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Anisotropy of Trabecular Bone from Ultra-Distal Radius Digital X-Ray Imaging: Effects on Bone Mineral Density and Age
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作者 Jian-Feng Chen 《Open Journal of Radiology》 2024年第1期14-23,共10页
Background: When applied to trabecular bone X-ray images, the anisotropic properties of trabeculae located at ultra-distal radius were investigated by using the trabecular bone scores (TBS) calculated along directions... Background: When applied to trabecular bone X-ray images, the anisotropic properties of trabeculae located at ultra-distal radius were investigated by using the trabecular bone scores (TBS) calculated along directions parallel and perpendicular to the forearm. Methodology: Data from more than two hundred subjects were studied retrospectively. A DXA (GE Lunar Prodigy) scan of the forearm was performed on each subject to measure the bone mineral density (BMD) value at the location of ultra-distal radius, and an X-ray digital image of the same forearm was taken on the same day. The values of trabecular bone score along the direction perpendicular to the forearm, TBS<sub>x</sub>, and along the direction parallel to the forearm, TBS<sub>y</sub>, were calculated respectively. The statistics of TBS<sub>x</sub> and TBS<sub>y</sub> were calculated, and the anisotropy of the trabecular bone, which was defined as the ratio of TBS<sub>y</sub> to TBS<sub>x</sub> and changed with subjects’ BMD and age, was reported and analyzed. Results: The results show that the correlation coefficient between TBS<sub>x</sub> and TBS<sub>y</sub> was 0.72 (p BMD and age was reported. The results showed that decreased trabecular bone anisotropy was associated with deceased BMD and increased age in the subject group. Conclusions: This study shows that decreased trabecular bone anisotropy was associated with decreased BMD and increased age. 展开更多
关键词 ANISOTROPY Trabecular Bone Score Bone Mineral Density Ultra-Distal Radius digital x-ray Image
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Rapid digitalization and panoramic evaluation of weld X-ray film
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作者 闫志鸿 宋永伦 +1 位作者 王彬 李元香 《China Welding》 EI CAS 2011年第1期49-53,共5页
The computer evaluation of weld X-ray film is an attractive technique for weld seam NDT ( nondestructive testing). To achieve this target, digitalization of film is the first step and automatic defect identification... The computer evaluation of weld X-ray film is an attractive technique for weld seam NDT ( nondestructive testing). To achieve this target, digitalization of film is the first step and automatic defect identification is another key technique. In this paper, a weld X-ray film digitalizing system has been established with linear array CCD and highlight LED light source. Its space resolution can reach 0. 04 mm/pixel and scanning speed can reach 100 mm/s for an industrial film. The transfer function curves of the system have been measured and the results indicate that its image gray resolution can reach 88 G/D at 4. 5D, and its dynamic range can be wider than 2. OD. In order to facilitate the evaluation of large welded structure, a panoramic evaluation algorithm is developed also. The algorithm includes image matching, image fusion and panoramic evaluation of the long linked film image. 展开更多
关键词 weld x-ray film rapid digitalization image processing panoramic evaluation
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Metal-Halide Perovskite Submicrometer-Thick Films for Ultra-Stable Self-Powered Direct X-Ray Detectors 被引量:1
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作者 Marco Girolami Fabio Matteocci +7 位作者 Sara Pettinato Valerio Serpente Eleonora Bolli Barbara Paci Amanda Generosi Stefano Salvatori Aldo Di Carlo Daniele M.Trucchi 《Nano-Micro Letters》 SCIE EI CAS CSCD 2024年第9期410-431,共22页
Metal-halide perovskites are revolutionizing the world of X-ray detectors,due to the development of sensitive,fast,and cost-effective devices.Self-powered operation,ensuring portability and low power consumption,has a... Metal-halide perovskites are revolutionizing the world of X-ray detectors,due to the development of sensitive,fast,and cost-effective devices.Self-powered operation,ensuring portability and low power consumption,has also been recently demonstrated in both bulk materials and thin films.However,the signal stability and repeatability under continuous X-ray exposure has only been tested up to a few hours,often reporting degradation of the detection performance.Here it is shown that self-powered direct X-ray detectors,fabricated