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6-11 Status of the Electro-polishing System at IMP
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作者 Li Lu He Yuan +7 位作者 You Zhiming Guo Hao Xiong Pingran Zhu Xinlong Li Yongming Zhang Shenghu Zhang Bin Shi Zhixiong 《IMP & HIRFL Annual Report》 2015年第1期272-273,共2页
Institution of Modern Physics (IMP) has designed, fabricated and installed the first SRF cavity electropolishing system of China. It’s sized for 1.3 GHz SRF cavities, and also can works for multiple cell cavities wit... Institution of Modern Physics (IMP) has designed, fabricated and installed the first SRF cavity electropolishing system of China. It’s sized for 1.3 GHz SRF cavities, and also can works for multiple cell cavities with further upgrade of structure. 展开更多
关键词 electro-polishing SYSTEM IMP
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Scaling analysis of current influence on Hastelloy surface roughness in electro-polishing process
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作者 Feng Feng Xiang-Song Zhang +5 位作者 Ti-Ming Qu Yan-Yi Zhang Xiang Qian Bin-Bin Liu Jun-Long Huang Ping-Fa Feng 《Rare Metals》 SCIE EI CAS CSCD 2019年第2期142-150,共9页
In this study, a series of Hastelloy tapes were electro-polished, and the dividing method was used to carry out a detailed investigation on the influence of polishing current(I) on root mean square(R_q) at various ima... In this study, a series of Hastelloy tapes were electro-polished, and the dividing method was used to carry out a detailed investigation on the influence of polishing current(I) on root mean square(R_q) at various image scales(L). The electro-polishing is found to be effective mainly at L smaller than 10μm, where the R_q–I relationship could be fitted by an exponential decay function with a residual roughness value. An approximate model of electro-polishing process was established to interpret the exponential decay function. This study provides a quantified insight into the electro-polishing process, which could help to obtain more understanding of its mechanism. 展开更多
关键词 Surface ROUGHNESS Scaling analysis ROOT mean square Atomic force microscopy electro-polishing
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Controlled Texturing of Aluminum Sheet for Solar Energy Applications
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作者 Charles Opiyo Ayieko Robinson Juma Musembi +3 位作者 Alex Awuor Ogacho Benard Odhiambo Aduda Boniface Mutua Muthoka Pushpendra K. Jain 《Advances in Materials Physics and Chemistry》 2015年第11期458-466,共9页
Aluminum sheets were polished to reduce ruggedness and then textured in varying acid-ethanol concentration etchant to form pores. The textured surface was characterized structurally by using X-ray diffraction (XRD) wh... Aluminum sheets were polished to reduce ruggedness and then textured in varying acid-ethanol concentration etchant to form pores. The textured surface was characterized structurally by using X-ray diffraction (XRD) which revealed aluminum crystallographic planes (1 1 1), (2 0 0), (2 2 0) and (3 1 1). Its morphology was studied by using energy dispersive X-ray (EDX) and scanning electron microscope (SEM) that confirmed purity of aluminum sheet to be 99.66% at. Reflectance of textured and plain aluminum sheet was analyzed by spectrophotometric measurements which showed that texturing reduced the reflectance of the polished surface by 26% in the UV-VIS-NIR spectrum of solar radiation. With reduced reflectance of the textured aluminum sheet, it was applicable for solar radiation absorption. 展开更多
关键词 ALUMINUM TEXTURING Reflectance Solar Energy electro-polishing
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