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Electron Raman scattering in a HgS/CdS spherical quantum dot quantum well 被引量:1
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作者 钟庆湖 赖丽萍 《Journal of Semiconductors》 EI CAS CSCD 2013年第12期13-16,共4页
Electron Raman scattering (ERS) is investigated in a spherical HgS/CdS quantum dot quantum well (QDQW). The differential cross section (DCS) is calculated as a function of the scattering frequency and the sizes ... Electron Raman scattering (ERS) is investigated in a spherical HgS/CdS quantum dot quantum well (QDQW). The differential cross section (DCS) is calculated as a function of the scattering frequency and the sizes of QDQW. Single parabolic conduction and valence bands are assumed. The selection rules for the processes are studied. Singularities in the spectra are found and interpreted. The ERS studied here can be used to provide direct information about the electron band structure of these systems. 展开更多
关键词 electron raman scattering quantum dot quantum well differential cross-section selection rule
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Electron Raman scattering in a cylindrical quantum dot
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作者 钟庆湖 易学华 《Journal of Semiconductors》 EI CAS CSCD 2012年第5期1-5,共5页
Electron Raman scattering(ERS) is investigated in a CdS cylindrical quantum dot(QD).The differential cross section is calculated as a function of the scattering frequency and the size of the QD.Single parabolic co... Electron Raman scattering(ERS) is investigated in a CdS cylindrical quantum dot(QD).The differential cross section is calculated as a function of the scattering frequency and the size of the QD.Single parabolic conduction and valence bands are assumed,and singularities in the spectrum are found and interpreted.The selection rules for the processes are also studied.The ERS studied here can be used to provide direct information about the electron band structure of these systems. 展开更多
关键词 electron raman scattering quantum dot differential cross-section selection rule
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Electronic Raman scattering in double semi-parabolic quantum wells
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作者 N. Zamani A. Keshavarz M. J. Karimi 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第5期523-526,共4页
The differential cross-section for electronic Raman scattering in double semi-parabolic quantum wells of typical GaAs/AlxGa1-xAs is investigated numerically with the effective-mass approximation. The dependence of the... The differential cross-section for electronic Raman scattering in double semi-parabolic quantum wells of typical GaAs/AlxGa1-xAs is investigated numerically with the effective-mass approximation. The dependence of the differential cross-section on structural parameters such as the barrier width and the well widths is studied. Our results indicate that the electronic Raman scattering is affected by the geometrical size and can be negligible in the symmetric double-well case. 展开更多
关键词 electronic raman scattering double semi-parabolic quantum wells
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Raman analysis of defects in n-type 4H-SiC 被引量:2
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作者 杨银堂 韩茹 王平 《Chinese Physics B》 SCIE EI CAS CSCD 2008年第9期3459-3463,共5页
This paper employs micro-Raman technique for detailed analysis of the defects (both inside and outside) in bulk 4H-SiC. The main peaks of the first-order Raman spectrum obtained in the centre of defect agree well wi... This paper employs micro-Raman technique for detailed analysis of the defects (both inside and outside) in bulk 4H-SiC. The main peaks of the first-order Raman spectrum obtained in the centre of defect agree well with those of perfect bulk 4H-SiC, which indicate that there is no parasitic polytype in the round pit and the hexagonal defect. Four electronic Raman scattering peaks from nitrogen defect levels are observed in the round pit (395 cm^-1, 526 cm^-1, 572cm^-1, and 635cm^-1), but cannot be found in the spectra of hexagonal defect. The theoretical analysis of the longitudinal optical plasmon-phonon coupled mode line shape indicates the nonuniformity of nitrogen distribution between the hexagonal defect and the outer area in 4H-SiC. The second-order Raman features of the defects in bulk 4H-SiC are well-defined using the selection rules for second-order scattering in wurtzite structure and compared with that in the free defect zone. 展开更多
关键词 silicon carbide electronic raman scattering round pit hexagonal defect
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