starting from a FAPbBr_(3)submicrometer-thick film deposition onto a mesoporous TiO_(2)scaffold,can withstand a 26-day uninterrupted X-ray exposure with negligible signal loss,demonstrating ultra-high operational stability and excellent repeatability.No structural modification is observed after irradiation with a total ionizing dose of almost 200 Gy,revealing an unexpectedly high radiation hardness for a metal-halide perovskite thin film.In addition,trap-assisted photoconductive gain enabled the device to achieve a record bulk sensitivity of 7.28 C Gy^(−1)cm^(−3)at 0 V,an unprecedented value in the field of thin-film-based photoconductors and photodiodes for“hard”X-rays.Finally,prototypal validation under the X-ray beam produced by a medical linear accelerator for cancer treatment is also introduced. 展开更多
关键词 Metal-halide perovskite thin films Direct x-ray detectors Self-powered devices Operational stability Medical linear accelerator
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Full-field mapping of internal strain distribution in red sandstone specimen under compression using digital volumetric speckle photography and X-ray computed tomography 被引量:5
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作者 Lingtao Mao Jianping Zuo +1 位作者 Zexun Yuan Fu-Pen Chiang 《Journal of Rock Mechanics and Geotechnical Engineering》 SCIE CSCD 2015年第2期136-146,共11页
It is always desirable to know the interior deformation pattern when a rock is subjected to mechanicalload. Few experimental techniques exist that can represent full-field three-dimensional (3D) straindistribution i... It is always desirable to know the interior deformation pattern when a rock is subjected to mechanicalload. Few experimental techniques exist that can represent full-field three-dimensional (3D) straindistribution inside a rock specimen. And yet it is crucial that this information is available for fully understandingthe failure mechanism of rocks or other geomaterials. In this study, by using the newlydeveloped digital volumetric speckle photography (DVSP) technique in conjunction with X-ray computedtomography (CT) and taking advantage of natural 3D speckles formed inside the rock due to materialimpurities and voids, we can probe the interior of a rock to map its deformation pattern under load andshed light on its failure mechanism. We apply this technique to the analysis of a red sandstone specimenunder increasing uniaxial compressive load applied incrementally. The full-field 3D displacement fieldsare obtained in the specimen as a function of the load, from which both the volumetric and the deviatoricstrain fields are calculated. Strain localization zones which lead to the eventual failure of the rock areidentified. The results indicate that both shear and tension are contributing factors to the failuremechanism. 2015 Institute of Rock and Soil Mechanics, Chinese Academy of Sciences. Production and hosting byElsevier B.V. All rights reserved. 展开更多
关键词 Red sandstone Strain localization Uniaxial compression digital volumetric speckle photography(DVSP) x-ray micro-tomography
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A Novel Method for Detection and Removal of Line Scratch in High Resolution Digital Film
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作者 周磊 倪强 周源华 《Journal of Shanghai Jiaotong university(Science)》 EI 2006年第1期22-26,共5页
With increasing need of high quality movie, more and more standard resolution films are upconverted to the high-resolution films. After this operation, the defects exist in the old movie are more obvious because they ... With increasing need of high quality movie, more and more standard resolution films are upconverted to the high-resolution films. After this operation, the defects exist in the old movie are more obvious because they are enlarged in size, therefore, an efficient artifacts detection method with more precise result and lower computational complexity is in need. This paper provided a line scratch mathematical model, which derives from the Kokaram model and Bruni model, and then gave a detection method to meet the requirements of the high-resolution video application. 展开更多
关键词 digital film restoration line scratch scratch detection scratch removal
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The Challenges of Microelectronics for the Future Digital Society: The Roles of Thin Film Technologies and of the Higher Education
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作者 O. Bonnaud 《Journal of Materials Science and Chemical Engineering》 2019年第12期47-56,共10页
