This paper presents a theoretical study of wavelength dependence four-wave-mixing (FWM) spectroscopy in a micrometric thin atomic vapour. It compares three cases termed as mismatched case I, matched case and mismatc...This paper presents a theoretical study of wavelength dependence four-wave-mixing (FWM) spectroscopy in a micrometric thin atomic vapour. It compares three cases termed as mismatched case I, matched case and mismatched case II for the probe wavelength less, equal and greater than the pump wavelength respectively. It finds that Dicke- narrowing can overcome width broadening induced by Doppler effects and polarisation interference of thermal atoms, and high resolution FWM spectra can be achieved both in matched and mismatched wavelength for many cases. It also finds that the magnitude of the FWM signal can be dramatically modified to be suppressed or to be enhanced in comparison with that of matched wavelength in mismatched case I or II. The width narrowing and the magnitude suppression or enhancement can be demonstrated by considering enhanced contribution of slow atoms induced by atom-wall collision and transient effect of atom-light interaction in a micrometric thin vapour.展开更多
We have investigated coexisting four-wave mixing and six-wave mixing (SWM) in ultra-thin, micrometre and long vapour cells. There exists competition between Dicke-narrowing features and polarization interference in ...We have investigated coexisting four-wave mixing and six-wave mixing (SWM) in ultra-thin, micrometre and long vapour cells. There exists competition between Dicke-narrowing features and polarization interference in the micrometre cell. The oscillation behaviour of SWM signal intensities and linewidths results from destructive interference. With a larger destructive interference, the SWM signal in ultra-thin cells shows a narrow spectrum, in contrast to the long cell case. Due to the Dicke-narrowing features, a narrow spectrum can be obtained, and such spectra can be used for high precision measurements and metrological standards.展开更多
基金supported from the Major Program of Science Foundation of Xi’an University of Arts and Science
文摘This paper presents a theoretical study of wavelength dependence four-wave-mixing (FWM) spectroscopy in a micrometric thin atomic vapour. It compares three cases termed as mismatched case I, matched case and mismatched case II for the probe wavelength less, equal and greater than the pump wavelength respectively. It finds that Dicke- narrowing can overcome width broadening induced by Doppler effects and polarisation interference of thermal atoms, and high resolution FWM spectra can be achieved both in matched and mismatched wavelength for many cases. It also finds that the magnitude of the FWM signal can be dramatically modified to be suppressed or to be enhanced in comparison with that of matched wavelength in mismatched case I or II. The width narrowing and the magnitude suppression or enhancement can be demonstrated by considering enhanced contribution of slow atoms induced by atom-wall collision and transient effect of atom-light interaction in a micrometric thin vapour.
基金Project supported by the National Natural Science Foundation of China (Grant No 60678005)the Foundation for the Author of National Excellent Doctoral Dissertation of China (Grant No 200339)+1 种基金the Fok Ying-Tong Education Foundation for Young Teachers in the Institutions of Higher Education of China (Grant No 101061)NCET-08-0431
文摘We have investigated coexisting four-wave mixing and six-wave mixing (SWM) in ultra-thin, micrometre and long vapour cells. There exists competition between Dicke-narrowing features and polarization interference in the micrometre cell. The oscillation behaviour of SWM signal intensities and linewidths results from destructive interference. With a larger destructive interference, the SWM signal in ultra-thin cells shows a narrow spectrum, in contrast to the long cell case. Due to the Dicke-narrowing features, a narrow spectrum can be obtained, and such spectra can be used for high precision measurements and metrological standards.