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SOI-LIGBT器件正偏安全工作区的研究 被引量:2
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作者 霍昌隆 刘斯扬 钱钦松 《电子科技》 2012年第7期106-109,113,共5页
研究了高压SOI-LIGBT器件的单脉冲正偏安全工作区(FBSOA)的绘制方法。首先,分别提取器件的热阻与热容,并借助热阻抗公式计算器件的瞬态热阻抗,进而根据热阻抗与最大允许功率之间的关系,获得直流与脉冲条件下的正偏安全工作区。同时,还... 研究了高压SOI-LIGBT器件的单脉冲正偏安全工作区(FBSOA)的绘制方法。首先,分别提取器件的热阻与热容,并借助热阻抗公式计算器件的瞬态热阻抗,进而根据热阻抗与最大允许功率之间的关系,获得直流与脉冲条件下的正偏安全工作区。同时,还对其二次击穿边界与安全工作区的相互关系做了进一步分析,为更加准确地确定高压LIGBT器件的单脉冲安全工作区提供理论指导。 展开更多
关键词 正偏安全工作区 热阻 热容 电热耦合
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Insulated gate bipolar transistor with trench gate structure of accumulation channel
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作者 钱梦亮 李泽宏 +1 位作者 张波 李肇基 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第3期41-44,共4页
An accumulation channel trench gate insulated gate bipolar transistor (ACT-IGBT) is proposed. The simu- lation results show that for a blocking capability of 1200 V, the on-state voltage drops of ACT-IGBT are 1.5 an... An accumulation channel trench gate insulated gate bipolar transistor (ACT-IGBT) is proposed. The simu- lation results show that for a blocking capability of 1200 V, the on-state voltage drops of ACT-IGBT are 1.5 and 2 V at a temperature of 300 and 400 K, respectively, at a collector current density of 100 A/cm2. In contrast, the on-state voltage drops of a conventional trench gate IGBT (CT-IGBT) are 1.7 and 2.4 V at a temperature of 300 and 400 K, respectively. Compared to the CT-IGBT, the ACT-IGBT has a lower on-state voltage drop and a larger forward bias safe operating area. Meanwhile, the forward blocking characteristics and turn-off performance of the ACT-IGBT are also analyzed. 展开更多
关键词 ACT-IGBT CT-IGBT on-state voltage drop forward blocking voltage fbsoa
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