The new digital society is based on Internet of Things (IoT) and related connected objects are becoming more prevalent around the world. This evolution implies innovation in many areas of technology, the heart of whic... The new digital society is based on Internet of Things (IoT) and related connected objects are becoming more prevalent around the world. This evolution implies innovation in many areas of technology, the heart of which is microelectronics. Connected objects involve many technological components and functions that are directly dependent of the microelectronics capabilities. If the perspectives are exciting, several challenges are appearing. The first is related to the energy consumption of all these objects, which will become enormous by 2030, and unrealistic by 2040. The second is human resources concern. The future engineers and PhD will have many obstacles to overcome. A way to face these challenges is to involve more and more new thin film technologies that must be combined with VLSI ones, and to better train students to this domain with enough know-how and with a large spectrum of knowledge suitable for multidisciplinary applications. The French national network for Higher Education in microelectronics has adopted this strategy. After presentation of the challenges, this paper deals with the innovative activities of the French network focused on thin film technologies, in order to face the challenges in a short future. 展开更多
关键词 MICROELECTRONICS THIN film TECHNOLOGIES digital SOCIETY CHALLENGES Higher Education THIN film MICROELECTRONICS Devices and Systems
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Application of X-ray digital tomosynthesis in knee joint trauma examination
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作者 Li-Sheng Wu You-Jun Lin +1 位作者 Xiao-Ling Yi Hai-Na Xu 《Journal of Hainan Medical University》 2018年第7期84-86,共3页
Objective: To explore the clinical value of X-ray digital tomosynthesis(DTS)in the diagnosis of knee joint fractures. Methods: A total of 28 cases of thoracic trauma, X-ray film cannot be clearly diagnosed or can conf... Objective: To explore the clinical value of X-ray digital tomosynthesis(DTS)in the diagnosis of knee joint fractures. Methods: A total of 28 cases of thoracic trauma, X-ray film cannot be clearly diagnosed or can confirm the diagnosis but the need for further identification of forensic diagnosis of cases of DTS scan and three-dimensional reconstruction in order to control the study. Results: 1. The reconstructed images after DTS scanning showed that the knee joint fractures were clearly diagnosed, and the detection rate of 28 knee joint fractures was 92.86%. 2. DTS scanning could clearly detect the fresh knee joint fracture's fracture line, corresponding line and broken bones. For the old fracture, DTS scanning could clearly show the condition of the fracture end's healing. Conclusions: The technique is of great value in the diagnosis of knee joint fracture, especially in the examination of complex structure, thick body and review of internal fixation after fracture. 展开更多
关键词 x-ray KNEE joint digital TOMOSYNTHESIS Fracture Diagnosis
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Research on Influence of Electromagnetic Interference on X-Ray Digital Detection
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作者 Guo Taotao Wang Dada +1 位作者 Guo Tieqiao Yu Hong 《Electricity》 2012年第5期38-43,共6页
X-ray digital imaging technology has found wide application owing to its advantages of real-time, visualization and rapid imaging. In substations the substantial electromagnetic interference has some influence on the ... X-ray digital imaging technology has found wide application owing to its advantages of real-time, visualization and rapid imaging. In substations the substantial electromagnetic interference has some influence on the live detection by the X-ray digital imaging technology, hindering the promotion of the technology in the detection of electric equipment. Based on a large number of field tests, the author carded out a series of researches on electromagnetic interference protection measures, image de-noising, and image enhancement algorithms. 展开更多
关键词 SUBSTATION live detection x-ray digital imaging electromagnetic interference image de-noising image enhancement
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Imaging Analysis of Trabecular Bone Texture Based on the Initial Slope of Variogram of Ultra-Distal Radius Digital X-Ray Imaging: Effects on Bone Mineral Density and Age
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作者 Jianfeng Chen Qifeng Ying 《Open Journal of Radiology》 2022年第3期78-85,共8页
