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Advances of embedded resistive random access memory in industrial manufacturing and its potential applications
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作者 Zijian Wang Yixian Song +7 位作者 Guobin Zhang Qi Luo Kai Xu Dawei Gao Bin Yu Desmond Loke Shuai Zhong Yishu Zhang 《International Journal of Extreme Manufacturing》 SCIE EI CAS CSCD 2024年第3期175-214,共40页
Embedded memory,which heavily relies on the manufacturing process,has been widely adopted in various industrial applications.As the field of embedded memory continues to evolve,innovative strategies are emerging to en... Embedded memory,which heavily relies on the manufacturing process,has been widely adopted in various industrial applications.As the field of embedded memory continues to evolve,innovative strategies are emerging to enhance performance.Among them,resistive random access memory(RRAM)has gained significant attention due to its numerousadvantages over traditional memory devices,including high speed(<1 ns),high density(4 F^(2)·n^(-1)),high scalability(~nm),and low power consumption(~pJ).This review focuses on the recent progress of embedded RRAM in industrial manufacturing and its potentialapplications.It provides a brief introduction to the concepts and advantages of RRAM,discusses the key factors that impact its industrial manufacturing,and presents the commercial progress driven by cutting-edge nanotechnology,which has been pursued by manysemiconductor giants.Additionally,it highlights the adoption of embedded RRAM in emerging applications within the realm of the Internet of Things and future intelligent computing,with a particular emphasis on its role in neuromorphic computing.Finally,the review discusses thecurrent challenges and provides insights into the prospects of embedded RRAM in the era of big data and artificial intelligence. 展开更多
关键词 embedded resistive random access memory industrial manufacturing intelligent computing advanced process node
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Special kinetics features of scandium antimonide thin films conducive to swiftly embedded phase-change memory applications
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作者 Xue-Peng Wang Bin Chen +3 位作者 Huang Gong Xinxin Duan Yimin Chen Feng Rao 《Science China Materials》 SCIE EI CAS CSCD 2024年第11期3684-3691,共8页
Embedded phase-change random-access memory(ePCRAM)applications demand superior data retention in amorphous phase-change materials(PCMs).Traditional PCM design strategies have focused on enhancing the thermal stability... Embedded phase-change random-access memory(ePCRAM)applications demand superior data retention in amorphous phase-change materials(PCMs).Traditional PCM design strategies have focused on enhancing the thermal stability of the amorphous phase,often at the expense of the crystallization speed.While this approach supports reliable microchip operations,it compromises the ability to achieve rapid responses.To address this limitation,we modified ultrafast-crystallizing Sb thin films by incorporating Sc dopants,achieving the highest 10-year retention temperature(~175℃)among binary antimonide PCMs while maintaining a sub-10-ns SET operation speed.This reconciliation of two seemingly contradictory properties arises from the unique kinetic features of the 5-nm-thick Sc12Sb88 films,which exhibit an enlarged fragile-to-strong crossover in viscosity at medium supercooled temperature zones and an incompatible sublattice ordering behavior between the Sc and Sb atoms.By tailoring the crystallization kinetics of PCMs through strategic doping and nanoscale confinement,we provide new opportunities for developing robust yet swift ePCRAMs. 展开更多
关键词 embedded phase-change memory scandium antimonide crystallization kinetics flash differential scanning calorimetry
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A low-voltage sense amplifier for high-performance embedded flash memory 被引量:2
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作者 柳江 王雪强 +4 位作者 王琴 伍冬 张志刚 潘立阳 刘明 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第10期74-78,共5页
This paper presents a sense amplifier scheme for low-voltage embedded flash (eFlash) memory applications. The topology of the sense amplifier is based on current mode comparison. Moreover, an offset-voltage eliminat... This paper presents a sense amplifier scheme for low-voltage embedded flash (eFlash) memory applications. The topology of the sense amplifier is based on current mode comparison. Moreover, an offset-voltage elimination technique is employed to improve the sensing performance under a small memory cell current. The proposed sense amplifier is designed based on a GSMC 130 nm eFlash process, and the sense time is 0.43 ns at 1.5 V, corresponding to a 46% improvement over the conventional technologies. 展开更多
关键词 sense amplifier current mode embedded flash memory low voltage
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A Partition Checkpoint Strategy Based on Data Segment Priority
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作者 LIANG Ping LIU Yunsheng 《Wuhan University Journal of Natural Sciences》 CAS 2012年第2期109-113,共5页
A partition checkpoint strategy based on data segment priority is presented to meet the timing constraints of the data and the transaction in embedded real-time main memory database systems(ERTMMDBS) as well as to r... A partition checkpoint strategy based on data segment priority is presented to meet the timing constraints of the data and the transaction in embedded real-time main memory database systems(ERTMMDBS) as well as to reduce the number of the transactions missing their deadlines and the recovery time.The partition checkpoint strategy takes into account the characteristics of the data and the transactions associated with it;moreover,it partitions the database according to the data segment priority and sets the corresponding checkpoint frequency to each partition for independent checkpoint operation.The simulation results show that the partition checkpoint strategy decreases the ratio of trans-actions missing their deadlines. 展开更多
关键词 embedded real-time main memory database systems database recovery partition checkpoint data segment priority
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