SPLIT-ADC BASED DIGITAL BACKGROUND CALIBRATION FOR TIME-INTERLEAVED ADC

A novel Time-Interleaved Analog-to-Digital Converter (TIADC) digital background calibration for the mismatches of offsets, gain errors, and timing skews based on split-ADC is proposed. Firstly, the split-ADC channels in present TIADC architecture are designed to convert input signal at two different channel sampling rates so that redundant channel to facilitate pair permutation is avoided. Secondly, a high-order compensation scheme for correction of timing skew error is employed for effective calibration to preserve high-resolution when input frequency is high. Numerical simulation performed by MATLAB for a 14-bit TIADC based on 7 split-ADC channels shows that Signal-to-Noise and Distortion Ratio (SNDR) and Spurious Free Dynamic Range (SFDR) of the TIADC achieve 86.2 dBc and 106 dBc respectively after calibration with normalized input frequency near Nyquist frequency.

A 14-bit 500-MS/s DAC with digital background calibration

Thelinearityofcurrent-steeringdigital-to-analogconverters（DACs）atlowsignalfrequenciesismainly limited by matching properties of current sources, so large-size current source arrays are widely used for better matching. This, however, results in large gradient errors and parasitic capacitance, which degrade the spurious free dynamic range（SFDR） for high-frequency signals. To overcome this problem, calibration is an effective method.In this paper, a digital background calibration technique for current-steering DACs is presented and verified by a 14-bit DAC in a 0.13 m standard CMOS process. The measured differential nonlinearity（DNL） and integral nonlinearity（INL） are 0.4 LSB and 1.2 LSB, respectively. At 500-MS/s, the SFDR is 70 dB and 50.3 dB for signals of 5.4 MHz and 224 MHz, respectively. The core area is 0.69 mm2and the power consumption is 165 mW from a mixed power supply with 1.2 V and 3.3 V.

A fast combination calibration of foreground and background for pipelined ADCs

This paper describes a fast digital calibration scheme for pipelined analog-to-digital converters（ADCs）. The proposed method corrects the nonlinearity caused by finite opamp gain and capacitor mismatch in multiplying digital-to-analog converters（MDACs）.The considered calibration technique takes the advantages of both foreground and background calibration schemes.In this combination calibration algorithm,a novel parallel background calibration with signal-shifted correlation is proposed,and its calibration cycle is very short.The details of this technique are described in the example of a 14-bit 100 Msample/s pipelined ADC.The high convergence speed of this background calibration is achieved by three means.First,a modified 1.5-bit stage is proposed in order to allow the injection of a large pseudo-random dithering without missing code.Second,before correlating the signal,it is shifted according to the input signal so that the correlation error converges quickly.Finally,the front pipeline stages are calibrated simultaneously rather than stage by stage to reduce the calibration tracking constants.Simulation results confirm that the combination calibration has a fast startup process and a short background calibration cycle of 2×2^（21） conversions.