Background: When applied to trabecular bone X-ray images, a method for analyzing trabecular bone texture based on the initial slope of variogram (ISV) was used to assess the trabecular bone health. Methodology: Data f... Background: When applied to trabecular bone X-ray images, a method for analyzing trabecular bone texture based on the initial slope of variogram (ISV) was used to assess the trabecular bone health. Methodology: Data from more than two hundred subjects were retrospectively studied. For each subject, a DXA (GE Lunar Prodigy) scan of the forearm was performed, and bone mineral density (BMD) value was measured at the location of ultra-distal radius, X-ray digital image of the same forearm was taken on the same day, and ISV value over the same location of ultra-distal radius was calculated. Pearson’s correlation coefficients were calculated to examine the correlation between BMD and ISV of the trabecular bones located at the same ultra-distal radius. ISV values changed with subjects’ age were also reported. Results: The results show that ISV value was highly correlated with the DXA-measured BMD of the same trabecular bone located at the ultra-distal radius. The correlation coefficient between ISV and BMD with the 95% confident was 0.79 ± 0.09. They also demonstrated that the age-related changes in trabecular bone health and differentiated age patterns in males and females, respectively. The results showed that the decrease in BMD was accompanied by a decrease in the initial slope of variogram (ISV). Conclusions: This study suggests that ISV might be used to quantitatively evaluate trabecular health for osteoporosis and bone disease diagnosis. 展开更多
关键词 Trabecular Bone Texture digital x-ray Image Bone Mineral Density Ultra-Distal Radius Initial Slope of Variogram
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Digital Film:让你轻松实现反转片效果
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作者 小珍 《电脑》 2004年第8期71-71,共1页
关键词 digital film 彩色反转片 图片处理 图像处理软件
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Because of Technology, so the Art -- The Concept of Film and Television Production in the Digital Age
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作者 Lili Zhang Yongwei Sun Hua Yun 《Journal of Zhouyi Research》 2014年第3期75-77,共3页
关键词 数字时代 电视制作 艺术 电影 科技 视觉美感 影视作品 审美情趣
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Evaluation on residual stresses of silicon-doped CVD diamond films using X-ray diffraction and Raman spectroscopy 被引量:11
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作者 陈苏琳 沈彬 +2 位作者 张建国 王亮 孙方宏 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2012年第12期3021-3026,共6页
The effect of silicon doping on the residual stress of CVD diamond films is examined using both X-ray diffraction (XRD) analysis and Raman spectroscopy measurements. The examined Si-doped diamond films are deposited o... The effect of silicon doping on the residual stress of CVD diamond films is examined using both X-ray diffraction (XRD) analysis and Raman spectroscopy measurements. The examined Si-doped diamond films are deposited on WC-Co substrates in a home-made bias-enhanced HFCVD apparatus. Ethyl silicate (Si(OC2H5)4) is dissolved in acetone to obtain various Si/C mole ratio ranging from 0.1% to 1.4% in the reaction gas. Characterizations with SEM and XRD indicate increasing silicon concentration may result in grain size decreasing and diamond [110] texture becoming dominant. The residual stress values of as-deposited Si-doped diamond films are evaluated by both sin2ψ method, which measures the (220) diamond Bragg diffraction peaks using XRD, with ψ-values ranging from 0° to 45°, and Raman spectroscopy, which detects the diamond Raman peak shift from the natural diamond line at 1332 cm-1. The residual stress evolution on the silicon doping level estimated from the above two methods presents rather good agreements, exhibiting that all deposited Si-doped diamond films present compressive stress and the sample with Si/C mole ratio of 0.1% possesses the largest residual stress of ~1.75 GPa (Raman) or ~2.3 GPa (XRD). As the silicon doping level is up further, the residual stress reduces to a relative stable value around 1.3 GPa. 展开更多
关键词 silicon-doped diamond films silicon doping residual stress x-ray diffraction Raman spectroscopy
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浅谈4kByte RED DIGITAL CINEMA对数字影视制作的影响
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作者 郭健鸣 《长春大学学报》 2008年第8期45-48,共4页
RED ONE低成本的4kByte意味着不仅是技术上有所突破,而成本降低、质量提高必将带来行业的迅速火热和发展,其影响巨大。在分辨率提高以后对一切电影元素都提高了要求,REDONE4kByte是电影数字化及后期制作与计算机紧密结合的产物,本文仅对... RED ONE低成本的4kByte意味着不仅是技术上有所突破,而成本降低、质量提高必将带来行业的迅速火热和发展,其影响巨大。在分辨率提高以后对一切电影元素都提高了要求,REDONE4kByte是电影数字化及后期制作与计算机紧密结合的产物,本文仅对RED ONE的4kByte在数字影视制作方面的影响提出了一些看法。 展开更多
