth is always a key project in seismology. Precise focal depth is of critical importance for evaluating seismic hazards, deciphering dynamic mechanisms of earthquake generating,estimating aftershock evolutions and risk,as well as monitoring nuclear tests. However,how we determine an accurate focal depth is always a challenge in seismological studies. Aiming to solve these problems, we analyzed and summarized the present status and the future development of earthquake focal depth locating. In this paper we first reviewed the present status of focal depth locating in the world,and summarized the frequently-used relocating methods and ideas at present,and introduced two types of focal depth relocating ideas: arrival time relocating and waveform modeling methods. For these ideas,we systematically described the S-P and the Pn-Pg methods that belong to arrival time method,and polarization focal depth locating and amplitude focal depth locating that belongs to waveform modeling,and further analyzed the advantages and limitations of these methods. Since the depth phase methods are highly sensitive to focal depth,and are relatively free from the uncertainties of crustal models,we mainly reviewed the depth phases of s Pm P,s PL,s Pn,and s Sn,and quantitatively evaluated their availabilities and characteristics. Second,we also discussed the effects of crustal velocity models on the reliability of focal depth locating,and reviewed the advancements of seismic tomography techniques over recent years. Finally,based on the present status of the progress on the focal depth locating,and studies of seismic velocity structures,we proposed an idea of combining multiple datasets and relocating methods,jointly utilizing seismologic and geodetic techniques to relocate focal depth,which should be the major research field in investigating focal depth and source parameters in the near future.
文摘为了保证液体火箭发动机喷注器的安全性能,文中针对其复杂结构电子束焊缝,基于超声相控阵相对时间到达技术开展了焊缝熔深的定量检测方法研究,提出了水浸式相对时间到达技术检测方法;搭建了实验系统并利用CIVA仿真软件进行了检测仿真;根据喷注器截面结构设计制作了两种检测试样并对试样进行了检测实验;将焊接试样的超声检测结果与金相检测结果进行对比,验证了检测方法的有效性.采用水浸式相对时间到达技术可克服喷注器检测面尺寸小且存在凹槽难以检测的问题,实现其电子束焊缝熔深的定量检测,检测精度优于0.15 mm.
文摘A review of our experience in range of electron spectroscopy of the physical vapor-phase deposition and growth of single- and multilayer nanostructures with atomic scale interfaces is presented. The foundation of an innovative methodology for the combined AES-EELS analysis of layered nanostructures is developed. The methodology includes: 1) determination of the composition, thickness, and the mechanism of phase transitions in nanocoatings under the probing depth most appropriated for the range of film thickness 1 - 10 ML;2) quantitative iteration Auger-analysis of the composition, thickness and growth mechanism of nanocoating;3) structural and phase analysis of nanocoatings with use of the analysis of position, shape and energy of the plasmon EELS peak and with subtracting the contribution from the substrate;4) analysis of phase transitions with use of the shift of the plasmon Auger-satellite and 5) non-destructive profiling of the composition of nanocoatings over depth with use of a dependence of the intensity and energy of EELS peaks on the value of the primary electron energy.