关键词 RED ONE 4kByte 电影数字化 电影后期制作
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X-ray absorption near the edge structure and x-ray photoelectron spectroscopy studies on pyrite prepared by thermally sulfurizing iron films 被引量:1
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作者 张辉 刘应书 +3 位作者 王宝义 魏龙 奎热西 钱海杰 《Chinese Physics B》 SCIE EI CAS CSCD 2009年第7期2734-2738,共5页
This paper reports how pyrite films were prepared by thermal sulfurization of magnetron sputtered iron films and characterized by X-ray absorption near edge structure spectra and X-ray photoelectron spectroscopy on a ... This paper reports how pyrite films were prepared by thermal sulfurization of magnetron sputtered iron films and characterized by X-ray absorption near edge structure spectra and X-ray photoelectron spectroscopy on a 4B9B beam line at the Beijing Synchrotron Radiation Facility. The band gap of the pyrite agrees well with the optical band gap obtained by a spectrophotometer. The octahedral symmetry of pyrite leads to the splitting of the d orbit into t2g and eg levels. The high spin and low spin states were analysed through the difference of electron exchange interaction and the orbital crystal field. Only when the crystal field splitting is higher than 1.5 eV, the two weak peaks above the white lines can appear, and this was approved by experiments in the present work. 展开更多
关键词 x-ray absorption near the edge structure spectra x-ray photoelectron spectroscopy iron pyrite films solar cells
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X-ray Photoelectron Spectroscopy Studies of Ti_(x)Al_(1-x)N Thin Films Prepared by RF Reactive Magnetron Sputtering 被引量:1
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作者 Rui XIONG Jing SHI 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2005年第4期541-544,共4页
TixAl1-xN films have been prepared by RF reactive magnetron sputtering. X-ray diffraction results showed that TixAl1-xN thin films in this study were hexagonal wurtzite structure with the Ti content up to 0.18. X-ray ... TixAl1-xN films have been prepared by RF reactive magnetron sputtering. X-ray diffraction results showed that TixAl1-xN thin films in this study were hexagonal wurtzite structure with the Ti content up to 0.18. X-ray photoelectron spectrocopy studies provided that the Nls core-electron spectrum of TixAl1-xN thin film brodend with increasing Ti content, and the difference of the chemical shifts for Ti2p3/2 line between TiN and TixAl1-xN th77pj in film was 0.7 eV. 展开更多
关键词 TixAl1-xN films x-ray photoelectron spectroscopy Core-electron spectrum
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A large-grain-size thick-film polycrystalline diamond detector for x-ray detection 被引量:1
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作者 Ping XU Yi YU +1 位作者 Haiyang ZHOU Changjun QIU 《Plasma Science and Technology》 SCIE EI CAS CSCD 2020年第12期97-103,共7页
A diamond film with a size of 6×6×0.5 mm^3 is fabricated by electron-assisted chemical vapor deposition. Raman spectrum analysis, x-ray diffraction and scanning electron microscope images confirm the high pu... A diamond film with a size of 6×6×0.5 mm^3 is fabricated by electron-assisted chemical vapor deposition. Raman spectrum analysis, x-ray diffraction and scanning electron microscope images confirm the high purity and large grain size, which is larger than 300 μm. Its resistivity is higher than 10^12 W· cm. Interlaced-finger electrodes are imprinted onto the diamond film to develop an x-ray detector. Ohmic contact is confirmed by checking the linearity of its current–voltage curve. The dark current is lower than 0.1 n A under an electric field of 30 k V cm^-1. The time response is 220 ps. The sensitivity is about 125 m A W^-1 under a biasing voltage of 100 V.A good linear radiation dose rate is also confirmed. This diamond detector is used to measure x-ray on a Z-pinch, which has a double-layer 'nested tungsten wire array'. The pronounced peaks in the measured waveform clearly characterize the x-ray bursts, which proves the performance of this diamond detector. 展开更多
关键词 polycrystalline diamond film x-ray detector electron-assisted chemical vapor deposition
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Characterization of Thin Films by Low Incidence X-Ray Diffraction 被引量:2
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作者 Mirtat Bouroushian Tatjana Kosanovic 《Crystal Structure Theory and Applications》 2012年第3期35-39,共5页
Glancing Angle X-ray Diffraction (GAXRD) is introduced as a direct, non-destructive, surface-sensitive technique for analysis of thin films. The method was applied to polycrystalline thin films (namely, titanium oxide... Glancing Angle X-ray Diffraction (GAXRD) is introduced as a direct, non-destructive, surface-sensitive technique for analysis of thin films. The method was applied to polycrystalline thin films (namely, titanium oxide, zinc selenide, cadmium selenide and combinations thereof) obtained by electrochemical growth, in order to determine the composition of ultra-thin surface layers, to estimate film thickness, and perform depth profiling of multilayered heterostructures. The experimental data are treated on the basis of a simple absorption-diffraction model involving the glancing angle of X-ray incidence. 展开更多
关键词 Glancing Angle x-ray DIFFRACTION Thin films Titanium OXIDES Metal CHALCOGENIDES ELECTRODEPOSITION
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Centimeter-sized Cs_(3)Cu_(2)I_(5)single crystals grown by oleic acid assisted inverse temperature crystallization strategy and their films for high-quality X-ray imaging 被引量:1
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作者 Tao Chen Xin Li +9 位作者 Yong Wang Feng Lin Ruliang Liu Wenhua Zhang Jie Yang Rongfei Wang Xiaoming Wen Bin Meng Xuhui Xu Chong Wang 《Journal of Energy Chemistry》 SCIE EI CAS CSCD 2023年第4期382-389,共8页
Low-dimensional halide perovskites have become the most promising candidates for X-ray imaging,yet the issues of the poor chemical stability of hybrid halide perovskite,the high poisonousness of lead halides and the r... Low-dimensional halide perovskites have become the most promising candidates for X-ray imaging,yet the issues of the poor chemical stability of hybrid halide perovskite,the high poisonousness of lead halides and the relatively low detectivity of the lead-free halide perovskites which seriously restrain its commercialization.Here,we developed a solution inverse temperature crystal growth(ITCG)method to bring-up high quality Cs_(3)Cu_(2)I_(5)crystals with large size of centimeter order,in which the oleic acid(OA)is introduced as an antioxidative ligand to inhibit the oxidation of cuprous ions effieiently,as well as to decelerate the crystallization rate remarkalby.Based on these fine crystals,the vapor deposition technique is empolyed to prepare high quality Cs_(3)Cu_(2)I_(5)films for efficient X-ray imaging.Smooth surface morphology,high light yields and short decay time endow the Cs_(3)Cu_(2)I_(5)films with strong radioluminescence,high resolution(12 lp/mm),low detection limits(53 nGyair/s)and desirable stability.Subsequently,the Cs_(3)Cu_(2)I_(5)films have been applied to the practical radiography which exhibit superior X-ray imaging performance.Our work provides a paradigm to fabricate nonpoisonous and chemically stable inorganic halide perovskite for X-ray imaging. 展开更多
关键词 Inverse temperature crystal growth Cs_(3)Cu_(2)I_(5)single crystal Vapor deposition Cs_(3)Cu_(2)I_(5)films x-ray imaging
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Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”
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作者 Ming Xu Tao Yang +5 位作者 Wenxue Yu Ning Yang Cuixiu Liu Zhenhong Mai Wuyan Lai Kun Tao 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第9期658-658,共1页
Equation(6)in Chin.Phys.090833(2000)is corrected.All subsequent derivations were given based on the correct Eq.(6),so the conclusions in the paper are not ffected by the rrata.
关键词 erratum film thickness x-ray
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Evaluation of multiaxial stress in textured cubic films by x-ray diffraction
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作者 张建民 徐可为 《Chinese Physics B》 SCIE EI CAS CSCD 2005年第9期1866-1872,共7页
X-ray diffraction is used extensively to determine the residual stress in bulk or thin film materials on the as- sumptions that the material is composed of fine crystals with random orientation and the stress state is... X-ray diffraction is used extensively to determine the residual stress in bulk or thin film materials on the as- sumptions that the material is composed of fine crystals with random orientation and the stress state is biaxial and homogeneous through the x-ray penetrating region. The stress is calculated from the gradient of ε ~ sin^2 φ linear relation. But the method cannot be used in textured films due to nonlinear relation. In this paper, a novel method is proposed for measuring the multiaxial stresses in cubic films with any [hkl] fibre texture. As an example, a detailed analysis is given for measuring three-dimensional stresses in FCC films with [111] fibre texture. 展开更多
关键词 residual stress x-ray diffraction thin film fibre texture
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